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Content for
TS 38.133
Word version: 18.6.0
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A.7
NR standalone tests with one or more NR cells in FR2
A.7.1
SA: RRC_IDLE state mobility
A.7.2
SA: RRC_INACTIVE state mobility
A.7.3
RRC_CONNECTED state mobility
A.7.4
Timing
A.7.5
Signaling characteristics
A.7.6
Measurement procedure
A.7.7
Measurement Performance requirements
A.7.8
Measurement procedure in RRC_INACTIVE
A.7.9
Measurement performance requirements in RRC_INACTIVE
...
A.7
NR standalone tests with one or more NR cells in FR2
p. 3185
A.7.1
SA: RRC_IDLE state mobility
p. 3185
A.7.1.1
Cell re-selection to NR
p. 3185
A.7.1.1.1
Cell reselection to FR2 intra-frequency NR case
p. 3185
A.7.1.1.1.1
Test Purpose and Environment
p. 3185
A.7.1.1.1.2
Test Parameters
p. 3185
A.7.1.1.1.3
Test Requirements
p. 3188
A.7.1.1.2
Cell reselection to FR2 inter-frequency NR case
p. 3188
A.7.1.1.2.1
Test Purpose and Environment
p. 3188
A.7.1.1.2.2
Test Parameters
p. 3189
A.7.1.1.2.3
Test Requirements
p. 3191
A.7.1.1.3
Cell reselection to FR2 intra-frequency NR case for UE fulfilling low mobility relaxed measurement criterion
p. 3191
A.7.1.1.3.1
Test Purpose and Environment
p. 3191
A.7.1.1.3.2
Test Parameters
p. 3191
A.7.1.1.3.3
Test Requirements
p. 3194
A.7.1.1.4
Cell reselection to FR2 intra-frequency NR case for UE fulfilling not-at-cell edge relaxed measurement criterion
p. 3194
A.7.1.1.4.1
Test Purpose and Environment
p. 3194
A.7.1.1.4.2
Test Parameters
p. 3194
A.7.1.1.4.3
Test Requirements
p. 3197
A.7.1.1.5
Cell reselection to FR2 inter-frequency NR case for UE fulfilling low mobility relaxed measurement criterion
p. 3197
A.7.1.1.5.1
Test Purpose and Environment
p. 3197
A.7.1.1.5.2
Test Parameters
p. 3197
A.7.1.1.5.3
Test Requirements
p. 3200
A.7.1.1.6
Cell reselection to FR2 inter-frequency NR case for UE fulfilling not-at-cell edge relaxed measurement criterion
p. 3200
A.7.1.1.6.1
Test Purpose and Environment
p. 3200
A.7.1.1.6.2
Test Parameters
p. 3200
A.7.1.1.6.3
Test Requirements
p. 3203
A.7.1.1.7
Cell reselection to FR2 intra-frequency NR case for FR2 power class 6 UE configured with highSpeedMeasFlagFR2-r17
p. 3203
A.7.1.1.7.1
Test Purpose and Environment
p. 3203
A.7.1.1.7.2
Test Parameters
p. 3203
A.7.1.1.7.3
Test Requirements
p. 3207
A.7.1.1.8
Cell reselection to FR2 inter-frequency NR case for UE configured with highSpeedMeasFlagFR2-r17
p. 3207
A.7.1.1.8.1
Test Purpose and Environment
p. 3207
A.7.1.1.8.2
Test Parameters
p. 3207
A.7.1.1.8.3
Test Requirements
p. 3211
A.7.2
SA: RRC_INACTIVE state mobility
p. 3211
A.7.2.1
Small Data Transmission
p. 3211
A.7.2.1.1
TA validation for CG-SDT in FR2
p. 3211
A.7.2.1.1.1
Test Purpose and Environment
p. 3211
A.7.2.1.1.2
Test Requirements
p. 3215
A.7.3
RRC_CONNECTED state mobility
p. 3215
A.7.3.1
Handover
p. 3215
A.7.3.1.1
Inter-frequency handover from FR1 to FR2; unknown target cell
p. 3215
A.7.3.1.1.1
Test Purpose and Environment
p. 3215
A.7.3.1.1.2
Test Parameters
p. 3215
A.7.3.1.1.3
Test Requirements
p. 3219
A.7.3.1.2
Intra-frequency handover from FR2 to FR2; unknown target cell
p. 3219
A.7.3.1.2.1
Test Purpose and Environment
p. 3219
A.7.3.1.2.2
Test Parameters
p. 3219
A.7.3.1.2.3
Test Requirements
p. 3222
A.7.3.1.3
Inter-frequency handover from FR2 to FR2; unknown target cell
p. 3222
A.7.3.1.3.1
Test Purpose and Environment
p. 3222
A.7.3.1.3.2
Test Parameters
p. 3222
A.7.3.1.3.3
Test Requirements
p. 3223
A.7.3.1.4
Inter-band inter-frequency synchronous DAPS handover from FR1 to FR2
p. 3224
A.7.3.1.4.1
Test Purpose and Environment
p. 3224
A.7.3.1.4.2
Test Parameters
p. 3224
A.7.3.1.4.3
Test Requirements
p. 3231
A.7.3.1.5
Inter-band inter-frequency asynchronous DAPS handover from FR1 to FR2
p. 3231
A.7.3.1.5.1
Test Purpose and Environment
p. 3231
A.7.3.1.5.2
Test Parameters
p. 3231
A.7.3.1.5.3
Test Requirements
p. 3238
A.7.3.1.6
Handover with PSCell from SA to EN-DC with unknown FR2 target PScell
p. 3238
A.7.3.1.6.1
Test Purpose and Environment
p. 3238
A.7.3.1.6.2
Test Parameters
p. 3238
A.7.3.1.6.3
Test Requirements
p. 3246
A.7.3.1.7
HO with PSCell from FR1 NR-SA to EN-DC with known E-UTRA PCell and known FR2 PSCell
p. 3247
A.7.3.1.7.1
Test purpose and environment
p. 3247
A.7.3.1.7.2
Test Requirements
p. 3252
A.7.3.1.8
NR PSCell change delay in HO with PSCell from NR-DC to NR-DC
p. 3253
A.7.3.1.8.1
Test Purpose and Environment
p. 3253
A.7.3.1.8.2
Test Requirements
p. 3258
A.7.3.1.9
Intra-frequency handover from FR2-2 to FR2-2; unknown target cell
p. 3258
A.7.3.1.9.1
Test Purpose and Environment
p. 3258
A.7.3.1.9.2
Test Parameters
p. 3258
A.7.3.1.9.3
Test Requirements
p. 3261
A.7.3.1.10
Inter-frequency handover from FR2-2 to FR2-2; unknown target cell
p. 3261
A.7.3.1.10.1
Test Purpose and Environment
p. 3261
A.7.3.1.10.2
Test Parameters
p. 3261
A.7.3.1.10.3
Test Requirements
p. 3265
A.7.3.1.11
Inter-frequency handover from FR1 to FR2-2; unknown target cell
p. 3265
A.7.3.1.11.1
Test Purpose and Environment
p. 3265
A.7.3.1.11.2
Test Parameters
p. 3265
A.7.3.1.11.3
Test Requirements
p. 3269
A.7.3.1.12
Intra-frequency handover from FR2 to FR2; known target cell configured with NCD-SSB
p. 3269
A.7.3.1.12.1
Test Purpose and Environment
p. 3269
A.7.3.1.12.2
Test Parameters
p. 3269
A.7.3.1.12.3
Test Requirements
p. 3273
A.7.3.1.13
Inter-frequency handover from FR2 to FR2; known target cell configured with NCD-SSB
p. 3273
A.7.3.1.13.1
Test Purpose and Environment
p. 3273
A.7.3.1.13.2
Test Parameters
p. 3273
A.7.3.1.13.3
Test Requirements
p. 3276
A.7.3.1.14
Handover with PSCell from FR1-FR2 NR-DC to FR1-FR1 NR-DC with target PSCell in FR1
p. 3276
A.7.3.1.14.1
Test Purpose and Environment
p. 3276
A.7.3.1.14.2
Test Requirements
p. 3280
A.7.3.1.15
HO with PSCell from FR1-FR1 NR-DC to FR1-FR2 NR-DC
p. 3281
A.7.3.1.15.1
Test Purpose and Environment
p. 3281
A.7.3.1.15.2
Test Requirements
p. 3286
A.7.3.2
RRC Connection Mobility Control
p. 3286
A.7.3.2.1
SA: RRC Re-establishment
p. 3286
A.7.3.2.1.1
Intra-frequency RRC Re-establishment in FR2
p. 3286
A.7.3.2.1.2
Inter-frequency RRC Re-establishment in FR2
p. 3289
A.7.3.2.1.3
Intra-frequency RRC Re-establishment in FR2 without serving cell timing
p. 3292
A.7.3.2.1.3.1
Test Purpose and Environment
p. 3292
A.7.3.2.1.3.2
Test Requirements
p. 3294
A.7.3.2.1.4
Intra-frequency RRC Re-establishment in FR2-2
p. 3295
A.7.3.2.1.4.1
Test Purpose and Environment
p. 3295
A.7.3.2.1.4.2
Test Requirements
p. 3297
A.7.3.2.1.5
Inter-frequency RRC Re-establishment in FR2-2
p. 3298
A.7.3.2.1.5.1
Test Purpose and Environment
p. 3298
A.7.3.2.1.5.2
Test Requirements
p. 3301
A.7.3.2.1.6
Intra-frequency RRC Re-establishment in FR2-2 without serving cell timing
p. 3301
A.7.3.2.1.6.1
Test Purpose and Environment
p. 3301
A.7.3.2.1.6.2
Test Requirements
p. 3303
A.7.3.2.2
Random Access
p. 3304
A.7.3.2.2.1
4-step RA type c ontention based random access test in FR2 for NR Standalone
p. 3304
A.7.3.2.2.2
4-step RA type n on-contention based random access test in FR2 for NR Standalone
p. 3308
A.7.3.2.2.3
2-step RA type contention based random access test in FR2 for NR Standalone
p. 3312
A.7.3.2.2.4
2-step RA type n on-contention based random access test in FR2 for NR Standalone
p. 3315
A.7.3.2.3
SA: RRC Connection Release with Redirection
p. 3318
A.7.3.2.3.1
Redirection from NR in FR2 to NR in FR2
p. 3318
A.7.3.3
Conditional Handover
p. 3322
A.7.3.3.1
Intra-frequency conditional handover from FR2 to FR2
p. 3322
A.7.3.3.1.1
Test Purpose and Environment
p. 3322
A.7.3.3.1.2
Test Parameters
p. 3322
A.7.3.3.1.2.3
Test Requirements
p. 3325
A.7.3.3.2
Inter-frequency conditional handover from FR2 to FR2; unknown target cell
p. 3325
A.7.3.3.2.1
Test Purpose and Environment
p. 3325
A.7.3.3.2.2
Test Parameters
p. 3325
A.7.3.3.2.3
Test Requirements
p. 3327
A.7.3.3.3
NES triggering intra-frequency target CHO delay From FR2 to FR2
p. 3327
A.7.3.3.3.1
Test Purpose and Environment
p. 3327
A.7.3.3.3.2
Test Parameters
p. 3327
A.7.3.3.3.2.3
Test Requirements
p. 3330
A.7.3.3.4
NES triggering inter-frequency conditional handover from FR2 to FR1
p. 3330
A.7.3.3.4.1
Test Purpose and Environment
p. 3330
A.7.3.3.4.2
Test Parameters
p. 3330
A.7.3.3.4.3
Test Requirements
p. 3333
A.7.3.4
LTM PCell Switch
p. 3333
A.7.3.4.1
RACH based Intra-frequency PCell switch from FR2 to FR2
p. 3333
A.7.3.4.1.1
Test Purpose and Environment
p. 3333
A.7.3.4.1.2
Test Parameters
p. 3333
A.7.3.4.1.3
Test Requirements
p. 3337
A.7.3.4.2
RACH-less Intra-frequency PCell switch from FR2 to FR2
p. 3338
A.7.3.4.2.1
Test Purpose and Environment
p. 3338
A.7.3.4.2.2
Test Parameters
p. 3338
A.7.3.4.2.3
Test Requirements
p. 3342
A.7.3.4.3
RACH-based Inter-frequency LTM PCell switch from FR2 to FR2
p. 3343
A.7.3.4.3.1
Test Purpose and Environment
p. 3343
A.7.3.4.3.2
Test Parameters
p. 3343
A.7.3.4.3.3
Test Requirements
p. 3347
A.7.3.5
LTM PSCell Switch
p. 3347
A.7.3.5.1
RACH-based Intra-frequency LTM PSCell switch from FR2 to FR2
p. 3347
A.7.3.5.1.1
Test Purpose and Environment
p. 3347
A.7.3.5.1.2
Test Parameters
p. 3347
A.7.3.5.1.3
Test Requirements
p. 3352
A.7.4
Timing
p. 3353
A.7.4.1
UE transmit timing
p. 3353
A.7.4.1.1
NR UE Transmit Timing Test for FR2
p. 3353
A.7.4.1.1.1
Test Purpose and environment
p. 3353
A.7.4.1.1.2
Test requirements
p. 3356
A.7.4.1.2
NR UE Transmit Timing Test for FR2-2
p. 3357
A.7.4.1.2.1
Test Purpose and environment
p. 3357
A.7.4.1.2.2
Test requirements
p. 3361
A.7.4.1.3
NR UE Transmit Timing Test with 2-TA for FR2 UE supporting multiDCI-IntraCellMultiTRP-TwoTA-r18
p. 3362
A.7.4.1.3.1
Test Purpose and environment
p. 3362
A.7.4.1.3.2
Test requirements
p. 3366
A.7.4.2
UE timer accuracy
p. 3367
A.7.4.3
Timing advance
p. 3367
A.7.4.3.1
SA FR2 timing advance adjustment accuracy
p. 3367
A.7.4.3.1.1
Test Purpose and Environment
p. 3367
A.7.4.3.1.2
Test Parameters
p. 3367
A.7.4.3.1.3
Test Requirements
p. 3370
A.7.4.3.2
SA FR2-2 timing advance adjustment accuracy
p. 3371
A.7.4.3.2.1
Test Purpose and Environment
p. 3371
A.7.4.3.2.2
Test Parameters
p. 3371
A.7.4.3.2.3
Test Requirements
p. 3375
A.7.5
Signaling characteristics
p. 3375
A.7.5.1
Radio link Monitoring
p. 3375
A.7.5.1.1
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with SSB-based RLM RS in non-DRX mode
p. 3375
A.7.5.1.1.1
Test Purpose and Environment
p. 3375
A.7.5.1.1.2
Test Requirements
p. 3378
A.7.5.1.2
Radio Link Monitoring In-sync Test for FR2 PCell configured with SSB-based RLM RS in non-DRX mode
p. 3379
A.7.5.1.2.1
Test Purpose and Environment
p. 3379
A.7.5.1.2.2
Test Requirements
p. 3383
A.7.5.1.3
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with SSB-based RLM RS in DRX mode
p. 3384
A.7.5.1.3.1
Test Purpose and Environment
p. 3384
A.7.5.1.3.2
Test Requirements
p. 3388
A.7.5.1.4
Radio Link Monitoring In-sync Test for FR2 PCell configured with SSB-based RLM RS in DRX mode
p. 3388
A.7.5.1.4.1
Test Purpose and Environment
p. 3388
A.7.5.1.4.2
Test Requirements
p. 3393
A.7.5.1.5
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with CSI-RS-based RLM in non-DRX mode
p. 3393
A.7.5.1.5.1
Test Purpose and Environment
p. 3393
A.7.5.1.5.2
Test Requirements
p. 3398
A.7.5.1.6
Radio Link Monitoring In-sync Test for FR2 PCell configured with CSI-RS-based RLM in non-DRX mode
p. 3398
A.7.5.1.6.1
Test Purpose and Environment
p. 3398
A.7.5.1.6.2
Test Requirements
p. 3402
A.7.5.1.7
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with CSI-RS-based RLM in DRX mode
p. 3402
A.7.5.1.7.1
Test Purpose and Environment
p. 3402
A.7.5.1.7.2
Test Requirements
p. 3406
A.7.5.1.8
Radio Link Monitoring In-sync Test for FR2 PCell configured with CSI-RS-based RLM in DRX mode
p. 3406
A.7.5.1.8.1
Test Purpose and Environment
p. 3406
A.7.5.1.8.2
Test Requirements
p. 3411
A.7.5.1.9
UE Radio Link Monitoring Scheduling Restrictions on FR2
p. 3411
A.7.5.1.9.1
Test Purpose and Environment
p. 3411
A.7.5.1.9.2
Test Requirements
p. 3414
A.7.5.1.10
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with SSB-based RLM RS in non-DRX mode for UE supporting fast beam sweeping in multi-Rx
p. 3414
A.7.5.1.10.1
Test Purpose and Environment
p. 3414
A.7.5.1.10.2
Test Requirements
p. 3418
A.7.5.1.11
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with CSI-RS-based RLM in non-DRX mode when CD-SSB is outside active BWP
p. 3419
A.7.5.1.11.1
Test Purpose and Environment
p. 3419
A.7.5.1.12
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with SSB-based RLM RS in non-DRX mode when CD-SSB is outside active BWP
p. 3419
A.7.5.1.12.1
Test Purpose and Environment
p. 3419
A.7.5.1.12.2
Test Requirements
p. 3419
A.7.5.1.13
Radio Link Monitoring Out-of-sync Test for FR2 PCell configured with SSB-based RLM RS in non-DRX mode for UE supporting [FG 53-3]
p. 3419
A.7.5.1.13.1
Test Purpose and Environment
p. 3419
A.7.5.1.13.2
Test Requirements
p. 3423
A.7.5.2
Interruption
p. 3423
A.7.5.2.1
Interruptions during measurements on deactivated NR SCC in FR2
p. 3423
A.7.5.2.1.1
Test Purpose and Environment
p. 3423
A.7.5.2.1.2
Test Requirements
p. 3425
A.7.5.2.2
SA interruptions at NR SRS carrier-based switching
p. 3426
A.7.5.2.2.1
Test Purpose and Environment
p. 3426
A.7.5.2.2.2
Test Parameters
p. 3426
A.7.5.2.2.3
Test Requirements
p. 3428
A.7.5.3
SCell Activation and Deactivation Delay
p. 3428
A.7.5.3.1
SCell Activation and deactivation for SCell in FR2 intra-band in non-DRX
p. 3428
A.7.5.3.1.1
Test Purpose and Environment
p. 3428
A.7.5.3.1.2
Test Requirements
p. 3430
A.7.5.3.2
SCell Activation and deactivation for FR1+FR2 inter-band with target SCell in FR2
p. 3430
A.7.5.3.2.1
Test Purpose and Environment
p. 3430
A.7.5.3.2.2
Test Requirements
p. 3434
A.7.5.3.3
SCell Activation and deactivation for SCell in FR2 inter-band in non-DRX
p. 3435
A.7.5.3.3.1
Test Purpose and Environment
p. 3435
A.7.5.3.3.2
Test Requirements
p. 3438
A.7.5.3.4
Direct SCell activation at SCell addition of known SCell in FR2
p. 3439
A.7.5.3.4.1
Test Purpose and Environment
p. 3439
A.7.5.3.4.2
Test Requirements
p. 3442
A.7.5.3.5
Direct SCell activation at handover with known SCell in FR2
p. 3443
A.7.5.3.5.1
Test Purpose and Environment
p. 3443
A.7.5.3.5.2
Test Requirements
p. 3446
A.7.5.3.6
PUCCH SCell activation and deactivation for FR1+FR2 inter-band with target SCell in FR2 and known
p. 3447
A.7.5.3.6.1
Test Purpose and Environment
p. 3447
A.7.5.3.6.2
Test Requirements
p. 3451
A.7.5.3.7
PUCCH SCell activation and deactivation delay requirements of FR2 unknown cell with FR1 PCell
p. 3452
A.7.5.3.7.1
Test Purpose and Environment
p. 3452
A.7.5.3.7.2
Test Requirements
p. 3456
A.7.5.3.8
SCell Activation and deactivation for known PUCCH SCell in FR2 inter-band in non-DRX
p. 3457
A.7.5.3.8.1
Test Purpose and Environment
p. 3457
A.7.5.3.8.2
Test Requirements
p. 3461
A.7.5.3.9
PUCCH SCell Activation and deactivation of unknown SCell in FR2
p. 3462
A.7.5.3.9.1
Test Purpose and Environment
p. 3462
A.7.5.3.9.2
Test Requirements
p. 3465
A.7.5.3.10
SCell Activation and deactivation of FR2 known PUCCH SCell and one FR2 unknown SCell with FR2 PCell
p. 3466
A.7.5.3.10.1
Test Purpose and Environment
p. 3466
A.7.5.3.10.2
Test Requirements
p. 3470
A.7.5.3.11
PUCCH SCell activation and deactivation delay requirements of FR2 unknown cell with FR2 PCell
p. 3471
A.7.5.3.11.1
PUCCH SCell activation with non-PUCCH SCell in a secondary PUCCH Group
p. 3471
A.7.5.3.11.1.1
Test Purpose and Environment
p. 3471
A.7.5.3.11.1.2
Test Requirements
p. 3475
A.7.5.3.11.2
PUCCH SCell activation with non-PUCCH SCell in a primary PUCCH Group
p. 3476
A.7.5.3.11.2.1
Test Purpose and Environment
p. 3476
A.7.5.3.11.2.2
Test Requirements
p. 3480
A.7.5.3.12
Void
A.7.5.3.13
SCell Activation for SCell in FR2 intra-band in non-DRX
p. 3481
A.7.5.3.13.1
Test Purpose and Environment
p. 3481
A.7.5.3.13.2
Test Requirements
p. 3483
A.7.5.3.14
SCell Activation for known SCell in FR2 inter-band
p. 3484
A.7.5.3.14.1
Test Purpose and Environment
p. 3484
A.7.5.3.14.2
Test Requirements
p. 3487
A.7.5.3.15
PUCCH SCell activation and deactivation with FR1 PCell based on L3 reporting after SCell activation command
p. 3487
A.7.5.3.15.1
Test Purpose and Environment
p. 3487
A.7.5.3.15.2
Test Requirements
p. 3492
A.7.5.3.16
PUCCH SCell activation and deactivation with FR2 PCell based on L3 reporting after SCell activation command
p. 3493
A.7.5.3.16.1
Test Purpose and Environment
p. 3493
A.7.5.3.16.2
Test Requirements
p. 3496
A.7.5.3.17
SCell Activation and deactivation for SCell in FR2 inter-band in DRX for UE capable of small beam sweeping factors and/or short measurement interval
p. 3497
A.7.5.3.17.1
Test Purpose and Environment
p. 3497
A.7.5.3.17.2
Test Requirements
p. 3500
A.7.5.3.18
SCell Activation and deactivation for FR1+FR2 inter-band with target SCell in FR2, in DRX, for UE capable of small beam sweeping factors and/or short measurement interval
p. 3502
A.7.5.3.18.1
Test Purpose and Environment
p. 3502
A.7.5.3.18.2
Test Requirements
p. 3506
A.7.5.4
Void
A.7.5.5
Beam Failure Detection and Link recovery procedures
p. 3508
A.7.5.5.1
Beam Failure Detection and Link Recovery Test for FR2 PCell configured with SSB-based BFD and LR in non-DRX mode
p. 3508
A.7.5.5.1.1
Test Purpose and Environment
p. 3508
A.7.5.5.1.2
Test Requirements
p. 3512
A.7.5.5.2
Beam Failure Detection and Link Recovery Test for FR2 PCell configured with SSB-based BFD and LR in DRX mode
p. 3513
A.7.5.5.2.1
Test Purpose and Environment
p. 3513
A.7.5.5.2.2
Test Requirements
p. 3516
A.7.5.5.3
Beam Failure Detection and Link Recovery Test for FR2 PCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 3517
A.7.5.5.3.1
Test Purpose and Environment
p. 3517
A.7.5.5.3.2
Test Requirements
p. 3521
A.7.5.5.4
Beam Failure Detection and Link Recovery Test for FR2 PCell configured with CSI-RS-based BFD and LR in DRX mode
p. 3522
A.7.5.5.4.1
Test Purpose and Environment
p. 3522
A.7.5.5.4.2
Test Requirements
p. 3526
A.7.5.5.5
Scheduling availability restriction during Beam Failure Detection and Link Recovery for FR2 PCell configured with SSB-based BFD and LR in non-DRX mode
p. 3527
A.7.5.5.5.1
Test Purpose and Environment
p. 3527
A.7.5.5.5.2
Test Requirements
p. 3530
A.7.5.5.6
Beam Failure Detection and Link Recovery Test for FR2 SCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 3531
A.7.5.5.6.1
Test Purpose and Environment
p. 3531
A.7.5.5.6.2
Test Requirements
p. 3535
A.7.5.5.7
Beam Failure Detection and Link Recovery Test for FR2 SCell configured with CSI-RS-based BFD and LR in DRX mode
p. 3535
A.7.5.5.7.1
Test Purpose and Environment
p. 3535
A.7.5.5.7.2
Test Requirements
p. 3539
A.7.5.5.8
Beam Failure Detection and Link Recovery Test for FR2 PCell configured with CSI-RS-based BFD and LR in DRX mode for UE fulfilling relaxed measurement criterion
p. 3540
A.7.5.5.8.1
Test Purpose and Environment
p. 3540
A.7.5.5.8.2
Test Requirements
p. 3544
A.7.5.5.9
TRP specific Beam Failure Detection and Link Recovery Test for FR2 SCell configured with CSI-RS-based BFD and LR in DRX mode
p. 3544
A.7.5.5.9.1
Test Purpose and Environment
p. 3544
A.7.5.5.9.2
Test Requirements
p. 3550
A.7.5.5.10
TRP specific Beam Failure Detection and Link Recovery Test for FR2 PCell configured with SSB-based BFD and LR in non-DRX mode
p. 3550
A.7.5.5.10.1
Test Purpose and Environment
p. 3550
A.7.5.5.10.2
Test Requirements
p. 3556
A.7.5.5.11
Beam Failure Detection and Link Recovery Test for FR2-2 PCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 3556
A.7.5.5.11.1
Test Purpose and Environment
p. 3556
A.7.5.5.11.2
Test Requirements
p. 3561
A.7.5.5.12
Beam Failure Detection and Link Recovery Test for FR2-2 PCell configured with CSI-RS-based BFD and LR in DRX mode
p. 3561
A.7.5.5.12.1
Test Purpose and Environment
p. 3561
A.7.5.5.12.2
Test Requirements
p. 3566
A.7.5.5.13
Scheduling availability restriction during Beam Failure Detection and Link Recovery for FR2-2 PCell configured with SSB-based BFD and LR in non-DRX mode
p. 3566
A.7.5.5.13.1
Test Purpose and Environment
p. 3566
A.7.5.5.13.2
Test Requirements
p. 3570
A.7.5.5.14
TRP specific Beam Failure Detection and Link Recovery for FR2 PCell configured with CSI-RS-based BFD and LR and multi-Rx operation in DRX mode
p. 3570
A.7.5.5.14.1
Test Purpose and Environment
p. 3570
A.7.5.5.14.2
Test Requirements
p. 3574
A.7.5.6
Active BWP switch
p. 3575
A.7.5.6.1
DCI-based and Timer-based Active BWP Switch
p. 3575
A.7.5.6.1.1
NR FR2- NR FR2 DL active BWP switch of SCell with non-DRX in SA
p. 3575
A.7.5.6.1.2
NR FR1- NR FR2 DL active BWP switch of SCell with non-DRX in SA
p. 3579
A.7.5.6.1.3
NR FR2 DL active BWP switch with non-DRX in SA
p. 3584
A.7.5.6.1.3.1
Test Purpose and Environment
p. 3584
A.7.5.6.1.3.2
Test Requirements
p. 3587
A.7.5.6.1.4
NR FR2-2- NR FR2-2 DL active BWP switch of SCell with non-DRX in SA
p. 3587
A.7.5.6.1.4.1
Test Purpose and Environment
p. 3587
A.7.5.6.1.4.2
Test Requirements
p. 3592
A.7.5.6.2
RRC-based Active BWP Switch
p. 3593
A.7.5.6.2.1
-
p. 3593
A.7.5.6.2.1.1
Test Purpose and Environment
p. 3593
A.7.5.6.2.1.2
Test Requirements
p. 3596
A.7.5.6.2.2
NR FR2-2 DL active BWP switch of PCell with non-DRX in SA
p. 3597
A.7.5.6.2.2.1
Test Purpose and Environment
p. 3597
A.7.5.6.2.2.2
Test Requirements
p. 3601
A.7.5.6.3
Simultaneous DCI-based and Timer-based Active BWP Switch on multiple CCs
p. 3602
A.7.5.6.3.1
-
p. 3602
A.7.5.6.3.1.1
Test Purpose and Environment
p. 3602
A.7.5.6.3.1.2
Test Requirements
p. 3605
A.7.5.6.4
SCell dormancy switch
p. 3605
A.7.5.6.4.1
NR FR2 PCell SCell dormancy switch of single FR2 SCell inside active time
p. 3605
A.7.5.6.4.1.1
Test Purpose and Environment
p. 3605
A.7.5.6.4.1.2
Test Requirements
p. 3610
A.7.5.6.4.2
NR FR1 PCell SCell dormancy switch of two FR2 SCells outside active time
p. 3610
A.7.5.6.4.2.1
Test Purpose and Environment
p. 3610
A.7.5.6.4.2.2
Test Requirements
p. 3615
A.7.5.6.5
Simultaneous RRC-based Active BWP Switch on multiple CCs
p. 3615
A.7.5.6.5.1
Active BWP switch on multiple SCells with non-DRX in SA
p. 3615
A.7.5.6.5.2
NR FR2-2 Active BWP switch on multiple SCells with non-DRX in SA
p. 3618
A.7.5.6.5.2.1
Test Purpose and Environment
p. 3618
A.7.5.6.5.2.2
Test Requirements
p. 3622
A.7.5.7
PSCell addition and release delay
p. 3623
A.7.5.7.1
Addition and Release Delay of known NR PSCell
p. 3623
A.7.5.7.1.1
Test Purpose and Environment
p. 3623
A.7.5.7.1.2
Test Requirements
p. 3626
A.7.5.7.2
Addition and Release Delay of unknown NR PSCell in
p. 3626
A.7.5.7.2.1
Test Purpose and Environment
p. 3626
A.7.5.7.2.2
Test Requirements
p. 3629
A.7.5.7.3
Addition and Release Delay of known NR PSCell in FR2-2
p. 3629
A.7.5.7.3.1
Test Purpose and Environment
p. 3629
A.7.5.7.3.2
Test Requirements
p. 3632
A.7.5.7.4
Addition and Release Delay of unknown NR PSCell in FR2-2
p. 3632
A.7.5.7.4.1
Test Purpose and Environment
p. 3632
A.7.5.7.4.2
Test Requirements
p. 3635
A.7.5.8
Active TCI state switch delay
p. 3635
A.7.5.8.1
MAC-CE based active TCI state switch
p. 3635
A.7.5.8.2
RRC based active TCI state switch
p. 3639
A.7.5.8.3
MAC-CE based active TCI state switch for HST FR2 scenario
p. 3643
A.7.5.8.3.1
NR PCell FR2 HST active TCI state switch for a known TCI state
p. 3643
A.7.5.8.3.1.1
Test Purpose and Environment
p. 3643
A.7.5.8.3.1.2
Test Requirements
p. 3647
A.7.5.8.3.2
NR PCell FR2 HST active TCI state switch for PC6 UE supporting tci StateSwitchInd r18 for a known TCI state
p. 3648
A.7.5.8.3.2.1
Test Purpose and Environment
p. 3648
A.7.5.8.3.2.2
Test Requirements
p. 3651
A.7.5.8.4
DCI based active TCI state switch with m-DCI for simultaneous reception
p. 3652
A.7.5.8.4.1
Test Purpose and Environment
p. 3652
A.7.5.8.4.2
Test Requirements
p. 3654
A.7.5.8.5
Single-DCI FR2 DCI based active TCI state switch with known target TCI states for simultaneous reception
p. 3654
A.7.5.8.5.1
Test Purpose and Environment
p. 3654
A.7.5.8.5.1.2
Test Requirements
p. 3657
A.7.5.9
Uplink spatial relation switch delay
p. 3657
A.7.5.9.1
-
p. 3657
A.7.5.9.1.1
-
p. 3657
A.7.5.9.1.1.1
Test Purpose and Environment
p. 3657
A.7.5.9.1.1.2
Test Requirements
p. 3660
A.7.5.9.2
RRC based spatial relation switch
p. 3660
A.7.5.9.2.1
NR PCell FR2 spatial relation switch associated with a known DL-RS
p. 3660
A.7.5.9.2.1.1
Test Purpose and Environment
p. 3660
A.7.5.9.2.1.2
Test Requirements
p. 3663
A.7.5.10
UE specific CBW change
p. 3663
A.7.5.10.1
NR FR2 UE specific CBW change of PCell with non-DRX in SA
p. 3663
A.7.5.10.1.1
Test Purpose and Environment
p. 3663
A.7.5.10.1.2
Test Requirements
p. 3666
A.7.5.11
UE UL carrier RRC reconfiguration Delay
p. 3667
A.7.5.11.1
UE UL carrier RRC reconfiguration Delay
p. 3667
A.7.5.11.1.1
Test Purpose and Environment
p. 3667
A.7.5.11.1.2
Test Requirements
p. 3670
A.7.5.12
Conditional PSCell addition and release delay (FR2 SA)
p. 3670
A.7.5.12.1
Addition and Release Delay of PSCell
p. 3670
A.7.5.12.1.1
Test purpose and environment
p. 3670
A.7.5.12.1.2
Test Parameters
p. 3670
A.7.5.12.1.3
Test Requirements
p. 3673
A.7.5.13
Unified TCI state switching delay
p. 3673
A.7.5.13.1
MAC-CE based active joint TCI state switching
p. 3673
A.7.5.13.1.1
NR PCell FR2 active joint TCI state switch for a known TCI state
p. 3673
A.7.5.13.1.1.1
Test Purpose and Environment
p. 3673
A.7.5.13.1.1.2
Test parameters
p. 3674
A.7.5.13.1.1.3
Test Requirements
p. 3676
A.7.5.13.2
MAC-CE based active uplink TCI state switch
p. 3676
A.7.5.13.2.1
NR FR2 PCell uplink TCI state switch for a known TCI state
p. 3676
A.7.5.13.2.1.1
Test Purpose and Environment
p. 3676
A.7.5.13.2.1.2
Test parameters
p. 3677
A.7.5.13.2.1.3
Test Requirements
p. 3679
A.7.5.13.3
MAC-CE based active downlink TCI state switch
p. 3679
A.7.5.13.3.1
NR PCell FR2 active downlink TCI state switch to cell with additional PCI for a known TCI state
p. 3679
A.7.5.13.3.1.1
Test Purpose and Environment
p. 3679
A.7.5.13.3.1.2
Test Parameters
p. 3680
A.7.5.13.3.1.3
Test Requirements
p. 3683
A.7.5.13.4
sDCI MAC-CE based joint TCI state switching
p. 3683
A.7.5.13.4.1
NR PCell FR2 dual downlink and uplink TCI state switch in sDCI for known case
p. 3683
A.7.5.13.4.1.1
Test Purpose and Environment
p. 3683
A.7.5.13.4.1.2
Test parameters
p. 3684
A.7.5.13.4.1.3
Test Requirements
p. 3688
A.7.5.13.5
MAC-CE based dual downlink TCI state switching delay for unified TCI for single-DCI mTRP
p. 3688
A.7.5.13.5.1
NR PCell FR2 dual downlink TCI state switch in sDCI for known case
p. 3688
A.7.5.13.5.1.1
Test Purpose and Environment
p. 3688
A.7.5.13.5.1.2
Test Parameters
p. 3689
A.7.5.13.5.1.3
Test Requirements
p. 3691
A.7.5.13.6
MAC-CE based active uplink TCI state switch for single-DCI mTRP
p. 3691
A.7.5.13.6.1
NR FR2 PCell uplink TCI state switch for two known TCI states
p. 3691
A.7.5.13.6.1.1
Test Purpose and Environment
p. 3691
A.7.5.13.6.1.2
Test parameters
p. 3692
A.7.5.13.6.1.3
Test Requirements
p. 3695
A.7.5.14
PSCell RACH-less based Activation and deactivation for FR1+FR2 inter-band with target PSCell in FR2
p. 3695
A.7.5.14.1
Test Purpose and Environment
p. 3695
A.7.5.14.2
Test Requirements
p. 3698
A.7.5.15
Void
A.7.5.16
UE L1-RSRP Scheduling and Measureme t Restrictions on FR2-1
p. 3699
A.7.5.16.1
Test Purpose and Environment
p. 3699
A.7.5.16.2
Test Requirements
p. 3703
A.7.5.17
SCG Activation and deactivation for FR1+FR1 inter-band with target PSCell in FR1
p. 3703
A.7.5.17.1
Test Purpose and Environment
p. 3703
A.7.5.17.2
Test Requirements
p. 3707
A.7.5.18
Subsequent conditional PSCell addition/change
p. 3708
A.7.5.18.1
Intra-frequency subsequent CPC from FR1-FR2 NR-DC to FR1-FR2 NR-DC
p. 3708
A.7.5.18.1.1
Test purpose and environment
p. 3708
A.7.5.18.1.2
Test Requirements
p. 3711
A.7.5.18.2
Inter-frequency subsequent CPA from FR1-FR2 NR-DC to FR1-FR2 NR-DC
p. 3712
A.7.5.18.2.1
Test Purpose and Environment
p. 3712
A.7.5.18.2.2
Test Requirements
p. 3715
A.7.6
Measurement procedure
p. 3594
A.7.6.1
Intra-frequency Measurements
p. 3594
A.7.6.1.1
SA event triggered reporting test without gap under non-DRX
p. 3594
A.7.6.1.1.1
Test purpose and Environment
p. 3594
A.7.6.1.1.2
Test Requirements
p. 3597
A.7.6.1.2
SA event triggered reporting test without gap under DRX
p. 3597
A.7.6.1.2.1
Test purpose and Environment
p. 3597
A.7.6.1.2.2
Test Requirements
p. 3600
A.7.6.1.3
SA event triggered reporting test with per-UE gaps under non-DRX
p. 3601
A.7.6.1.3.1
Test purpose and Environment
p. 3601
A.7.6.1.3.2
Test Requirements
p. 3604
A.7.6.1.4
SA event triggered reporting test with per-UE gaps under DRX
p. 3604
A.7.6.1.4.1
Test purpose and Environment
p. 3604
A.7.6.1.4.2
Test Requirements
p. 3607
A.7.6.1.5
SA event triggered reporting test without gap under non-DRX for UE configured with highSpeedMeasFlagFR2-r17
p. 3608
A.7.6.1.5.1
Test purpose and Environment
p. 3608
A.7.6.1.5.2
Test Requirements
p. 3611
A.7.6.1.6
SA event triggered reporting test without gap under non-DRX for FR2-2
p. 3611
A.7.6.1.6.1
Test purpose and Environment
p. 3611
A.7.6.1.6.2
Test Requirements
p. 3614
A.7.6.1.7
SA event triggered reporting test without gap under DRX for FR2-2
p. 3615
A.7.6.1.7.1
Test purpose and Environment
p. 3615
A.7.6.1.7.2
Test Requirements
p. 3617
A.7.6.1.8
SA event triggered reporting test with per-UE gaps under non-DRX for FR2-2
p. 3618
A.7.6.1.8.1
Test purpose and Environment
p. 3618
A.7.6.1.8.2
Test Requirements
p. 3621
A.7.6.1.9
SA event triggered reporting test with per-UE gaps under DRX for FR2-2
p. 3622
A.7.6.1.9.1
Test purpose and Environment
p. 3622
A.7.6.1.9.2
Test Requirements
p. 3624
A.7.6.1.10
SA event triggered reporting test with SSB time index detection without gap under non-DRX for FR2-2
p. 3625
A.7.6.1.10.1
Test purpose and Environment
p. 3625
A.7.6.1.10.2
Test Requirements
p. 3629
A.7.6.1.11
SA event triggered reporting test with SSB time index detection with per-UE gaps under non-DRX for FR2-2
p. 3629
A.7.6.1.11.1
Test purpose and Environment
p. 3629
A.7.6.1.11.2
Test Requirements
p. 3632
A.7.6.1.12
SA event triggered reporting test without gap under non-DRX when CD-SSB is outside active BWP
p. 3632
A.7.6.1.12.1
Test purpose and Environment
p. 3632
A.7.6.1.12.2
Test Requirements
p. 3633
A.7.6.1.13
SA event triggered reporting test without gap under non-DRX with NCD-SSB
p. 3633
A.7.6.1.13.1
Test purpose and Environment
p. 3633
A.7.6.1.13.2
Test Requirements
p. 3637
A.7.6.1.14
SA event triggered reporting test without gap under non-DRX for power class 6 UE supporting measEnhCAInterFreqFR2-r18
p. 3637
A.7.6.1.14.1
Test Purpose and Environment
p. 3637
A.7.6.1.14.2
Test Requirements
p. 3639
A.7.6.2
Inter-frequency Measurements
p. 3640
A.7.6.2.1
SA event triggered reporting tests for FR2 without SSB time index detection when DRX is not used (PCell in FR2)
p. 3640
A.7.6.2.1.1
Test Purpose and Environment
p. 3640
A.7.6.2.1.2
Test Requirements
p. 3643
A.7.6.2.2
SA event triggered reporting tests for FR2 without SSB time index detection when DRX is used (Pcell in FR2)
p. 3643
A.7.6.2.2.1
Test Purpose and Environment
p. 3643
A.7.6.2.2.2
Test Requirements
p. 3647
A.7.6.2.3
SA event triggered reporting tests for FR2 with SSB time index detection when DRX is not used (PCell in FR2)
p. 3647
A.7.6.2.3.1
Test Purpose and Environment
p. 3647
A.7.6.2.3.2
Test Requirements
p. 3651
A.7.6.2.4
SA event triggered reporting tests for FR2 with SSB time index detection when DRX is used (Pcell in FR2)
p. 3651
A.7.6.2.4.1
Test Purpose and Environment
p. 3651
A.7.6.2.4.2
Test Requirements
p. 3655
A.7.6.2.5
SA event triggered reporting tests for FR2 without SSB time index detection when DRX is not used (PCell in FR1)
p. 3655
A.7.6.2.5.1
Test Purpose and Environment
p. 3655
A.7.6.2.5.2
Test Requirements
p. 3659
A.7.6.2.6
SA event triggered reporting tests for FR2 without SSB time index detection when DRX is used (Pcell in FR1)
p. 3660
A.7.6.2.6.1
Test Purpose and Environment
p. 3660
A.7.6.2.6.2
Test Requirements
p. 3664
A.7.6.2.7
SA event triggered reporting tests for FR2 with SSB time index detection when DRX is not used (PCell in FR1)
p. 3665
A.7.6.2.7.1
Test Purpose and Environment
p. 3665
A.7.6.2.7.2
Test Requirements
p. 3669
A.7.6.2.8
SA event triggered reporting tests for FR2 with SSB time index detection when DRX is used (PCell in FR1)
p. 3670
A.7.6.2.8.1
Test Purpose and Environment
p. 3670
A.7.6.2.8.2
Test Requirements
p. 3674
A.7.6.2.9
SA event triggered reporting tests For FR2 without SSB time index detection when DRX is not used (PCell in FR2) (rel16 additional mandatory gap pattern 17)
p. 3675
A.7.6.2.9.1
Test Purpose and Environment
p. 3675
A.7.6.2.9.2
Test Requirements
p. 3679
A.7.6.2.10
SA event triggered reporting test without gap under non-DRX
p. 3679
A.7.6.2.10.1
Test Purpose and Environment
p. 3679
A.7.6.2.10.2
Test Requirements
p. 3681
A.7.6.2.11
SA event triggered reporting test without gap under DRX
p. 3682
A.7.6.2.11.1
Test Purpose and Environment
p. 3682
A.7.6.2.11.2
Test Requirements
p. 3684
A.7.6.2.12
SA event triggered reporting tests for FR2-2 without SSB time index detection when DRX is not used (PCell in FR2-2)
p. 3685
A.7.6.2.12.1
Test Purpose and Environment
p. 3685
A.7.6.2.12.2
Test Requirements
p. 3688
A.7.6.2.13
SA event triggered reporting tests for FR2-2 without SSB time index detection when DRX is used (PCell in FR2-2)
p. 3689
A.7.6.2.13.1
Test Purpose and Environment
p. 3689
A.7.6.2.13.2
Test Requirements
p. 3693
A.7.6.2.14
SA event triggered reporting tests for FR2-2 with SSB time index detection when DRX is not used (PCell in FR2-2)
p. 3694
A.7.6.2.14.1
Test Purpose and Environment
p. 3694
A.7.6.2.14.2
Test Requirements
p. 3698
A.7.6.2.15
SA event triggered reporting tests for FR2-2 with SSB time index detection when DRX is used (PCell in FR2-2)
p. 3699
A.7.6.2.15.1
Test Purpose and Environment
p. 3699
A.7.6.2.15.2
Test Requirements
p. 3703
A.7.6.2.16
SA event triggered reporting tests for FR2-2 without SSB time index detection when DRX is not used (PCell in FR1)
p. 3704
A.7.6.2.16.1
Test Purpose and Environment
p. 3704
A.7.6.2.16.2
Test Requirements
p. 3710
A.7.6.2.17
SA event triggered reporting tests for FR2-2 without SSB time index detection when DRX is used (PCell in FR1)
p. 3710
A.7.6.2.17.1
Test Purpose and Environment
p. 3710
A.7.6.2.17.2
Test Requirements
p. 3717
A.7.6.2.18
SA event triggered reporting tests for FR2-2 with SSB time index detection when DRX is not used (PCell in FR1)
p. 3718
A.7.6.2.18.1
Test Purpose and Environment
p. 3718
A.7.6.2.18.2
Test Requirements
p. 3724
A.7.6.2.19
SA event triggered reporting tests for FR2-2 with SSB time index detection when DRX is used (PCell in FR1)
p. 3724
A.7.6.2.19.1
Test Purpose and Environment
p. 3724
A.7.6.2.19.2
Test Requirements
p. 3732
A.7.6.2.20
SA event triggered reporting tests for FR2 with a measurement gap and two periodic MUSIM gaps configured
p. 3733
A.7.6.2.20.1
Test Purpose and Environment
p. 3733
A.7.6.2.20.2
Test Requirements
p. 3736
A.7.6.2.21
SA event triggered reporting tests for FR2 with MUSIM gap partially partial overlapping scenario configured (PCell in FR2)
p. 3736
A.7.6.2.21.1
Test Purpose and Environment
p. 3736
A.7.6.2.21.2
Test Requirements
p. 3739
A.7.6.2.22
SA event triggered reporting tests with SSB time index detection when DRX is not used (PCell in FR2) for FR2 power class 6 UE configured with highSpeedMeasFlagFR2-r17
p. 3739
A.7.6.2.22.1
Test Purpose and Environment
p. 3739
A.7.6.2.22.2
Test Requirements
p. 3743
A.7.6.2.23
SA event triggered reporting tests without SSB time index detection when DRX is not used (PCell in FR2) for FR2 power class 6 UE configured with highSpeedMeasFlagFR2-r17
p. 3743
A.7.6.2.23.1
Test Purpose and Environment
p. 3743
A.7.6.2.23.2
Test Requirements
p. 3745
A.7.6.3
L1-RSRP measurement for beam reporting
p. 3746
A.7.6.3.1
SSB based L1-RSRP measurement when DRX is not used
p. 3746
A.7.6.3.1.1
Test Purpose and Environment
p. 3746
A.7.6.3.1.2
Test parameters
p. 3746
A.7.6.3.1.3
Test Requirements
p. 3748
A.7.6.3.2
SSB based L1-RSRP measurement when DRX is used
p. 3748
A.7.6.3.2.1
Test Purpose and Environment
p. 3748
A.7.6.3.2.2
Test parameters
p. 3749
A.7.6.3.2.3
Test Requirements
p. 3751
A.7.6.3.3
CSI-RS based L1-RSRP measurement when DRX is not used
p. 3751
A.7.6.3.3.1
Test Purpose and Environment
p. 3751
A.7.6.3.3.2
Test parameters
p. 3752
A.7.6.3.3.3
Test Requirements
p. 3754
A.7.6.3.4
CSI-RS based L1-RSRP measurement when DRX is used
p. 3755
A.7.6.3.4.1
Test Purpose and Environment
p. 3755
A.7.6.3.4.2
Test parameters
p. 3755
A.7.6.3.4.3
Test Requirements
p. 3757
A.7.6.3.5
SSB based L1-RSRP measurement when DRX is used for power class 6 UE configured with highSpeedMeasFlagFR2-r17
p. 3758
A.7.6.3.5.1
Test Purpose and Environment
p. 3758
A.7.6.3.5.2
Test parameters
p. 3758
A.7.6.3.5.3
Test Requirements
p. 3760
A.7.6.3.6
Inter-cell SSB based L1-RSRP measurements on FR2 SCell when DRX is not used
p. 3760
A.7.6.3.6.1
Test Purpose and Environment
p. 3760
A.7.6.3.6.2
Test parameters
p. 3761
A.7.6.3.6.3
Test Requirements
p. 3764
A.7.6.3.7
SSB based L1-RSRP measurement for FR2-2 when DRX is used
p. 3764
A.7.6.3.7.1
Test Purpose and Environment
p. 3764
A.7.6.3.7.2
Test parameters
p. 3765
A.7.6.3.7.3
Test Requirements
p. 3768
A.7.6.3.8
CSI-RS based L1-RSRP measurement when DRX is not used and when CD-SSB is outside active BWP
p. 3769
A.7.6.3.8.1
Test Purpose and Environment
p. 3769
A.7.6.3.9
SSB based L1-RSRP measurement when DRX is not used when CD-SSB is outside active BWP
p. 3769
A.7.6.3.9.1
Test Purpose and Environment
p. 3769
A.7.6.3.9.2
Test Requirements
p. 3769
A.7.6.3.10
SSB based L1-RSRP measurement for UE supporting NCD-SSB based L1 measurement outside active BWP when DRX is not used
p. 3769
A.7.6.3.10.1
Test Purpose and Environment
p. 3769
A.7.6.3.10.2
Test parameters
p. 3770
A.7.6.3.10.3
Test Requirements
p. 3772
A.7.6.3.11
SSB based L1-RSRP measurement when DRX is used for power class 6 UE supporting simultaneousReceptionTwoQCL-r18
p. 3772
A.7.6.3.11.1
Test Purpose and Environment
p. 3772
A.7.6.3.11.2
Test parameters
p. 3773
A.7.6.3.11.3
Test Requirements
p. 3775
A.7.6.4
CLI measurements
p. 3775
A.7.6.4.1
SRS-RSRP measurement with non-DRX
p. 3775
A.7.6.4.1.1
Test Purpose and Environment
p. 3775
A.7.6.4.1.2
Test Parameters
p. 3776
A.7.6.4.1.3
Test Requirements
p. 3778
A.7.6.4.2
CLI-RSSI measurement with non-DRX
p. 3778
A.7.6.4.2.1
Test Purpose and Environment
p. 3778
A.7.6.4.2.2
Test Parameters
p. 3779
A.7.6.4.2.3
Test Requirements
p. 3780
A.7.6.5.1
SA interfrequency CGI reporting in autonomous gaps test (PCell in FR2)
p. 3781
A.7.6.5.1.1
Test Purpose and Environment
p. 3781
A.7.6.5.1.2
Test Requirements
p. 3784
A.7.6.6
L1-SINR measurement for beam reporting
p. 3784
A.7.6.6.2
L1-SINR measurement with SSB based CMR and dedicated IMR when DRX is used
p. 3786
A.7.6.6.2.1
Test Purpose and Environment
p. 3786
A.7.6.6.2.2
Test parameters
p. 3787
A.7.6.6.2.3
Test Requirements
p. 3789
A.7.6.6.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR configured when DRX is used
p. 3789
A.7.6.6.3.1
Test Purpose and Environment
p. 3789
A.7.6.6.3.2
Test parameters
p. 3790
A.7.6.6.3.3
Test Requirements
p. 3792
A.7.6.7
CSI-RS based intra-frequency Measurements
p. 3792
A.7.6.7.1
SA event triggered reporting test without gap under DRX for CSI-RS based intra-frequency measurement
p. 3792
A.7.6.7.1.1
Test purpose and Environment
p. 3792
A.7.6.7.1.2
Test Requirements
p. 3795
A.7.6.8
CSI-RS based inter-frequency Measurements
p. 3795
A.7.6.8.1
SA event triggered reporting tests for FR2 CSI-RS based measurement when non-DRX is used (PCell in FR2)
p. 3795
A.7.6.8.1.1
Test Purpose and Environment
p. 3795
A.7.6.8.1.2
Test Requirements
p. 3798
A.7.6.9
RSTD measurements
p. 3798
A.7.6.9.1
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR2 SA
p. 3798
A.7.6.9.1.1
Test Purpose and Environment
p. 3798
A.7.6.9.1.2
Test Requirements
p. 3806
A.7.6.9.2
NR RSTD measurement reporting delay test case for dual positioning frequency layers in FR2 SA
p. 3806
A.7.6.9.2.1
Test Purpose and Environment
p. 3806
A.7.6.9.2.2
Test Requirements
p. 3814
A.7.6.9.3
NR RSTD measurement reporting delay test case for single positioning frequency layer with reduced number of samples in FR2 SA
p. 3814
A.7.6.9.3.1
Test Purpose and Environment
p. 3814
A.7.6.9.3.2
Test Requirements
p. 3820
A.7.6.9.4
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR2 SA without measurement gap
p. 3821
A.7.6.9.4.1
Test Purpose and Environment
p. 3821
A.7.6.9.4.2
Test Requirements
p. 3824
A.7.6.9.5
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR2 SA in RRC_CONNECTED state with Rx TEG
p. 3825
A.7.6.9.5.1
Test Purpose and Environment
p. 3825
A.7.6.9.5.2
Test Requirements
p. 3828
A.7.6.10
PRS-RSRP measurements
p. 3829
A.7.6.10.1
PRS-RSRP reporting delay test case for single positioning frequency layer
p. 3829
A.7.6.10.1.1
Test Purpose and Environment
p. 3829
A.7.6.10.1.2
Test Requirements
p. 3833
A.7.6.10.2
PRS-RSRP reporting delay test case for dual positioning frequency layer
p. 3833
A.7.6.10.2.1
Test Purpose and Environment
p. 3833
A.7.6.10.2.2
Test Requirements
p. 3837
A.7.6.10.3
PRS-RSRP reporting delay test case for reduced number of samples
p. 3837
A.7.6.10.3.1
Test Purpose and Environment
p. 3837
A.7.6.10.3.2
Test Requirements
p. 3841
A.7.6.10.4
PRS-RSRP reporting delay test case for single positioning frequency layer outside MG
p. 3841
A.7.6.10.4.1
Test Purpose and Environment
p. 3841
A.7.6.10.4.2
Test Requirements
p. 3845
A.7.6.11
UE Rx-Tx time difference measurements
p. 3845
A.7.6.11.1
UE Rx-Tx time difference measurements for single positioning frequency layer in FR2 SA
p. 3845
A.7.6.11.1.1
Test purpose and environment
p. 3845
A.7.6.11.1.2
Test requirements
p. 3849
A.7.6.11.2
UE Rx-Tx time difference measurement period for dual positioning frequency layers in FR2 SA
p. 3849
A.7.6.11.2.1
Test purpose and environment
p. 3849
A.7.6.11.2.2
Test requirements
p. 3853
A.7.6.11.3
UE Rx-Tx time difference measurements for single positioning frequency layer in FR2 SA with reduced sample number
p. 3853
A.7.6.11.3.1
Test purpose and environment
p. 3853
A.7.6.11.3.2
Test requirements
p. 3855
A.7.6.11.4
UE Rx-Tx time difference measurements without gaps in FR2 SA
p. 3856
A.7.6.11.4.1
Test purpose and environment
p. 3856
A.7.6.11.4.2
Test requirements
p. 3858
A.7.6.11.5
UE Rx-Tx time difference measurements for single positioning frequency layer in FR2 SA with RxTx TEG
p. 3859
A.7.6.11.5.1
Test purpose and environment
p. 3859
A.7.6.11.5.2
Test requirements
p. 3861
A.7.6.12
PRS-RSRPP measurements
p. 3862
A.7.6.12.1
PRS-RSRPP reporting delay test case for single positioning frequency layer in FR2 in RRC_CONNECTED state
p. 3862
A.7.6.12.1.1
Test Purpose and Environment
p. 3862
A.7.6.12.1.2
Test Requirements
p. 3864
A.7.6.12.2
PRS-RSRPP reporting delay test case for reduced number of samples for single positioning frequency layer in FR2 in RRC_CONNECTED state
p. 3865
A.7.6.12.2.1
Test Purpose and Environment
p. 3865
A.7.6.12.2.2
Test Requirements
p. 3867
A.7.6.12.3
PRS-RSRPP reporting delay test case for gapless measurement in FR2
p. 3868
A.7.6.12.3.1
Test Purpose and Environment
p. 3868
A.7.6.12.3.2
Test Requirements
p. 3871
A.7.6.13
UE Rx-Tx time difference measurements for PDC
p. 3871
A.7.6.13.1
UE Rx-Tx time difference measurement for propagation delay compensation using PRS in FR2
p. 3871
A.7.6.13.1.1
Test purpose and environment
p. 3871
A.7.6.13.1.2
Test requirements
p. 3873
A.7.6.13.2
UE Rx-Tx time difference measurement for propagation delay compensation using TRS in FR2
p. 3874
A.7.6.13.2.1
Test purpose and environment
p. 3874
A.7.6.13.2.2
Test requirements
p. 3876
A.7.6.14
SA event triggered reporting tests with Pre-MG
p. 3877
A.7.6.14.1
Intra-frequency measurement test with SA event triggered reporting tests: with autonomous activation/deactivation of Pre-MG in FR2
p. 3877
A.7.6.14.1.1
Test purpose and Environment
p. 3877
A.7.6.14.1.2
Test parameters
p. 3877
A.7.6.14.1.3
Test Requirements
p. 3880
A.7.6.14.2
Intra-frequency measurement test with SA event triggered reporting tests: with network-controlled activation/deactivation of Pre-MG in FR2
p. 3880
A.7.6.14.2.1
Test purpose and Environment
p. 3880
A.7.6.14.2.2
Test parameters
p. 3880
A.7.6.14.2.3
Test Requirements
p. 3883
A.7.6.15
SA event triggered reporting tests with concurrent gaps
p. 3883
A.7.6.15.1
SA event triggered reporting tests For FR2 with fully non-overlapping concurrent MGs for SSB-based inter-frequency measurements
p. 3883
A.7.6.15.1.1
Test Purpose and Environment
p. 3883
A.7.6.15.1.2
Test Requirements
p. 3886
A.7.6.15.2
SA event triggered reporting tests For FR2 with concurrent measurement gaps without SSB time index detection when DRX is not used (PCell in FR2)
p. 3886
A.7.6.15.2.1
Test Purpose and Environment
p. 3886
A.7.6.15.2.2
Test Requirements
p. 3889
A.7.6.15.3
SA event triggered reporting tests for FR2 concurrent gap with partially partial overlapping scenario for SSB-based measurements and PRS-based measurement
p. 3889
A.7.6.15.3.1
Test Purpose and Environment
p. 3889
A.7.6.15.3.2
Test Requirements
p. 3893
A.7.6.16
SA event triggered reporting tests with NCSG
p. 3894
A.7.6.16.1
SA event triggered reporting test with per-UE NCSG under non-DRX
p. 3894
A.7.6.16.1.1
Test purpose and Environment
p. 3894
A.7.6.16.1.2
Test Requirements
p. 3898
A.7.6.16.2
SA event triggered reporting tests on inter-frequency measurement with NCSG for FR2 when DRX is not used (PCell in FR2)
p. 3898
A.7.6.16.2.1
Test Purpose and Environment
p. 3898
A.7.6.16.2.2
Test Requirements
p. 3901
A.7.6.16.3
Event triggered reporting test on deactivated Scell measurement via NCSG in FR2 in non-DRX
p. 3901
A.7.6.16.3.1
Test Purpose and Environment
p. 3901
A.7.6.16.3.2
Test Requirements
p. 3904
A.7.6.17
SA event triggered reporting tests for concurrent measurement gaps with Pre-MG in FR2
p. 3905
A.7.6.17.1
SA event triggered reporting test for FR2 with one pre-configured gap and one measurement gap
p. 3905
A.7.6.17.1.1
Test Purpose and Environment
p. 3905
A.7.6.17.1.2
Test Requirements
p. 3908
A.7.6.18.1
Inter-frequency measurement test with SA event triggered reporting tests: with autonomous activation/deactivation of Pre-MGs in FR2
p. 3908
A.7.6.18.1.1
Test purpose and Environment
p. 3908
A.7.6.18.1.2
Test parameters
p. 3909
A.7.6.18.1.3
Test Requirements
p. 3911
A.7.6.18a
SA event triggered reporting tests with concurrent gaps and NCSG
p. 3912
A.7.6.18a.1
SA event triggered reporting tests For FR2 with concurrent measurement gaps and NCSG without SSB time index detection when DRX is not used (PCell in FR2)
p. 3912
A.7.6.18a.1.1
Test Purpose and Environment
p. 3912
A.7.6.18a.1.2
Test Requirements
p. 3915
A.7.6.19
SA event triggered reporting tests with NeedForGap in FR2
p. 3915
A.7.6.19.1
SA event triggered reporting test for UE indicating NeedforInterruptionInfoNR under non-DRX and no interruption outside configured measurement gaps
p. 3915
A.7.6.19.1.1
Test purpose and Environment
p. 3915
A.7.6.19.1.2
Test Requirements
p. 3919
A.7.6.19.2
SA event triggered reporting test without gap under non-DRX
p. 3919
A.7.6.19.2.1
Test purpose and Environment
p. 3919
A.7.6.19.2.2
Test Requirements
p. 3922
A.7.6.20
LTM Intra-frequency L1-RSRP measurement
p. 3922
A.7.6.20.1
Intra-frequency SSB based L1-RSRP measurement in FR2
p. 3922
A.7.6.20.1.1
Test Purpose and Environment
p. 3922
A.7.6.20.1.2
Test parameters
p. 3922
A.7.6.20.1.3
Test Requirements
p. 3925
A.7.6.21
LTM Inter-frequency L1-RSRP measurement with measurement gap
p. 3925
A.7.6.21.1
Inter-frequency SSB-based L1-RSRP measurement with measurement gap for LTM
p. 3925
A.7.6.21.1.1
Test Purpose and Environment
p. 3925
A.7.6.21.1.2
Test parameters
p. 3926
A.7.6.21.1.3
Test Requirements
p. 3928
A.7.6.22
LTM Inter-frequency L1-RSRP measurement without measurement gap
p. 3928
A.7.6.22.1
Inter-frequency SSB based L1-RSRP measurement without measurement gap in FR2
p. 3928
A.7.6.22.1.1
Test Purpose and Environment
p. 3928
A.7.6.22.1.2
Test parameters
p. 3929
A.7.6.22.1.3
Test Requirements
p. 3932
A.7.6.23
Idle Mode CA/DC Measurements
p. 3932
A.7.6.23.1
Test case for Idle mode fast CA/DC eEMR measurement for FR2
p. 3932
A.7.6.23.1.1
Test Purpose and Environment
p. 3932
A.7.6.23.1.2
Test Requirements
p. 3937
A.7.6.23.2
Test case for Idle mode fast CA/DC cell reselection measurement for FR2 without valid reporting
p. 3937
A.7.6.23.2.1
Test Purpose and Environment
p. 3937
A.7.6.23.2.2
Test Requirements
p. 3943
A.7.6.23.3
Test case for Idle mode fast CA/DC cell reselection measurement for FR2 with valid reporting
p. 3943
A.7.6.23.3.1
Test Purpose and Environment
p. 3943
A.7.6.23.3.2
Test Requirements
p. 3949
A.7.7
Measurement Performance requirements
p. 3949
A.7.7.1
SS-RSRP
p. 3950
A.7.7.1.1
SA intra-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 3950
A.7.7.1.1.1
Test Purpose and Environment
p. 3950
A.7.7.1.1.2
Test parameters
p. 3950
A.7.7.1.1.3
Test Requirements
p. 3954
A.7.7.1.2
SA inter-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 3955
A.7.7.1.2.1
Test Purpose and Environment
p. 3955
A.7.7.1.2.2
Test parameters
p. 3955
A.7.7.1.2.3
Test Requirements
p. 3959
A.7.7.1.3
SA inter-frequency measurement accuracy with FR1 serving cell and FR2 target cell
p. 3960
A.7.7.1.3.1
Test Purpose and Environment
p. 3960
A.7.7.1.3.2
Test parameters
p. 3960
A.7.7.1.3.3
Test Requirements
p. 3964
A.7.7.2
SS-RSRQ
p. 3964
A.7.7.2.1
SA intra-frequency measurement accuracy with FR2 serving cell and FR2 target cell
p. 3964
A.7.7.2.1.1
Test Purpose and Environment
p. 3964
A.7.7.2.1.2
Test Parameters
p. 3964
A.7.7.2.1.3
Test Requirements
p. 3966
A.7.7.2.2
SA Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 3966
A.7.7.2.2.1
Test Purpose and Environment
p. 3966
A.7.7.2.2.2
Test Parameters
p. 3966
A.7.7.2.2.3
Test Requirements
p. 3968
A.7.7.3
SS-SINR
p. 3968
A.7.7.3.1
SA intra-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 3968
A.7.7.3.1.1
Test Purpose and Environment
p. 3968
A.7.7.3.1.2
Test Parameters
p. 3968
A.7.7.3.1.3
Test Requirements
p. 3970
A.7.7.3.2
SA Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 3970
A.7.7.3.2.1
Test Purpose and Environment
p. 3970
A.7.7.3.2.2
Test Parameters
p. 3970
A.7.7.3.2.3
Test Requirements
p. 3972
A.7.7.4
L1-RSRP measurement for beam reporting
p. 3972
A.7.7.4.1
SSB based L1-RSRP measurement
p. 3972
A.7.7.4.1.1
Test Purpose and Environment
p. 3972
A.7.7.4.1.2
Test parameters
p. 3973
A.7.7.4.1.3
Test Requirements
p. 3975
A.7.7.4.2
CSI-RS based L1-RSRP measurement on resource set with repetition off
p. 3976
A.7.7.4.2.1
Test Purpose and Environment
p. 3976
A.7.7.4.2.2
Test parameters
p. 3976
A.7.7.4.2.3
Test Requirements
p. 3978
A.7.7.5
CLI measurements
p. 3979
A.7.7.5.1
SA SRS-RSRP measurement accuracy with FR2 serving cell
p. 3979
A.7.7.5.1.1
Test Purpose and Environment
p. 3979
A.7.7.5.1.2
Test parameters
p. 3979
A.7.7.5.1.3
Test Requirements
p. 3982
A.7.7.5.2
SA CLI-RSSI measurement accuracy with FR2 serving cell
p. 3983
A.7.7.5.2.1
Test Purpose and Environment
p. 3983
A.7.7.5.2.2
Test parameters
p. 3983
A.7.7.5.2.3
Test Requirements
p. 3985
A.7.7.6
L1-SINR measurement for beam reporting
p. 3986
A.7.7.6.1
-
p. 3986
A.7.7.6.1.1
Test Purpose and Environment
p. 3986
A.7.7.6.1.2
Test parameters
p. 3986
A.7.7.6.1.3
Test Requirements
p. 3988
A.7.7.6.2
L1-SINR measurement with SSB based CMR and dedicated IMR
p. 3989
A.7.7.6.2.1
Test Purpose and Environment
p. 3989
A.7.7.6.2.2
Test parameters
p. 3989
A.7.7.6.2.3
Test Requirements
p. 3991
A.7.7.6.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR
p. 3992
A.7.7.6.3.1
Test Purpose and Environment
p. 3992
A.7.7.6.3.2
Test parameters
p. 3992
A.7.7.6.3.3
Test Requirements
p. 3994
A.7.7.7
CSI-RSRP
p. 3995
A.7.7.7.1
SA intra-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 3995
A.7.7.7.1.1
Test Purpose and Environment
p. 3995
A.7.7.7.1.2
Test parameters
p. 3995
A.7.7.7.1.3
Test Requirements
p. 3998
A.7.7.7.2
SA inter-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 3999
A.7.7.7.2.1
Test Purpose and Environment
p. 3999
A.7.7.7.2.2
Test parameters
p. 3999
A.7.7.7.2.3
Test Requirements
p. 4002
A.7.7.8
CSI-RSRQ
p. 4003
A.7.7.8.1
SA intra-frequency measurement accuracy with FR2 serving cell and FR2 target cell
p. 4003
A.7.7.8.1.1
Test Purpose and Environment
p. 4003
A.7.7.8.1.2
Test Parameters
p. 4003
A.7.7.8.1.3
Test Requirements
p. 4005
A.7.7.8.2
SA Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 4005
A.7.7.8.2.1
Test Purpose and Environment
p. 4005
A.7.7.8.2.2
Test Parameters
p. 4005
A.7.7.8.2.3
Test Requirements
p. 4007
A.7.7.9
CSI-SINR
p. 4007
A.7.7.9.1
SA intra-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 4007
A.7.7.9.1.1
Test Purpose and Environment
p. 4007
A.7.7.9.1.2
Test Parameters
p. 4007
A.7.7.9.1.3
Test Requirements
p. 4009
A.7.7.9.2
SA Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 4009
A.7.7.9.2.1
Test Purpose and Environment
p. 4009
A.7.7.9.2.2
Test Parameters
p. 4010
A.7.7.9.2.3
Test Requirements
p. 4012
A.7.7.10
RSTD measurements
p. 4012
A.7.7.10.1
RSTD measurement accuracy test case for single positioning frequency layer
p. 4012
A.7.7.10.1.1
Test purpose and Environment
p. 4012
A.7.7.10.1.2
Test Requirements
p. 4015
A.7.7.10.2
RSTD measurement accuracy test case for dual positioning frequency layer
p. 4015
A.7.7.10.2.1
Test purpose and Environment
p. 4015
A.7.7.10.2.2
Test Requirements
p. 4018
A.7.7.10.3
RSTD measurement accuracy test case with reduced number of samples for single positioning frequency layer in FR2 in RRC_CONNECTED state
p. 4018
A.7.7.10.3.1
Test purpose and Environment
p. 4018
A.7.7.10.3.2
Test Requirements
p. 4020
A.7.7.10.4
RSTD measurement accuracy test case with Rx TEG
p. 4020
A.7.7.10.4.1
Test purpose and Environment
p. 4020
A.7.7.10.4.2
Test Requirements
p. 4023
A.7.7.11
PRS-RSRP measurements
p. 4023
A.7.7.11.1
SA measurement accuracy with PRS in FR2
p. 4023
A.7.7.11.1.1
Test Purpose and Environment
p. 4023
A.7.7.11.1.2
Test parameters
p. 4023
A.7.7.11.1.3
Test Requirements
p. 4027
A.7.7.11.2
SA measurement accuracy with PRS in FR2 with reduced sample number
p. 4028
A.7.7.11.2.1
Test Purpose and Environment
p. 4028
A.7.7.11.2.2
Test parameters
p. 4028
A.7.7.11.2.3
Test Requirements
p. 4030
A.7.7.12
UE Rx-Tx time difference measurements
p. 4031
A.7.7.12.1
UE Rx-Tx time difference measurement accuracy for single positioning frequency layer in FR2 SA
p. 4031
A.7.7.12.1.1
Test purpose and environment
p. 4031
A.7.7.12.1.2
Test parameters
p. 4031
A.7.7.12.1.3
Test requirements
p. 4034
A.7.7.12.2
UE Rx-Tx time difference measurement accuracy with reduced number of samples in FR2 SA
p. 4035
A.7.7.12.2.1
Test purpose and environment
p. 4035
A.7.7.12.2.2
Test parameters
p. 4035
A.7.7.12.2.3
Test requirements
p. 4038
A.7.7.12.3
UE Rx-Tx time difference measurement accuracy with RxTx TEG
p. 4038
A.7.7.12.3.1
Test purpose and environment
p. 4038
A.7.7.12.3.2
Test parameters
p. 4039
A.7.7.12.3.3
Test requirements
p. 4042
A.7.7.13
PRS-RSRPP measurements
p. 4042
A.7.7.13.1
SA measurement accuracy with PRS in FR2
p. 4042
A.7.7.13.1.1
Test Purpose and Environment
p. 4042
A.7.7.13.1.2
Test parameters
p. 4043
A.7.7.13.1.3
Test Requirements
p. 4045
A.7.7.13.2
SA measurement accuracy with reduced PRS samples in FR2
p. 4045
A.7.7.13.2.1
Test Purpose and Environment
p. 4045
A.7.7.13.2.2
Test parameters
p. 4046
A.7.7.13.2.3
Test Requirements
p. 4048
A.7.7.14
L1-RSRP measurement for group-based beam reporting
p. 4049
A.7.7.14.1
SSB based L1-RSRP measurement
p. 4049
A.7.7.14.1.1
Test Purpose and Environment
p. 4049
A.7.7.14.1.2
Test parameters
p. 4049
A.7.7.14.1.3
Test Requirements
p. 4051
A.7.7.14.2
CSI-RS based L1-RSRP measurement on resource set with repetition off
p. 4052
A.7.7.14.2.1
Test Purpose and Environment
p. 4052
A.7.7.14.2.2
Test parameters
p. 4052
A.7.7.14.2.3
Test Requirements
p. 4054
A.7.7.15
LTM L1-RSRP measurement
p. 4055
A.7.7.15.1
SSB based inter-frequency L1-RSRP measurement
p. 4055
A.7.7.15.1.1
Test Purpose and Environment
p. 4055
A.7.7.15.1.2
Test parameters
p. 4055
A.7.7.15.1.3
Test Requirements
p. 4057
A.7.8
Measurement procedure in RRC_INACTIVE
p. 4058
A.7.8.1
RSTD measurements
p. 4058
A.7.8.1.1
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR2 SA in RRC_INACTIVE state
p. 4058
A.7.8.1.1.1
Test Purpose and Environment
p. 4058
A.7.8.1.1.2
Test Requirements
p. 4061
A.7.8.1.2
NR RSTD measurement reporting delay test case with reduced number of samples in RRC_INACTIVE, FR1 SA
p. 4062
A.7.8.1.2.1
Test Purpose and Environment
p. 4062
A.7.8.1.2.2
Test Requirements
p. 4067
A.7.8.2
PRS-RSRP measurements
p. 4068
A.7.8.2.1
PRS-RSRP reporting delay test case for single positioning frequency layer in RRC_INACTIVE
p. 4068
A.7.8.2.1.1
Test Purpose and Environment
p. 4068
A.7.8.2.1.2
Test Requirements
p. 4072
A.7.8.2.2
PRS-RSRP reporting delay test case with reduced number of samples in RRC_INACTIVE
p. 4072
A.7.8.2.2.1
Test purpose and Environment
p. 4072
A.7.8.2.2.2
Test Requirements
p. 4076
A.7.8.3
UE Rx-Tx time difference measurements
p. 4076
A.7.8.3.1
UE Rx-Tx time difference measurements for single positioning frequency layer in FR2 SA
p. 4076
A.7.8.3.1.1
Test purpose and environment
p. 4076
A.7.8.3.1.2
Test requirements
p. 4080
A.7.8.3.2
UE Rx-Tx time difference measurement with reduced number of samples in RRC_INACTIVE, FR2 SA
p. 4080
A.7.8.3.2.1
Test purpose and environment
p. 4080
A.7.8.3.2.2
Test requirements
p. 4082
A.7.8.4
PRS-RSRPP measurements
p. 4083
A.7.8.4.1
PRS-RSRPP reporting delay test case for single positioning frequency layer in FR2 in RRC_INACTIVE state
p. 4083
A.7.8.4.1.1
Test Purpose and Environment
p. 4083
A.7.8.4.1.2
Test Requirements
p. 4085
A.7.8.4.2
PRS-RSRPP reporting delay test with reduced number of samples for single positioning frequency layer in FR2 in RRC_INACTIVE state
p. 4086
A.7.8.4.2.1
Test Purpose and Environment
p. 4086
A.7.8.4.2.2
Test Requirements
p. 4088
A.7.9
Measurement performance requirements in RRC_INACTIVE
p. 4089
A.7.9.1
RSTD measurements
p. 4089
A.7.9.1.1
RSTD measurement accuracy test case for single positioning frequency layer in FR2 in RRC_INACTIVE state
p. 4089
A.7.9.1.1.1
Test purpose and Environment
p. 4089
A.7.9.1.1.2
Test Requirements
p. 4091
A.7.9.1.2
RSTD measurement accuracy test case with reduced number of samples for single positioning frequency layer in FR2 in RRC_INACTIVE state
p. 4091
A.7.9.1.2.1
Test purpose and Environment
p. 4091
A.7.9.1.2.2
Test Requirements
p. 4093
A.7.9.2
PRS-RSRP measurements
p. 4093
A.7.9.2.1
SA measurement accuracy with PRS in FR2 in RRC_INACTIVE
p. 4093
A.7.9.2.1.1
Test Purpose and Environment
p. 4093
A.7.9.2.1.2
Test parameters
p. 4093
A.7.9.2.1.3
Test Requirements
p. 4095
A.7.9.2.2
PRS-RSRP measurements with reduced number of sample in RRC_INACTIVE
p. 4096
A.7.9.2.2.1
Test Purpose and Environment
p. 4096
A.7.9.2.2.2
Test parameters
p. 4096
A.7.9.2.2.3
Test Requirements
p. 4098
A.7.9.3
UE Rx-Tx time difference measurements
p. 4099
A.7.9.3.1
UE Rx-Tx time difference measurements in RRC_INACTIVE
p. 4099
A.7.9.3.1.1
Test purpose and environment
p. 4099
A.7.9.3.1.2
Test parameters
p. 4099
A.7.9.3.1.3
Test requirements
p. 4102
A.7.9.3.2
UE Rx-Tx time difference measurement accuracy with reduced number of samples in FR2 SA
p. 4102
A.7.9.3.2.1
Test purpose and environment
p. 4102
A.7.9.3.2.2
Test parameters
p. 4102
A.7.9.3.2.3
Test requirements
p. 4105
A.7.9.4
PRS-RSRPP measurements
p. 4105
A.7.9.4.1
SA measurement accuracy in FR2 in RRC INACTIVE
p. 4105
A.7.9.4.1.1
Test Purpose and Environment
p. 4105
A.7.9.4.1.2
Test parameters
p. 4105
A.7.9.4.1.3
Test Requirements
p. 4107
A.7.9.4.2
SA measurement accuracy with reduced PRS samples in FR2 in RRC INACTIVE
p. 4108
A.7.9.4.2.1
Test Purpose and Environment
p. 4108
A.7.9.4.2.2
Test parameters
p. 4108
A.7.9.4.2.3
Test Requirements
p. 4110