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Content for
TS 38.133
Word version: 18.6.0
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12…
A…
A.4…
A.5…
A.6…
A.7…
A.8…
A.9…
A.10…
A.11…
A.12…
A.13…
A.14…
A.15…
A.16…
A.17…
A.18…
B…
A.4
EN-DC tests with all NR cells in FR1
A.4.3
RRC_CONNECTED state mobility
A.4.4
Timing
A.4.5
Signaling characteristics
A.4.6
Measurement procedure
A.4.7
Measurement Performance requirements
A.4A
NE-DC test with all NR cells in FR1
...
A.4
EN-DC tests with all NR cells in FR1
p. 1321
A.4.1
Void
A.4.2
Void
A.4.3
RRC_CONNECTED state mobility
p. 1321
A.4.3.1
Void
A.4.3.2
RRC Connection Mobility Control
p. 1321
A.4.3.2.1
Void
A.4.3.2.2
Random Access
p. 1321
A.4.3.2.2.1
4-step RA type contention based random access test in FR1 for PSCell in EN-DC
p. 1321
A.4.3.2.2.2
4-step RA type n on-contention based random access test in FR1 for PSCell in EN-DC
p. 1325
A.4.3.2.2.3
2-step RA type contention based random access test in FR1 for PSCell in EN-DC
p. 1329
A.4.3.2.2.4
2-step RA type n on-contention based random access test in FR1 for PSCell in EN-DC
p. 1333
A.4.3.2.3
Void
A.4.3.3
Handover with PSCell from EN-DC to EN-DC with known target PSCell in FR1
p. 1337
A.4.3.3.1
Test Purpose and Environment
p. 1337
A.4.3.3.2
Test Requirements
p. 1343
A.4.4
Timing
p. 1344
A.4.4.1
UE transmit timing
p. 1344
A.4.4.1.1
NR UE Transmit Timing Test for FR1
p. 1344
A.4.4.1.1.1
Test Purpose and environment
p. 1344
A.4.4.1.1.2
Test requirements
p. 1348
A.4.4.1.2
NR UE Transmit Timing Test for two TRPs in FR1
p. 1348
A.4.4.1.2.1
Test Purpose and environment
p. 1348
A.4.4.1.2.2
Test requirements
p. 1353
A.4.4.2
UE timer accuracy
p. 1354
A.4.4.3
Timing advance
p. 1354
A.4.4.3.1
EN-DC FR1 timing advance adjustment accuracy
p. 1354
A.4.4.3.1.1
Test Purpose and Environment
p. 1354
A.4.4.3.1.2
Test Parameters
p. 1354
A.4.4.3.1.3
Test Requirements
p. 1357
A.4.5
Signaling characteristics
p. 1357
A.4.5.1
Radio link Monitoring
p. 1357
A.4.5.1.1
Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with SSB-based RLM RS in non-DRX mode
p. 1358
A.4.5.1.1.1
Test Purpose and Environment
p. 1358
A.4.5.1.1.2
Test Requirements
p. 1362
A.4.5.1.2
Radio Link Monitoring In-sync Test for FR1 PSCell configured with SSB-based RLM RS in non-DRX mode
p. 1362
A.4.5.1.2.1
Test Purpose and Environment
p. 1362
A.4.5.1.2.2
Test Requirements
p. 1368
A.4.5.1.3
Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with SSB-based RLM RS in DRX mode
p. 1368
A.4.5.1.3.1
Test Purpose and Environment
p. 1368
A.4.5.1.3.2
Test Requirements
p. 1373
A.4.5.1.4
Radio Link Monitoring In-sync Test for FR1 PSCell configured with SSB-based RLM RS in DRX mode
p. 1373
A.4.5.1.4.1
Test Purpose and Environment
p. 1373
A.4.5.1.4.2
Test Requirements
p. 1379
A.4.5.1.5
EN-DC Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with CSI-RS-based RLM in non-DRX mode
p. 1379
A.4.5.1.5.1
Test Purpose and Environment
p. 1379
A.4.5.1.5.2
Test Requirements
p. 1384
A.4.5.1.6
EN-DC Radio Link Monitoring In-sync Test for FR1 PSCell configured with CSI-RS-based RLM in non-DRX mode
p. 1384
A.4.5.1.6.1
Test Purpose and Environment
p. 1384
A.4.5.1.6.2
Test Requirements
p. 1390
A.4.5.1.7
EN-DC Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with CSI-RS-based RLM in DRX mode
p. 1390
A.4.5.1.7.1
Test Purpose and Environment
p. 1390
A.4.5.1.7.2
Test Requirements
p. 1395
A.4.5.1.8
EN-DC Radio Link Monitoring In-sync Test for FR1 PSCell configured with CSI-RS-based RLM in DRX mode
p. 1396
A.4.5.1.8.1
Test Purpose and Environment
p. 1396
A.4.5.1.8.2
Test Requirements
p. 1401
A.4.5.1.9
Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with SSB-based RLM RS for UE fulfilling relaxed measurement criterion
p. 1401
A.4.5.1.9.1
Test Purpose and Environment
p. 1401
A.4.5.1.10
EN-DC Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with CSI-RS-based RLM in non-DRX mode when CD-SSB is outside active BWP
p. 1407
A.4.5.1.10.1
Test Purpose and Environment
p. 1407
A.4.5.1.11
Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with SSB-based RLM RS in non-DRX mode when CD-SSB is outside active BWP
p. 1407
A.4.5.1.11.1
Test Purpose and Environment
p. 1407
A.4.5.1.11.2
Test Requirements
p. 1408
A.4.5.1.12
EN-DC Radio Link Monitoring Out-of-sync Test for FR1 PSCell configured with SSB-based RLM RS in non-DRX mode for UE supporting [FG 53-3]
p. 1408
A.4.5.1.12.1
Test Purpose and Environment
p. 1408
A.4.5.1.12.2
Test Requirements
p. 1412
A.4.5.2
Interruption
p. 1412
A.4.5.2.1
E-UTRAN - NR FR1 interruptions at transitions between active and non-active during DRX in synchronous EN-DC
p. 1412
A.4.5.2.1.1
Test Purpose and Environment
p. 1412
A.4.5.2.1.2
Test Requirements
p. 1416
A.4.5.2.2
E-UTRAN - NR FR1 interruptions at transitions between active and non-active during DRX in asynchronous EN-DC
p. 1416
A.4.5.2.2.1
Test Purpose and Environment
p. 1416
A.4.5.2.2.2
Test Requirements
p. 1420
A.4.5.2.3
E-UTRAN - NR FR1 interruptions during measurements on deactivated NR SCC in synchronous EN-DC
p. 1420
A.4.5.2.3.1
Test Purpose and Environment
p. 1420
A.4.5.2.3.2
Test Requirements
p. 1425
A.4.5.2.4
E-UTRAN - NR FR1 interruptions during measurements on deactivated NR SCC in asynchronous EN-DC
p. 1426
A.4.5.2.4.1
Test Purpose and Environment
p. 1426
A.4.5.2.4.2
Test Requirements
p. 1430
A.4.5.2.5
E-UTRAN - NR FR1 interruptions during measurements on deactivated E-UTRAN SCC in synchronous EN-DC
p. 1431
A.4.5.2.5.1
Test Purpose and Environment
p. 1431
A.4.5.2.5.2
Test Requirements
p. 1435
A.4.5.2.6
E-UTRAN - NR FR1 interruptions during measurements on deactivated E-UTRAN SCC in asynchronous EN-DC
p. 1435
A.4.5.2.6.1
Test Purpose and Environment
p. 1435
A.4.5.2.6.2
Test Requirements
p. 1439
A.4.5.2.7
Void
A.4.5.2.8
E-UTRAN - NR FR1 interruptions at NR SRS carrier based switching in asynchronous EN-DC
p. 1439
A.4.5.2.8.1
Test Purpose and Environment
p. 1439
A.4.5.2.8.2
Test Requirements
p. 1442
A.4.5.2.9
E-UTRAN - NR interruptions at E-UTRA SRS carrier based switching
p. 1443
A.4.5.2.9.1
Test Purpose and Environment
p. 1443
A.4.5.2.9.2
Test Requirements
p. 1447
A.4.5.2.10
E-UTRAN - NR FR1 interruptions due to RRM and RLM/BFD measurements on deactivated NR PSCell
p. 1448
A.4.5.2.10.1
Test Purpose and Environment
p. 1448
A.4.5.2.10.2
Test Requirements
p. 1451
A.4.5.2.11
E-UTRAN - NR FR1 interruptions at NR SRS antenna port switching with 1 SRS symbol in a slot in synchronous EN-DC
p. 1451
A.4.5.2.11.1
Test Purpose and Environment
p. 1451
A.4.5.2.11.2
Test Requirements
p. 1456
A.4.5.2.12
E-UTRAN - NR FR1 interruptions at NR SRS antenna port switching in asynchronous EN-DC
p. 1457
A.4.5.2.12.1
Test Purpose and Environment
p. 1457
A.4.5.3
SCell Activation and Deactivation Delay
p. 1465
A.4.5.3.1
SCell Activation and deactivation of known SCell in FR1 for 160ms SCell measurement cycle
p. 1465
A.4.5.3.1.1
Test Purpose and Environment
p. 1465
A.4.5.3.1.2
Test Requirements
p. 1471
A.4.5.3.2
SCell Activation and deactivation of known SCell in FR1 for 640ms SCell measurement cycle
p. 1472
A.4.5.3.2.1
Test Purpose and Environment
p. 1472
A.4.5.3.2.2
Test Requirements
p. 1472
A.4.5.3.3
SCell Activation and deactivation of unknown SCell in FR1
p. 1472
A.4.5.3.3.1
Test Purpose and Environment
p. 1472
A.4.5.3.3.2
Test Requirements
p. 1473
A.4.5.3.4
SCell Activation and deactivation of multiple unknown SCells in FR1 with single activation/deactivation command
p. 1474
A.4.5.3.4.1
Test Purpose and Environment
p. 1474
A.4.5.3.4.2
Test Requirements
p. 1476
A.4.5.3.5
Direct SCell activation at SCell addition of known SCell in FR1
p. 1477
A.4.5.3.5.1
Test Purpose and Environment
p. 1477
A.4.5.3.5.2
Test Requirements
p. 1484
A.4.5.3.6
Fast SCell Activation of known SCell in FR1 for 160ms SCell measurement cycle
p. 1485
A.4.5.3.6.1
Test Purpose and Environment
p. 1485
A.4.5.3.6.2
Test Requirements
p. 1489
A.4.5.3.7
Fast SCell Activation of known SCell in FR1 for 640 ms SCell measurement cycle
p. 1490
A.4.5.3.7.1
Test Purpose and Environment
p. 1490
A.4.5.3.7.2
Test Requirements
p. 1490
A.4.5.3.8
SCell Activation and deactivation of unknown SCell in FR1 for UE capable of short measurement interval
p. 1490
A.4.5.3.8.1
Test Purpose and Environment
p. 1490
A.4.5.3.8.2
Test Requirements
p. 1491
A.4.5.3.9
SCell Activation of unknown SCell with valid L3 measurement results in FR1 for 160ms SCell measurement cycle
p. 1492
A.4.5.3.9.1
Test Purpose and Environment
p. 1492
A.4.5.3.9.2
Test Requirements
p. 1498
A.4.5.3.10
SCell Activation of multiple unknown SCells in FR1 with L3 reporting with single activation/deactivation command in non-DRX
p. 1499
A.4.5.3.10.1
Test Purpose and Environment
p. 1499
A.4.5.3.10.2
Test Requirements
p. 1503
A.4.5.3.11
TRS-based SCell Activation of SSB-less SCell in FR1 collocated inter-band
p. 1503
A.4.5.3.11.1
Test Purpose and Environment
p. 1503
A.4.5.3.11.2
Test Requirements
p. 1508
A.4.5.3.12
Inter-band SSB-less Scell activation using A-TRS
p. 1508
A.4.5.3.12.1
Test Purpose and Environment
p. 1508
A.4.5.3.12.2
Test Requirements
p. 1513
A.4.5.4
UE UL carrier RRC reconfiguration Delay
p. 1514
A.4.5.4.1
UE UL carrier RRC reconfiguration Delay
p. 1514
A.4.5.4.1.1
Test Purpose and Environment
p. 1514
A.4.5.4.1.2
Test Requirements
p. 1521
A.4.5.5
Beam Failure Detection and Link recovery procedures
p. 1521
A.4.5.5.1
EN-DC Beam Failure Detection and Link Recovery Test for FR1 PSCell configured with SSB-based BFD and LR in non-DRX mode
p. 1521
A.4.5.5.1.1
Test Purpose and Environment
p. 1521
A.4.5.5.1.2
Test Requirements
p. 1526
A.4.5.5.2
EN-DC Beam Failure Detection and Link Recovery Test for FR1 PSCell configured with SSB-based BFD and LR in DRX mode
p. 1527
A.4.5.5.2.1
Test Purpose and Environment
p. 1527
A.4.5.5.2.2
Test Requirements
p. 1532
A.4.5.5.3
EN-DC Beam Failure Detection and Link Recovery Test for FR1 PSCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 1533
A.4.5.5.3.1
Test Purpose and Environment
p. 1533
A.4.5.5.3.2
Test Requirements
p. 1538
A.4.5.5.4
EN-DC Beam Failure Detection and Link Recovery Test for FR1 PSCell configured with CSI-RS-based BFD and LR in DRX mode
p. 1539
A.4.5.5.4.1
Test Purpose and Environment
p. 1539
A.4.5.5.4.2
Test Requirements
p. 1544
A.4.5.5.5
EN-DC Beam Failure Detection and Link Recovery Test for FR1 SCell configured with CSI-RS-based BFD and SSB-based LR in non-DRX mode
p. 1545
A.4.5.5.5.1
Test Purpose and Environment
p. 1545
A.4.5.5.5.2
Test Requirements
p. 1550
A.4.5.5.6
EN-DC Beam Failure Detection and Link Recovery Test for FR1 SCell configured with CSI-RS-based BFD and SSB-based LR in DRX mode
p. 1551
A.4.5.5.6.1
Test Purpose and Environment
p. 1551
A.4.5.5.6.2
Test Requirements
p. 1557
A.4.5.5.7
EN-DC TRP specific Beam Failure Detection and Link Recovery Test for FR1 PSCell configured with SSB-based BFD and LR in non-DRX mode
p. 1558
A.4.5.5.7.1
Test Purpose and Environment
p. 1558
A.4.5.5.7.2
Test Requirements
p. 1563
A.4.5.5.8
EN-DC TRP specific Beam Failure Detection and Link Recovery Test for FR1 SCell configured with CSI-RS-based BFD and SSB-based LR in non-DRX mode
p. 1564
A.4.5.5.8.1
Test Purpose and Environment
p. 1564
A.4.5.5.8.2
Test Requirements
p. 1570
A.4.5.6
Active BWP switch
p. 1571
A.4.5.6.1
DCI-based and Timer-based Active BWP Switch
p. 1571
A.4.5.6.1.1
E-UTRAN - NR PSCell FR1 DL active BWP switch in non-DRX in synchronous EN-DC
p. 1571
A.4.5.6.1.2
E-UTRAN - NR PSCell FR1 DL active BWP switch with FR1 SCell in non-DRX in synchronous EN-DC
p. 1576
A.4.5.6.2
RRC-based Active BWP Switch
p. 1582
A.4.5.6.3
Simultaneous DCI-based and Timer-based Active BWP Switch on multiple CCs
p. 1586
A.4.5.6.3.1
Simultaneous E-UTRAN - NR PSCell FR1 DL active BWP switch in non-DRX in EN-DC on multiple CCs
p. 1586
A.4.5.6.4
Simultaneous RRC-based Active BWP Switch on multiple CCs
p. 1592
A.4.5.6.4.1
E-UTRAN - NR PSCell FR1 DL active BWP switch in non-DRX in synchronous EN-DC on multiple CCs
p. 1592
A.4.5.6.4.1.1
Test Purpose and Environment
p. 1592
A.4.5.6.4.1.2
Test Requirements
p. 1599
A.4.5.6.4.2
E-UTRAN - NR FR1 PSCell SCell dormancy switch of two FR1 SCells inside active time
p. 1599
A.4.5.6.4.2.1
Test Purpose and Environment
p. 1599
A.4.5.6.4.2.2
Test Requirements
p. 1609
A.4.5.6.5
SCell dormancy switch
p. 1610
A.4.5.6.5.1
E-UTRAN - NR FR1 PSCell SCell dormancy switch of single FR1 SCell outside active time
p. 1610
A.4.5.6.5.2
E-UTRAN - NR FR1 PSCell SCell dormancy switch of two FR1 SCells inside active time
p. 1615
A.4.5.6.5.2.1
Test Purpose and Environment
p. 1615
A.4.5.6.5.2.2
Test Requirements
p. 1621
A.4.5.7
PSCell addition and release delay
p. 1621
A.4.5.7.1
Addition and Release Delay of known NR PSCell
p. 1621
A.4.5.7.1.1
Test purpose and environment
p. 1621
A.4.5.7.1.2
Test Requirements
p. 1626
A.4.5.8
DL Interruptions at switching between two uplink carriers
p. 1627
A.4.5.8.1
Test Purpose and Environment
p. 1627
A.4.5.8.2
Test Requirements
p. 1630
A.4.5.9
UE specific CBW change
p. 1631
A.4.5.9.1
UE specific CBW change on FR1 NR PSCell with non-DRX in synchronous EN- DC
p. 1631
A.4.5.9.1.1
Test Purpose and Environment
p. 1631
A.4.5.9.1.2
Test Requirements
p. 1635
A.4.5.10
PSCell activation and deactivation delay
p. 1635
A.4.5.10.1
PSCell activation and deactivation delay
p. 1635
A.4.5.10.1.1
Test purpose and environment
p. 1635
A.4.5.10.1.2
Test Requirements
p. 1639
A.4.5.11
Conditional PSCell addition and release delay (FR1 EN-DC)
p. 1640
A.4.5.11.1
Conditional PSCell Addition and Release Delay
p. 1640
A.4.5.11.1.1
Test purpose and environment
p. 1640
A.4.5.11.1.2
Test Parameters
p. 1640
A.4.5.11.1.3
Test Requirements
p. 1644
A.4.6
Measurement procedure
p. 1644
A.4.6.1
Intra-frequency Measurements
p. 1644
A.4.6.1.1
EN-DC event triggered reporting tests without gap under non-DRX
p. 1644
A.4.6.1.1.1
Test purpose and Environment
p. 1644
A.4.6.1.1.2
Test parameters
p. 1644
A.4.6.1.1.3
Test Requirements
p. 1648
A.4.6.1.2
EN-DC event triggered reporting tests without gap under DRX
p. 1648
A.4.6.1.2.1
Test purpose and Environment
p. 1648
A.4.6.1.2.2
Test parameters
p. 1648
A.4.6.1.2.3
Test Requirements
p. 1652
A.4.6.1.3
EN-DC event triggered reporting tests with per-UE gaps under non-DRX
p. 1652
A.4.6.1.3.1
Test purpose and Environment
p. 1652
A.4.6.1.3.2
Test parameters
p. 1652
A.4.6.1.3.3
Test Requirements
p. 1656
A.4.6.1.4
EN-DC event triggered reporting tests with per-UE gaps under DRX
p. 1656
A.4.6.1.4.1
Test purpose and Environment
p. 1656
A.4.6.1.4.2
Test parameters
p. 1656
A.4.6.1.4.3
Test Requirements
p. 1660
A.4.6.1.5
EN-DC event triggered reporting tests without gap under non-DRX with SSB index reading
p. 1660
A.4.6.1.5.1
Test purpose and Environment
p. 1660
A.4.6.1.5.2
Test parameters
p. 1660
A.4.6.1.5.3
Test Requirements
p. 1662
A.4.6.1.6
EN-DC event triggered reporting tests with SSB index reading with per-UE gaps
p. 1663
A.4.6.1.6.1
Test purpose and Environment
p. 1663
A.4.6.1.6.2
Test parameters
p. 1663
A.4.6.1.6.3
Test Requirements
p. 1665
A.4.6.1.7
EN-DC event triggered reporting tests under DRX for UE configured with highSpeedMeasFlag-r16
p. 1666
A.4.6.1.7.1
Test purpose and Environment
p. 1666
A.4.6.1.7.2
Test parameters
p. 1666
A.4.6.1.7.3
Test Requirements
p. 1670
A.4.6.1.8
EN-DC event triggered reporting tests for FR1 cell without SSB time index detection when DRX is used for UE configured with highSpeedMeasCA-Scell-r17
p. 1670
A.4.6.1.8.1
Test Purpose and Environment
p. 1670
A.4.6.1.8.2
Test Requirements
p. 1675
A.4.6.1.9
EN-DC event triggered reporting tests without gap under non-DRX with NCD-SSB
p. 1676
A.4.6.1.9.1
Test purpose and Environment
p. 1676
A.4.6.1.9.2
Test parameters
p. 1676
A.4.6.1.9.3
Test Requirements
p. 1680
A.4.6.1.10
EN-DC event triggered reporting tests without gap under non-DRX when CD-SSB is outside active BWP
p. 1680
A.4.6.110.1
Test purpose and Environment
p. 1680
A.4.6.1.10.2
Test Requirements
p. 1680
A.4.6.2
Inter-frequency Measurements
p. 1680
A.4.6.2.1
EN-DC event triggered reporting tests for FR1 cell without SSB time index detection when DRX is not used
p. 1680
A.4.6.2.1.1
Test Purpose and Environment
p. 1680
A.4.6.2.1.2
Test Requirements
p. 1685
A.4.6.2.2
EN-DC event triggered reporting tests for FR1 cell without SSB time index detection when DRX is used
p. 1685
A.4.6.2.2.1
Test Purpose and Environment
p. 1685
A.4.6.2.2.2
Test Requirements
p. 1689
A.4.6.2.3
Void
A.4.6.2.4
Void
A.4.6.2.5
EN-DC event triggered reporting tests for FR1 cell with SSB time index detection when DRX is not used
p. 1689
A.4.6.2.5.1
Test Purpose and Environment
p. 1689
A.4.6.2.5.2
Test Requirements
p. 1694
A.4.6.2.6
EN-DC event triggered reporting tests for FR1 cell with SSB time index detection when DRX is used
p. 1694
A.4.6.2.6.1
Test Purpose and Environment
p. 1694
A.4.6.2.6.2
Test Requirements
p. 1699
A.4.6.2.7
Void
A.4.6.2.8
Void
A.4.6.2.9
EN-DC event triggered reporting tests for FR1 cell without SSB time index detection when DRX is used for UE configured with highSpeedMeasInterFreq-r17
p. 1700
A.4.6.2.9.1
Test Purpose and Environment
p. 1700
A.4.6.2.9.2
Test Requirements
p. 1703
A.4.6.3
Void
A.4.6.4
L1-RSRP measurement for beam reporting
p. 1703
A.4.6.4.1
SSB based L1-RSRP measurement when DRX is not used
p. 1703
A.4.6.4.1.1
Test Purpose and Environment
p. 1703
A.4.6.4.1.2
Test parameters
p. 1704
A.4.6.4.1.3
Test Requirements
p. 1707
A.4.6.4.2
SSB based L1-RSRP measurement when DRX is used
p. 1707
A.4.6.4.2.1
Test Purpose and Environment
p. 1707
A.4.6.4.2.2
Test parameters
p. 1708
A.4.6.4.2.3
Test Requirements
p. 1711
A.4.6.4.3
CSI-RS based L1-RSRP measurement when DRX is not used
p. 1711
A.4.6.4.3.1
Test Purpose and Environment
p. 1711
A.4.6.4.3.2
Test parameters
p. 1712
A.4.6.4.3.3
Test Requirements
p. 1715
A.4.6.4.4
CSI-RS based L1-RSRP measurement when DRX is used
p. 1715
A.4.6.4.4.1
Test Purpose and Environment
p. 1715
A.4.6.4.4.2
Test parameters
p. 1716
A.4.6.4.4.3
Test Requirements
p. 1718
A.4.6.4.5
SSB based L1-RSRP measurement when DRX is used for UE configured with highSpeedMeasFlag-r16
p. 1718
A.4.6.4.5.1
Test Purpose and Environment
p. 1718
A.4.6.4.5.2
Test parameters
p. 1719
A.4.6.4.5.3
Test Requirements
p. 1722
A.4.6.4.6
CSI-RS based L1-RSRP measurement when DRX is not used when CD-SSB is outside active BWP
p. 1722
A.4.6.4.6.1
Test Purpose and Environment
p. 1722
A.4.6.4.7
SSB based L1-RSRP measurement when DRX is not used when CD-SSB is outside active BWP
p. 1723
A.4.6.4.7.1
Test Purpose and Environment
p. 1723
A.4.6.4.7.2
Test Requirements
p. 1723
A.4.6.4.8
SSB based L1-RSRP measurement for UE supporting NCD-SSB based L1 measurement outside active BWP when DRX is not used
p. 1723
A.4.6.4.8.1
Test Purpose and Environment
p. 1723
A.4.6.4.8.2
Test parameters
p. 1723
A.4.6.4.8.3
Test Requirements
p. 1727
A.4.6.5
CLI measurements
p. 1727
A.4.6.5.1
SRS-RSRP measurement with non-DRX
p. 1727
A.4.6.5.1.1
Test Purpose and Environment
p. 1727
A.4.6.5.1.2
Test Parameters
p. 1728
A.4.6.5.1.3
Test Requirements
p. 1731
A.4.6.5.2
CLI-RSSI measurement with non-DRX
p. 1731
A.4.6.5.2.1
Test Purpose and Environment
p. 1731
A.4.6.5.2.2
Test Parameters
p. 1732
A.4.6.5.2.3
Test Requirements
p. 1733
A.4.6.6.1.2
Test Requirements
p. 1738
A.4.6.7
L1-SINR measurement for beam reporting
p. 1738
A.4.6.7.2
L1-SINR measurement with SSB based CMR and dedicated IMR when DRX is used
p. 1741
A.4.6.7.2.1
Test Purpose and Environment
p. 1741
A.4.6.7.2.2
Test parameters
p. 1741
A.4.6.7.2.3
Test Requirements
p. 1744
A.4.6.7.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR configured when DRX is used
p. 1744
A.4.6.7.3.1
Test Purpose and Environment
p. 1744
A.4.6.7.3.2
Test parameters
p. 1744
A.4.6.7.3.3
Test Requirements
p. 1746
A.4.6.8
CSI-RS based intra-frequency Measurement
p. 1747
A.4.6.8.1
EN-DC event triggered reporting tests without gap under DRX
p. 1747
A.4.6.8.1.1
Test purpose and Environment
p. 1747
A.4.6.8.1.2
Test Requirements
p. 1751
A.4.6.9
CSI-RS based inter-frequency Measurement
p. 1751
A.4.6.9.1
EN-DC event triggered reporting tests for FR1 cell when non-DRX is used
p. 1751
A.4.6.9.1.1
Test Purpose and Environment
p. 1751
A.4.6.9.1.2
Test Requirements
p. 1755
A.4.7
Measurement Performance requirements
p. 1718
A.4.7.1
SS-RSRP
p. 1718
A.4.7.1.1
EN-DC Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1718
A.4.7.1.1.1
Test Purpose and Environment
p. 1718
A.4.7.1.1.2
Test parameters
p. 1718
A.4.7.1.1.3
Test Requirements
p. 1722
A.4.7.1.2
EN-DC inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1722
A.4.7.1.2.1
Test Purpose and Environment
p. 1722
A.4.7.1.2.2
Test parameters
p. 1723
A.4.7.1.2.3
Test Requirements
p. 1727
A.4.7.1.3
Void
A.4.7.2
SS-RSRQ
p. 1728
A.4.7.2.1
EN-DC Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1728
A.4.7.2.1.1
Test Purpose and Environment
p. 1728
A.4.7.2.1.2
Test Parameters
p. 1728
A.4.7.2.1.3
Test Requirements
p. 1733
A.4.7.2.2
EN-DC Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1733
A.4.7.2.2.1
Test Purpose and Environment
p. 1733
A.4.7.2.2.2
Test Parameters
p. 1733
A.4.7.2.2.3
Test Requirements
p. 1739
A.4.7.3
SS-SINR
p. 1739
A.4.7.3.1
EN-DC Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1739
A.4.7.3.1.1
Test Purpose and Environment
p. 1739
A.4.7.3.1.2
Test Parameters
p. 1739
A.4.7.3.1.3
Test Requirements
p. 1743
A.4.7.3.2
EN-DC Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1744
A.4.7.3.2.1
Test Purpose and Environment
p. 1744
A.4.7.3.2.2
Test Parameters
p. 1744
A.4.7.3.2.3
Test Requirements
p. 1748
A.4.7.4
L1-RSRP measurement for beam reporting
p. 1749
A.4.7.4.1
SSB based L1-RSRP measurement
p. 1749
A.4.7.4.1.1
Test Purpose and Environment
p. 1749
A.4.7.4.1.2
Test parameters
p. 1749
A.4.7.4.1.3
Test Requirements
p. 1752
A.4.7.4.2
CSI-RS based L1-RSRP measurement on resource set with repetition off
p. 1752
A.4.7.4.2.1
Test Purpose and Environment
p. 1752
A.4.7.4.2.2
Test parameters
p. 1753
A.4.7.4.2.3
Test Requirements
p. 1756
A.4.7.5
SFTD accuracy
p. 1757
A.4.7.5.1
SFTD accuracy
p. 1757
A.4.7.5.1.1
Test Purpose and Environment
p. 1757
A.4.7.5.1.2
Test Parameters
p. 1757
A.4.7.5.1.3
Test Requirements
p. 1761
A.4.7.5.2
Void
A.4.7.5.3
Void
A.4.7.6
CLI measurements
p. 1761
A.4.7.6.1
EN-DC SRS-RSRP measurement accuracy with FR1 serving cell
p. 1761
A.4.7.6.1.1
Test Purpose and Environment
p. 1761
A.4.7.6.1.2
Test parameters
p. 1762
A.4.7.6.1.3
Test Requirements
p. 1767
A.4.7.6.2
EN-DC CLI-RSSI measurement accuracy with FR1 serving cell
p. 1767
A.4.7.6.2.1
Test Purpose and Environment
p. 1767
A.4.7.6.2.2
Test parameters
p. 1768
A.4.7.6.2.3
Test Requirements
p. 1771
A.4.7.7
L1-SINR measurement for beam reporting
p. 1771
A.4.7.7.2
L1-SINR measurement with SSB based CMR and dedicated IMR
p. 1775
A.4.7.7.2.1
Test Purpose and Environment
p. 1775
A.4.7.7.2.2
Test parameters
p. 1775
A.4.7.7.2.3
Test Requirements
p. 1779
A.4.7.7.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR
p. 1779
A.4.7.7.3.1
Test Purpose and Environment
p. 1779
A.4.7.7.3.2
Test parameters
p. 1779
A.4.7.7.3.3
Test Requirements
p. 1782
A.4.7.8
CSI-RSRP
p. 1783
A.4.7.8.1
EN-DC Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1783
A.4.7.8.1.1
Test Purpose and Environment
p. 1783
A.4.7.8.1.2
Test parameters
p. 1783
A.4.7.8.1.3
Test Requirements
p. 1788
A.4.7.8.2
EN-DC inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1788
A.4.7.8.2.1
Test Purpose and Environment
p. 1788
A.4.7.8.2.2
Test parameters
p. 1788
A.4.7.8.2.3
Test Requirements
p. 1793
A.4.7.9
CSI-RSRQ
p. 1793
A.4.7.9.1
EN-DC Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1793
A.4.7.9.1.1
Test Purpose and Environment
p. 1793
A.4.7.9.1.2
Test Parameters
p. 1793
A.4.7.9.1.3
Test Requirements
p. 1799
A.4.7.9.2
EN-DC Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1799
A.4.7.9.2.1
Test Purpose and Environment
p. 1799
A.4.7.9.2.2
Test Parameters
p. 1799
A.4.7.9.2.3
Test Requirements
p. 1804
A.4.7.10
CSI-SINR
p. 1805
A.4.7.10.1
EN-DC Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1805
A.4.7.10.1.1
Test Purpose and Environment
p. 1805
A.4.7.10.1.2
Test Parameters
p. 1805
A.4.7.10.1.3
Test Requirements
p. 1809
A.4.7.10.2
EN-DC Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 1810
A.4.7.10.2.1
Test Purpose and Environment
p. 1810
A.4.7.10.2.2
Test Parameters
p. 1810
A.4.7.10.2.3
Test Requirements
p. 1815
A.4.7.11
TDCP amplitude measurement accuracy
p. 1815
A.4.7.11.1
TDCP amplitude measurement accuracy in EN-DC
p. 1815
A.4.7.11.1.1
Test Purpose and Environment
p. 1815
A.4.7.11.1.2
Test parameters
p. 1815
A.4.7.11.1.3
Test Requirements
p. 1818
A.4.8
Void
A.4A
NE-DC test with all NR cells in FR1
p. 1818
A.4A.1
Signaling characteristics
p. 1818
A.4A.1.1
E-UTRAN PSCell addition
p. 1818
A.4A.1.1.1
Test purpose and environment
p. 1818
A.4A.1.1.2
Test Requirements
p. 1823
A.4A.1.2
Active BWP switch
p. 1824
A.4A.1.2.1
E-UTRAN PSCell - NR PCell FR1 DCI-based and Timer-based DL active BWP switch in non-DRX in synchronous NE-DC
p. 1824
A.4A.1.2.1.1
Test Purpose and Environment
p. 1824
A.4A.1.2.1.2
Test Requirements
p. 1828
A.4A.1.3
Intra-frequency handover with E-UTRAN PSCell
p. 1829
A.4A.1.3.1
Test purpose and environment
p. 1829
A.4A.1.3.2
Test Requirements
p. 1833
A.4A.1.4
Handover with PSCell from NE-DC to NE-DC with unknown target PSCell
p. 1834
A.4A.1.4.1
Test Purpose and Environment
p. 1834
A.4A.1.4.2
Test Parameters
p. 1834
A.4A.1.4.3
Test Requirements
p. 1839
A.4A.1.4.3.1
Test Requirements for NR HO
p. 1839
A.4A.1.4.3.2
Test Requirements for LTE PSCell Change
p. 1839
A.4A.2
Measurement performance
p. 1840
A.4A.2.1
SFTD accuracy
p. 1840
A.4A.2.1.1
SFTD accuracy
p. 1840
A.4A.2.1.1.1
Test Purpose
p. 1840
A.4A.2.1.1.2
Test Environment
p. 1840
A.4A.2.1.1.3
Test Requirements
p. 1844