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Content for
TS 38.133
Word version: 18.6.0
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A.6…
A.7…
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A.5
EN-DC tests with one or more NR cells in FR2
A.5.3
RRC_CONNECTED state mobility
A.5.4
Timing
A.5.5
Signaling characteristics
A.5.6
Measurement procedure
A.5.7
Measurement Performance requirements
...
A.5
EN-DC tests with one or more NR cells in FR2
p. 1844
A.5.1
Void
A.5.2
Void
A.5.3
RRC_CONNECTED state mobility
p. 1844
A.5.3.1
Void
A.5.3.2
RRC Connection Mobility Control
p. 1844
A.5.3.2.1
Void
A.5.3.2.2
Random Access
p. 1844
A.5.3.2.2.1
4-step RA type c ontention based random access test in FR2 for PSCell/SCell in EN-DC
p. 1844
A.5.3.2.2.2
4-step RA type non-contention based random access test in FR2 for PSCell/SCell in EN-DC
p. 1848
A.5.3.2.2.3
2-step RA type contention based random access test in FR2 for PSCell/SCell in EN-DC
p. 1854
A.5.3.2.2.4
2-step RA type non-contention based random access test in FR2 for PSCell/SCell in EN-DC
p. 1857
A.5.3.2.3
Void
A.5.3.3
Handover with PSCell with known FR2 target PSCell
p. 1861
A.5.3.3.1
Test purpose and environment
p. 1861
A.5.3.3.2
Test Requirements
p. 1866
A.5.3.3.3
Void
A.5.3.3.4
Void
A.5.3.3.5
Void
A.5.3.3.6
Void
A.5.4
Timing
p. 1867
A.5.4.1
UE transmit timing
p. 1867
A.5.4.1.1
NR UE Transmit Timing Test for FR2
p. 1867
A.5.4.1.1.1
Test Purpose and environment
p. 1867
A.5.4.1.1.2
Test requirements
p. 1870
A.5.4.1.2
NR UE Transmit Timing Test with 2-TA for FR2 UE supporting multiDCI-IntraCellMultiTRP-TwoTA-r18
p. 1871
A.5.4.1.2.1
Test Purpose and environment
p. 1871
A.5.4.1.2.2
Test requirements
p. 1875
A.5.4.2
UE timer accuracy
p. 1876
A.5.4.3
Timing advance
p. 1876
A.5.4.3.1
EN-DC FR2 timing advance adjustment accuracy
p. 1876
A.5.4.3.1.1
Test Purpose and Environment
p. 1876
A.5.4.3.1.2
Test Parameters
p. 1876
A.5.4.3.1.3
Test Requirements
p. 1880
A.5.5
Signaling characteristics
p. 1880
A.5.5.1
Radio link Monitoring
p. 1880
A.5.5.1.1
Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with SSB-based RLM RS in non-DRX mode
p. 1880
A.5.5.1.1.1
Test Purpose and Environment
p. 1880
A.5.5.1.1.2
Test Requirements
p. 1884
A.5.5.1.2
Radio Link Monitoring In-sync Test for FR2 PSCell configured with SSB-based RLM RS in non-DRX mode
p. 1885
A.5.5.1.2.1
Test Purpose and Environment
p. 1885
A.5.5.1.2.2
Test Requirements
p. 1888
A.5.5.1.3
Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with SSB-based RLM RS in DRX mode
p. 1889
A.5.5.1.3.1
Test Purpose and Environment
p. 1889
A.5.5.1.3.2
Test Requirements
p. 1893
A.5.5.1.4
Radio Link Monitoring In-sync Test for FR2 PSCell configured with SSB-based RLM RS in DRX mode
p. 1893
A.5.5.1.4.1
Test Purpose and Environment
p. 1893
A.5.5.1.4.2
Test Requirements
p. 1897
A.5.5.1.5
EN-DC Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with CSI-RS-based RLM in non-DRX mode
p. 1897
A.5.5.1.6
EN-DC Radio Link Monitoring In-sync Test for FR2 PSCell configured with CSI-RS-based RLM in non-DRX mode
p. 1901
A.5.5.1.7
EN-DC Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with CSI-RS-based RLM in DRX mode
p. 1905
A.5.5.1.8
EN-DC Radio Link Monitoring In-sync Test for FR2 PSCell configured with CSI-RS-based RLM in DRX mode
p. 1910
A.5.5.1.8.2
Test Requirements
p. 1914
A.5.5.1.9
EN-DC Radio Link Monitoring UE Scheduling Restrictions on FR2
p. 1915
A.5.5.1.9.1
Test Purpose and Environment
p. 1915
A.5.5.1.9.2
Test Requirements
p. 1917
A.5.5.1.10
Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with SSB-based RLM RS for UE fulfilling relaxed measurement criterion
p. 1917
A.5.5.1.10.1
Test Purpose and Environment
p. 1917
A.5.5.1.10.2
Test Requirements
p. 1920
A.5.5.1.11
Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with SSB-based RLM RS in non-DRX mode for UE supporting fast beam sweeping in multi-Rx
p. 1920
A.5.5.1.11.1
Test Purpose and Environment
p. 1920
A.5.5.1.11.2
Test Requirements
p. 1925
A.5.5.1.12
EN-DC Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with CSI-RS-based RLM in non-DRX mode when CD-SSB is outside active BWP
p. 1926
A.5.5.1.12.1
Test Purpose and Environment
p. 1926
A.5.5.1.13
Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with SSB-based RLM RS in non-DRX mode when CD-SSB is outside active BWP
p. 1926
A.5.5.1.13.1
Test Purpose and Environment
p. 1926
A.5.5.1.13.2
Test Requirements
p. 1926
A.5.5.1.14
EN-DC Radio Link Monitoring Out-of-sync Test for FR2 PSCell configured with SSB-based RLM RS in non-DRX mode for UE supporting [FG 53-3]
p. 1927
A.5.5.1.14.1
Test Purpose and Environment
p. 1927
A.5.5.1.14.2
Test Requirements
p. 1931
A.5.5.2
Interruption
p. 1931
A.5.5.2.1
E-UTRAN - NR FR2 interruptions at transitions between active and non-active during DRX in synchronous EN-DC
p. 1931
A.5.5.2.1.1
Test Purpose and Environment
p. 1931
A.5.5.2.1.2
Test Requirements
p. 1934
A.5.5.2.2
E-UTRAN - NR FR2 interruptions at transitions between active and non-active during DRX in asynchronous EN-DC
p. 1934
A.5.5.2.2.1
Test Purpose and Environment
p. 1934
A.5.5.2.2.2
Test Requirements
p. 1937
A.5.5.2.3
E-UTRAN - NR FR2 interruptions during measurements on deactivated NR SCC in synchronous EN-DC
p. 1937
A.5.5.2.3.1
Test Purpose and Environment
p. 1937
A.5.5.2.3.2
Test Requirements
p. 1941
A.5.5.2.4
E-UTRAN - NR FR2 interruptions during measurements on deactivated NR SCC in asynchronous EN-DC
p. 1941
A.5.5.2.4.1
Test Purpose and Environment
p. 1941
A.5.5.2.4.2
Test Requirements
p. 1944
A.5.5.2.5
E-UTRAN - NR FR2 interruptions during measurements on deactivated E-UTRAN SCC in synchronous EN-DC
p. 1945
A.5.5.2.5.1
Test Purpose and Environment
p. 1945
A.5.5.2.5.2
Test Requirements
p. 1948
A.5.5.2.6
E-UTRAN - NR FR2 interruptions during measurements on deactivated E-UTRAN SCC in asynchronous EN-DC
p. 1948
A.5.5.2.6.1
Test Purpose and Environment
p. 1948
A.5.5.2.6.2
Test Requirements
p. 1951
A.5.5.2.7
E-UTRAN - NR FR2 interruptions at E-UTRA SRS carrier based switching
p. 1951
A.5.5.2.7.1
Test Purpose and Environment
p. 1951
A.5.5.2.7.2
Test Requirements
p. 1955
A.5.5.2.8
E-UTRAN - NR FR2 interruptions at NR SRS carrier based switching
p. 1955
A.5.5.2.8.1
Test Purpose and Environment
p. 1955
A.5.5.2.8.3
Test Requirements
p. 1957
A.5.5.2.9
E-UTRAN - NR FR2 interruptions during measurements on deactivated NR PSCell
p. 1957
A.5.5.2.9.1
Test Purpose and Environment
p. 1957
A.5.5.2.9.2
Test Requirements
p. 1962
A.5.5.3
SCell Activation and Deactivation Delay
p. 1962
A.5.5.3.1
SCell Activation and deactivation of SCell in FR2 intra-band
p. 1962
A.5.5.3.1.1
Test Purpose and Environment
p. 1962
A.5.5.3.1.2
Test Requirements
p. 1964
A.5.5.3.2
SCell Activation and deactivation of known SCell in FR1 for 160ms SCell measurement cycle
p. 1964
A.5.5.3.2.1
Test Purpose and Environment
p. 1964
A.5.5.3.2.2
Test Requirements
p. 1968
A.5.5.3.3
Void
A.5.5.3.4
Void
A.5.5.3.5
SCell Activation and deactivation of SCell in FR2
p. 1968
A.5.5.3.5.1
Test Purpose and Environment
p. 1968
A.5.5.3.5.2
Test Requirements
p. 1971
A.5.5.3.6
Multiple SCell Activation and deactivation of one unknown SCell and one known SCell in FR2
p. 1972
A.5.5.3.6.1
Test Purpose and Environment
p. 1972
A.5.5.3.6.2
Test Requirements
p. 1976
A.5.5.3.7
Direct SCell activation at SCell addition of known SCell in FR2
p. 1977
A.5.5.3.7.1
Test Purpose and Environment
p. 1977
A.5.5.3.7.2
Test Requirements
p. 1980
A.5.5.3.8
Fast SCell Activation of SCell in FR2 intra-band
p. 1980
A.5.5.3.8.1
Test Purpose and Environment
p. 1980
A.5.5.3.8.2
Test Requirements
p. 1984
A.5.5.3.9
PUCCH SCell Activation and deactivation of known SCell in FR2
p. 1985
A.5.5.3.9.1
Test Purpose and Environment
p. 1985
A.5.5.3.9.2
Test Requirements
p. 1989
A.5.5.3.10
PUCCH SCell Activation and deactivation of unknown SCell in FR2
p. 1990
A.5.5.3.10.1
Test Purpose and Environment
p. 1990
A.5.5.3.10.2
Test Requirements
p. 1993
A.5.5.3.11
Multiple SCell activation and deactivation of one known PUCCH SCell and one unknown SCell in FR2
p. 1994
A.5.5.3.11.1
Test Purpose and Environment
p. 1994
A.5.5.3.11.2
Test Requirements
p. 1998
A.5.5.3.12
SCell Activation and deactivation of unknown PUCCH SCell and unknown DL SCell in FR2 in non-DRX
p. 1999
A.5.5.3.12.1
Test Purpose and Environment
p. 1999
A.5.5.3.12.2
Test Requirements
p. 2002
A.5.5.3.13
SCell Activation and deactivation of unknown SCell in FR2 for UE in DRX, capable of small beam sweeping factors and/or short measurement interval
p. 2003
A.5.5.3.13.1
Test Purpose and Environment
p. 2003
A.5.5.3.13.2
Test Requirements
p. 2008
A.5.5.3.14
PUCCH SCell activation and deactivation with FR1 PSCell based on L3 reporting after SCell activation command
p. 2010
A.5.5.3.14.1
Test Purpose and Environment
p. 2010
A.5.5.3.14.2
Test Requirements
p. 2016
A.5.5.3.15
SCell Activation of unknown SCell in FR2 in non-DRX for 160ms SCell measurement cycle with the L3 reporting during activation
p. 2017
A.5.5.3.15.1
Test Purpose and Environment
p. 2017
A.5.5.3.15.2
Test Requirements
p. 2021
A.5.5.4
Void
A.5.5.5
Beam Failure Detection and Link recovery procedures
p. 2022
A.5.5.5.1
EN-DC Beam Failure Detection and Link Recovery Test for FR2 PSCell configured with SSB-based BFD and LR in non-DRX mode
p. 2022
A.5.5.5.1.1
Test Purpose and Environment
p. 2022
A.5.5.5.1.2
Test Requirements
p. 2026
A.5.5.5.2
EN-DC Beam Failure Detection and Link Recovery Test for FR2 PSCell configured with SSB-based BFD and LR in DRX mode
p. 2027
A.5.5.5.2.1
Test Purpose and Environment
p. 2027
A.5.5.5.2.2
Test Requirements
p. 2031
A.5.5.5.3
EN-DC Beam Failure Detection and Link Recovery Test for FR2 PSCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 2032
A.5.5.5.3.1
Test Purpose and Environment
p. 2032
A.5.5.5.3.2
Test Requirements
p. 2036
A.5.5.5.4
EN-DC Beam Failure Detection and Link Recovery Test for FR2 PSCell configured with CSI-RS-based BFD and LR in DRX mode
p. 2037
A.5.5.5.4.1
Test Purpose and Environment
p. 2037
A.5.5.5.4.2
Test Requirements
p. 2041
A.5.5.5.5
EN-DC scheduling availability restriction during Beam Failure Detection and Link Recovery for FR2 PSCell configured with SSB-based BFD and LR in non-DRX mode
p. 2042
A.5.5.5.5.1
Test Purpose and Environment
p. 2042
A.5.5.5.5.2
Test Requirements
p. 2046
A.5.5.5.6
EN-DC Beam Failure Detection and Link Recovery Test for FR2 SCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 2047
A.5.5.5.6.1
Test Purpose and Environment
p. 2047
A.5.5.5.6.2
Test Requirements
p. 2051
A.5.5.5.7
EN-DC Beam Failure Detection and Link Recovery Test for FR2 SCell configured with CSI-RS-based BFD and LR in DRX mode
p. 2052
A.5.5.5.7.1
Test Purpose and Environment
p. 2052
A.5.5.5.7.2
Test Requirements
p. 2056
A.5.5.5.8
EN-DC TRP specific Beam Failure Detection and Link Recovery Test for FR2 PSCell configured with CSI-RS-based BFD and LR in DRX mode
p. 2057
A.5.5.5.8.1
Test Purpose and Environment
p. 2057
A.5.5.5.8.2
Test Requirements
p. 2062
A.5.5.5.9
Beam Failure Detection and Link Recovery Test for FR2 PSCell configured with SSB-based BFD and LR in DRX mode for UE fulfilling relaxed measurement criterion
p. 2062
A.5.5.5.9.1
Test Purpose and Environment
p. 2062
A.5.5.5.9.2
Test Requirements
p. 2066
A.5.5.6
Active BWP switch
p. 2066
A.5.5.6.1
DCI-based and Timer-based Active BWP Switch
p. 2066
A.5.5.6.1.1
E-UTRAN - NR PSCell FR2 DL active BWP switch with non-DRX in synchronous EN-DC
p. 2066
A.5.5.6.1.1.1
Test Purpose and Environment
p. 2066
A.5.5.6.1.1.2
Test Requirements
p. 2070
A.5.5.6.1.2
E-UTRAN - NR PSCell FR2 with FR2 SCell DL active BWP switch in non-DRX in synchronous EN-DC
p. 2070
A.5.5.6.2
RRC-based Active BWP Switch
p. 2075
A.5.5.6.2.1
E-UTRAN - NR PSCell FR2 DL active BWP switch with non-DRX in synchronous EN-DC
p. 2075
A.5.5.6.3
Simultaneous DCI-based and Timer-based Active BWP Switch on multiple CCs
p. 2079
A.5.5.6.3.1
E-UTRAN - NR PSCell FR2 and NR SCell FR2 DL active BWP switch on multiple CCs in synchronous EN-DC
p. 2079
A.5.5.6.4
SCell dormancy switch
p. 2083
A.5.5.6.4.1
E-UTRAN - NR FR2 PSCell SCell dormancy switch of single FR2 SCell inside active time
p. 2083
A.5.5.6.4.1.1
Test Purpose and Environment
p. 2083
A.5.5.6.4.1.2
Test Requirements
p. 2087
A.5.5.6.4.2
E-UTRAN - NR FR1 PSCell SCell dormancy switch of two FR2 SCells outside active time
p. 2087
A.5.5.6.4.2.1
Test Purpose and Environment
p. 2087
A.5.5.6.4.2.2
Test Requirements
p. 2094
A.5.5.6.5
Simultaneous RRC-based Active BWP Switch on multiple CCs
p. 2094
A.5.5.6.5.1
E-UTRAN - NR PSCell FR2 and NR SCell FR2 DL active BWP switch on multiple CCs with non-DRX in synchronous EN-DC
p. 2094
A.5.5.7
PSCell addition and release delay
p. 2097
A.5.5.7.1
Addition and Release Delay of NR PSCell
p. 2097
A.5.5.7.1.1
Test purpose and environment
p. 2097
A.5.5.7.1.2
Test Requirements
p. 2100
A.5.5.8
Active TCI state switch delay
p. 2101
A.5.5.8.1
MAC-CE based active TCI state switch
p. 2101
A.5.5.8.1.1
E-UTRAN - NR PSCell FR2 active TCI state switch for a known TCI state
p. 2101
A.5.5.8.1.1.1
Test Purpose and Environment
p. 2101
A.5.5.8.1.1.2
Test Requirements
p. 2105
A.5.5.8.2
RRC based active TCI state switch
p. 2105
A.5.5.8.2.1
E-UTRAN - NR PSCell FR2 active TCI state switch for a known TCI state
p. 2105
A.5.5.8.2.1.1
Test Purpose and Environment
p. 2105
A.5.5.8.2.1.2
Test Requirements
p. 2109
A.5.5.9
Uplink spatial relation switch delay
p. 2109
A.5.5.9.1
MAC-CE based uplink spatial relation switch
p. 2109
A.5.5.9.1.1
E-UTRAN - NR PSCell FR2 uplink spatial relation switch for a known spatial relation
p. 2109
A.5.5.9.1.1.1
Test Purpose and Environment
p. 2109
A.5.5.9.1.1.2
Test Requirements
p. 2112
A.5.5.9.2
RRC based spatial relation switch
p. 2112
A.5.5.9.2.1
E-UTRAN - NR PSCell FR2 spatial relation switch associated with a known DL-RS
p. 2112
A.5.5.9.2.1.1
Test Purpose and Environment
p. 2112
A.5.5.9.2.1.2
Test Requirements
p. 2115
A.5.5.10
UE specific CBW change
p. 2115
A.5.5.10.1
UE specific CBW change on FR2 NR PSCell
p. 2115
A.5.5.10.1.1
Test Purpose and Environment
p. 2115
A.5.5.10.1.2
Test Requirements
p. 2118
A.5.5.11
Unified TCI state switch delay
p. 2119
A.5.5.11.1
MAC-CE based active joint TCI state switch
p. 2119
A.5.5.11.1.1
E-UTRAN - NR PSCell FR2 active joint TCI state switch for a known TCI state
p. 2119
A.5.5.11.1.1.1
Test Purpose and Environment
p. 2119
A.5.5.11.1.1.2
Test parameters
p. 2119
A.5.5.11.1.1.3
Test Requirements
p. 2122
A.5.5.11.2
MAC-CE based active uplink TCI state switch
p. 2122
A.5.5.11.2.1
E-UTRAN - NR PSCell FR2 active uplink TCI state switch for a known TCI state
p. 2122
A.5.5.11.2.1.1
Test Purpose and Environment
p. 2122
A.5.5.11.2.1.2
Test parameters
p. 2123
A.5.5.11.2.1.3
Test Requirements
p. 2125
A.5.5.11.3
MAC-CE based active downlink TCI state switch
p. 2125
A.5.5.11.3.1
E-UTRAN - NR PSCell FR2 downlink TCI state switch to cell with additional PCI for a known TCI state
p. 2125
A.5.5.11.3.1.1
Test Purpose and Environment
p. 2125
A.5.5.11.3.1.2
Test Parameters
p. 2126
A.5.5.11.3.1.3
Test Requirements
p. 2130
A.5.5.12
PSCell activation and deactivation delay
p. 2130
A.5.5.12.1
PSCell activation and deactivation delay
p. 2130
A.5.5.12.1.1
Test purpose and environment
p. 2130
A.5.5.12.1.2
Test Requirements
p. 2133
A.5.5.13
Conditional PSCell addition and release delay
p. 2133
A.5.5.13.1
Addition and Release Delay of NR PSCell
p. 2133
A.5.5.13.1.1
Test purpose and environment
p. 2133
A.5.5.13.1.2
Test Requirements
p. 2136
A.5.6
Measurement procedure
p. 2137
A.5.6.1
Intra-frequency Measurements
p. 2137
A.5.6.1.1
EN-DC event triggered reporting test without gap under non-DRX
p. 2137
A.5.6.1.1.1
Test purpose and Environment
p. 2137
A.5.6.1.1.2
Test Requirements
p. 2140
A.5.6.1.2
EN-DC event triggered reporting test without gap under DRX
p. 2140
A.5.6.1.2.1
Test purpose and Environment
p. 2140
A.5.6.1.2.2
Test Requirements
p. 2142
A.5.6.1.3
EN-DC event triggered reporting test with per-UE gaps under non-DRX
p. 2143
A.5.6.1.3.1
Test purpose and Environment
p. 2143
A.5.6.1.3.2
Test Requirements
p. 2147
A.5.6.1.4
EN-DC event triggered reporting test with per-UE gaps under DRX
p. 2147
A.5.6.1.4.1
Test purpose and Environment
p. 2147
A.5.6.1.4.2
Test Requirements
p. 2150
A.5.6.1.5
EN-DC event triggered reporting test without gap under non-DRX when CD-SSB is outside active BWP
p. 2151
A.5.6.1.5.1
Test purpose and Environment
p. 2151
A.5.6.1.5.2
Test Requirements
p. 2151
A.5.6.1.6
EN-DC event triggered reporting test without gap under non-DRX
p. 2151
A.5.6.1.6.1
Test purpose and Environment
p. 2151
A.5.6.1.6.2
Test Requirements
p. 2155
A.5.6.2
Inter-frequency Measurements
p. 2155
A.5.6.2.1
EN-DC event triggered reporting tests for FR2 cell without SSB time index detection when DRX is not used
p. 2155
A.5.6.2.1.1
Test Purpose and Environment
p. 2155
A.5.6.2.1.2
Test Requirements
p. 2158
A.5.6.2.2
EN-DC event triggered reporting tests for FR2 cell without SSB time index detection when DRX is used
p. 2158
A.5.6.2.2.1
Test Purpose and Environment
p. 2158
A.5.6.2.2.2
Test Requirements
p. 2162
A.5.6.2.3
EN-DC event triggered reporting tests for FR2 cell with SSB time index detection when DRX is not used
p. 2162
A.5.6.2.3.1
Test Purpose and Environment
p. 2162
A.5.6.2.3.2
Test Requirements
p. 2166
A.5.6.2.4
EN-DC event triggered reporting tests for FR2 cell with SSB time index detection when DRX is used
p. 2166
A.5.6.2.4.1
Test Purpose and Environment
p. 2166
A.5.6.2.4.2
Test Requirements
p. 2170
A.5.6.2.5
EN-DC event triggered reporting tests for FR2 cell without SSB time index detection when DRX is not used
p. 2170
A.5.6.2.5.1
Test Purpose and Environment
p. 2170
A.5.6.2.5.2
Test Requirements
p. 2175
A.5.6.2.6
EN-DC event triggered reporting tests for FR2 cell without SSB time index detection when DRX is used
p. 2175
A.5.6.2.6.1
Test Purpose and Environment
p. 2175
A.5.6.2.6.2
Test Requirements
p. 2179
A.5.6.2.7
EN-DC event triggered reporting tests for FR2 cell with SSB time index detection when DRX is not used
p. 2179
A.5.6.2.7.1
Test Purpose and Environment
p. 2179
A.5.6.2.7.2
Test Requirements
p. 2184
A.5.6.2.8
EN-DC event triggered reporting tests for FR2 cell with SSB time index detection when DRX is used
p. 2184
A.5.6.2.8.1
Test Purpose and Environment
p. 2184
A.5.6.2.8.2
Test Requirements
p. 2189
A.5.6.3
L1-RSRP measurement for beam reporting
p. 2190
A.5.6.3.1
SSB based L1-RSRP measurement when DRX is not used
p. 2190
A.5.6.3.1.1
Test Purpose and Environment
p. 2190
A.5.6.3.1.2
Test parameters
p. 2190
A.5.6.3.1.3
Test Requirements
p. 2192
A.5.6.3.2
SSB based L1-RSRP measurement when DRX is used
p. 2192
A.5.6.3.2.1
Test Purpose and Environment
p. 2192
A.5.6.3.2.2
Test parameters
p. 2193
A.5.6.3.2.3
Test Requirements
p. 2195
A.5.6.3.3
CSI-RS based L1-RSRP measurement when DRX is not used
p. 2195
A.5.6.3.3.1
Test Purpose and Environment
p. 2195
A.5.6.3.3.2
Test parameters
p. 2196
A.5.6.3.3.3
Test Requirements
p. 2198
A.5.6.3.4
CSI-RS based L1-RSRP measurement when DRX is used
p. 2198
A.5.6.3.4.1
Test Purpose and Environment
p. 2198
A.5.6.3.4.2
Test parameters
p. 2199
A.5.6.3.4.3
Test Requirements
p. 2201
A.5.6.3.5
CSI-RS based L1-RSRP measurement when DRX is not used and when CD-SSB is outside active BWP
p. 2202
A.5.6.3.5.1
Test Purpose and Environment
p. 2202
A.5.6.3.6
SSB based L1-RSRP measurement when DRX is not used when CD-SSB is outside active BWP
p. 2202
A.5.6.3.6.1
Test Purpose and Environment
p. 2202
A.5.6.3.6.2
Test Requirements
p. 2202
A.5.6.3.7
SSB based L1-RSRP measurement for UE supporting NCD-SSB based L1 measurement outside active BWP when DRX is not used
p. 2202
A.5.6.3.7.1
Test Purpose and Environment
p. 2202
A.5.6.3.7.2
Test parameters
p. 2203
A.5.6.3.7.3
Test Requirements
p. 2205
A.5.6.4
CLI measurements
p. 2205
A.5.6.4.1
SRS-RSRP measurement with DRX
p. 2205
A.5.6.4.1.1
Test Purpose and Environment
p. 2205
A.5.6.4.1.2
Test Parameters
p. 2206
A.5.6.4.1.3
Test Requirements
p. 2208
A.5.6.4.2
CLI-RSSI measurement with DRX
p. 2208
A.5.6.4.2.1
Test Purpose and Environment
p. 2208
A.5.6.4.2.2
Test Parameters
p. 2209
A.5.6.4.2.3
Test Requirements
p. 2211
A.5.6.5
Measurements with autonomous gaps
p. 2211
A.5.6.5.1
EN-DC inter-frequency CGI identification of NR neighbor cell in FR2
p. 2211
A.5.6.5.1.1
Test Purpose and Environment
p. 2211
A.5.6.5.1.2
Test Requirements
p. 2214
A.5.6.6
L1-SINR measurement for beam reporting
p. 2215
A.5.6.6.2
L1-SINR measurement with SSB based CMR and dedicated IMR when DRX is not used
p. 2217
A.5.6.6.2.1
Test Purpose and Environment
p. 2217
A.5.6.6.2.2
Test parameters
p. 2218
A.5.6.6.2.3
Test Requirements
p. 2221
A.5.6.6.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR configured when DRX is not used
p. 2221
A.5.6.6.3.1
Test Purpose and Environment
p. 2221
A.5.6.6.3.2
Test parameters
p. 2222
A.5.6.6.3.3
Test Requirements
p. 2224
A.5.6.7
CSI-RS based Intra-frequency Measurements
p. 2224
A.5.6.7.1
EN-DC event triggered reporting test without gap under non-DRX
p. 2224
A.5.6.7.1.1
Test purpose and Environment
p. 2224
A.5.6.7.1.2
Test Requirements
p. 2227
A.5.6.8
CSI-RS based Inter-frequency Measurements
p. 2227
A.5.6.8.1
EN-DC event triggered reporting tests for NR FR2 cell when DRX is used
p. 2227
A.5.6.8.1.1
Test Purpose and Environment
p. 2227
A.5.6.8.1.2
Test Requirements
p. 2232
A.5.7
Measurement Performance requirements
p. 2232
A.5.7.1
SS-RSRP
p. 2232
A.5.7.1.1
EN-DC intra-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 2232
A.5.7.1.1.1
Test Purpose and Environment
p. 2232
A.5.7.1.1.2
Test parameters
p. 2233
A.5.7.1.1.3
Test Requirements
p. 2235
A.5.7.1.2
EN-DC inter-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 2236
A.5.7.1.2.1
Test Purpose and Environment
p. 2236
A.5.7.1.2.2
Test parameters
p. 2236
A.5.7.1.2.3
Test Requirements
p. 2240
A.5.7.1.3
EN-DC inter-frequency measurement accuracy with FR1 serving cell and FR2 target cell
p. 2241
A.5.7.1.3.1
Test Purpose and Environment
p. 2241
A.5.7.1.3.2
Test parameters
p. 2241
A.5.7.1.3.3
Test Requirements
p. 2244
A.5.7.2
SS-RSRQ
p. 2245
A.5.7.2.1
EN-DC Intra-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2245
A.5.7.2.1.1
Test Purpose and Environment
p. 2245
A.5.7.2.1.2
Test Parameters
p. 2245
A.5.7.2.1.3
Test Requirements
p. 2248
A.5.7.2.2
EN-DC Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2248
A.5.7.2.2.1
Test Purpose and Environment
p. 2248
A.5.7.2.2.2
Test Parameters
p. 2248
A.5.7.2.2.3
Test Requirements
p. 2250
A.5.7.3
SS-SINR
p. 2251
A.5.7.3.1
EN-DC Intra-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2251
A.5.7.3.1.1
Test Purpose and Environment
p. 2251
A.5.7.3.1.2
Test Parameters
p. 2251
A.5.7.3.1.3
Test Requirements
p. 2254
A.5.7.3.2
EN-DC Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2254
A.5.7.3.2.1
Test Purpose and Environment
p. 2254
A.5.7.3.2.2
Test Parameters
p. 2254
A.5.7.3.2.3
Test Requirements
p. 2256
A.5.7.4
L1-RSRP measurement for beam reporting
p. 2256
A.5.7.4.1
SSB based L1-RSRP measurement
p. 2256
A.5.7.4.1.1
Test Purpose and Environment
p. 2256
A.5.7.4.1.2
Test parameters
p. 2257
A.5.7.4.1.3
Test Requirements
p. 2259
A.5.7.4.2
CSI-RS based L1-RSRP measurement on resource set with repetition off
p. 2260
A.5.7.4.2.1
Test Purpose and Environment
p. 2260
A.5.7.4.2.2
Test parameters
p. 2260
A.5.7.4.2.3
Test Requirements
p. 2262
A.5.7.5
CLI measurements
p. 2263
A.5.7.5.1
EN-DC SRS-RSRP measurement accuracy with FR2 serving cell
p. 2263
A.5.7.5.1.1
Test Purpose and Environment
p. 2263
A.5.7.5.1.2
Test parameters
p. 2263
A.5.7.5.1.3
Test Requirements
p. 2266
A.5.7.5.2
EN-DC CLI-RSSI measurement accuracy with FR2 serving cell
p. 2267
A.5.7.5.2.1
Test Purpose and Environment
p. 2267
A.5.7.5.2.2
Test parameters
p. 2267
A.5.7.5.2.3
Test Requirements
p. 2269
A.5.7.6
L1-SINR measurement for beam reporting
p. 2270
A.5.7.6.2
L1-SINR measurement with SSB based CMR and dedicated IMR
p. 2273
A.5.7.6.2.1
Test Purpose and Environment
p. 2273
A.5.7.6.2.2
Test parameters
p. 2273
A.5.7.6.2.3
Test Requirements
p. 2275
A.5.7.6.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR
p. 2276
A.5.7.6.3.1
Test Purpose and Environment
p. 2276
A.5.7.6.3.2
Test parameters
p. 2276
A.5.7.6.3.3
Test Requirements
p. 2278
A.5.7.7
CSI-RSRP
p. 2279
A.5.7.7.1
EN-DC intra-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 2279
A.5.7.7.1.1
Test Purpose and Environment
p. 2279
A.5.7.7.1.2
Test parameters
p. 2279
A.5.7.7.1.3
Test Requirements
p. 2281
A.5.7.7.2
EN-DC inter-frequency case measurement accuracy with FR2 serving cell and FR2 target cell
p. 2282
A.5.7.7.2.1
Test Purpose and Environment
p. 2282
A.5.7.7.2.2
Test parameters
p. 2282
A.5.7.7.2.3
Test Requirements
p. 2286
A.5.7.8
CSI-RSRQ
p. 2287
A.5.7.8.1
EN-DC Intra-frequency measurement accuracy with FR2 serving cell and FR2 target cell
p. 2287
A.5.7.8.1.1
Test Purpose and Environment
p. 2287
A.5.7.8.1.2
Test Parameters
p. 2287
A.5.7.8.1.3
Test Requirements
p. 2289
A.5.7.8.2
EN-DC Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2289
A.5.7.8.2.1
Test Purpose and Environment
p. 2289
A.5.7.8.2.2
Test Parameters
p. 2289
A.5.7.8.2.3
Test Requirements
p. 2291
A.5.7.9
CSI-SINR
p. 2291
A.5.7.9.1
EN-DC Intra-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2291
A.5.7.9.1.1
Test Purpose and Environment
p. 2291
A.5.7.9.1.2
Test Parameters
p. 2291
A.5.7.9.1.3
Test Requirements
p. 2294
A.5.7.9.2
EN-DC Inter-frequency measurement accuracy with FR2 serving cell and FR2 TDD target cell
p. 2294
A.5.7.9.2.1
Test Purpose and Environment
p. 2294
A.5.7.9.2.2
Test Parameters
p. 2294
A.5.7.9.2.3
Test Requirements
p. 2297
A.5.8
Void