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Content for
TS 36.133
Word version: 18.6.0
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A.8
UE Measurements Procedures
...
A.8
UE Measurements Procedures
p. 2099
A.8.1
E-UTRAN FDD Intra-frequency Measurements
p. 2099
A.8.1.1
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells
p. 2099
A.8.1.1.1
Test Purpose and Environment
p. 2099
A.8.1.1.2
Test Requirements
p. 2100
A.8.1.2
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells
p. 2101
A.8.1.2.1
Test Purpose and Environment
p. 2101
A.8.1.2.2
Test Requirements
p. 2102
A.8.1.3
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells with DRX
p. 2103
A.8.1.3.1
Test Purpose and Environment
p. 2103
A.8.1.3.2
Test Requirements
p. 2105
A.8.1.4
Void
A.8.1.5
E-UTRAN FDD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2105
A.8.1.5.1
Test Purpose and Environment
p. 2105
A.8.1.5.2
Test Requirements
p. 2107
A.8.1.6
E-UTRAN FDD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX
p. 2107
A.8.1.6.1
Test Purpose and Environment
p. 2107
A.8.1.6.2
Test Requirements
p. 2109
A.8.1.7
E-UTRAN FDD-FDD Intra-Frequency Event-Triggered Reporting under Time Domain Measurement Resource Restriction with Non-MBSFN ABS
p. 2109
A.8.1.7.1
Test Purpose and Environment
p. 2109
A.8.1.7.2
Test Requirements
p. 2111
A.8.1.8
E-UTRAN FDD-FDD Intra-Frequency Event-Triggered Reporting under Time Domain Measurement Resource Restriction with CRS Assistance Information and Non-MBSFN ABS
p. 2112
A.8.1.8.1
Test Purpose and Environment
p. 2112
A.8.1.8.2
Test Requirements
p. 2114
A.8.1.9
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for 5MHz bandwidth
p. 2115
A.8.1.9.1
Test Purpose and Environment
p. 2115
A.8.1.9.2
Test Requirements
p. 2115
A.8.1.10
E-UTRAN FDD-FDD Intra-Frequency Event Triggered Reporting under Fading Propagation Conditions in Synchronous Cells with DRX for 5 MHz Bandwidth
p. 2115
A.8.1.10.1
Test Purpose and Environment
p. 2115
A.8.1.10.2
Test Requirements
p. 2116
A.8.1.11
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 0
p. 2116
A.8.1.11.1
Test Purpose and Environment
p. 2116
A.8.1.11.2
Test Requirements
p. 2118
A.8.1.12
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for UE category 0
p. 2119
A.8.1.12.1
Test Purpose and Environment
p. 2119
A.8.1.12.2
Test Requirements
p. 2120
A.8.1.13
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells with DRX for UE category 0
p. 2121
A.8.1.13.1
Test Purpose and Environment
p. 2121
A.8.1.13.2
Test Requirements
p. 2123
A.8.1.14
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 0
p. 2123
A.8.1.14.1
Test Purpose and Environment
p. 2123
A.8.1.14.2
Test Requirements
p. 2125
A.8.1.15
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for UE category 0
p. 2126
A.8.1.15.1
Test Purpose and Environment
p. 2126
A.8.1.15.2
Test Requirements
p. 2127
A.8.1.16
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells with DRX for UE category 0
p. 2128
A.8.1.16.1
Test Purpose and Environment
p. 2128
A.8.1.16.2
Test Requirements
p. 2130
A.8.1.17
Void
A.8.1.18
Void
A.8.1.19
E-UTRAN FDD-FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for UE category 0
p. 2130
A.8.1.19.1
Test Purpose and Environment
p. 2130
A.8.1.19.2
Test Requirements
p. 2132
A.8.1.20
E-UTRAN FDD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for UE category 0
p. 2133
A.8.1.20.1
Test Purpose and Environment
p. 2133
A.8.1.20.2
Test Requirements
p. 2135
A.8.1.21
E-UTRAN HD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for UE category 0
p. 2135
A.8.1.21.1
Test Purpose and Environment
p. 2135
A.8.1.21.2
Test Requirements
p. 2137
A.8.1.22
E-UTRAN HD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for UE category 0
p. 2138
A.8.1.22.1
Test Purpose and Environment
p. 2138
A.8.1.22.2
Test Requirements
p. 2140
A.8.1.23
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for Cat-M1 UE in CEModeA
p. 2140
A.8.1.23.1
Test Purpose and Environment
p. 2140
A.8.1.23.2
Test Requirements
p. 2141
A.8.1.24
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeA
p. 2142
A.8.1.24.1
Test Purpose and Environment
p. 2142
A.8.1.24.2
Test Requirements
p. 2144
A.8.1.25
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeA in DRX
p. 2144
A.8.1.25.1
Test Purpose and Environment
p. 2144
A.8.1.25.2
Test Requirements
p. 2146
A.8.1.26
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for Cat-M1 UE in CEModeA
p. 2146
A.8.1.26.1
Test Purpose and Environment
p. 2146
A.8.1.27
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeA
p. 2149
A.8.1.27.1
Test Purpose and Environment
p. 2149
A.8.1.27.2
Test Requirements
p. 2151
A.8.1.28
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeA in DRX
p. 2151
A.8.1.28.1
Test Purpose and Environment
p. 2151
A.8.1.28.2
Test Requirements
p. 2153
A.8.1.29
E-UTRAN TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeA
p. 2153
A.8.1.29.1
Test Purpose and Environment
p. 2153
A.8.1.29.2
Test Requirements
p. 2155
A.8.1.30
E-UTRAN TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeA in DRX
p. 2156
A.8.1.30.1
Test Purpose and Environment
p. 2156
A.8.1.30.2
Test Requirements
p. 2158
A.8.1.31
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for Cat-M1 UE in CEModeB
p. 2158
A.8.1.31.1
Test Purpose and Environment
p. 2158
A.8.1.31.2
Test Requirements
p. 2160
A.8.1.32
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeB
p. 2161
A.8.1.32.1
Test Purpose and Environment
p. 2161
A.8.1.32.2
Test Requirements
p. 2162
A.8.1.33
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for Cat-M1 UE in CEModeB
p. 2163
A.8.1.33.1
Test Purpose and Environment
p. 2163
A.8.1.33.2
Test Requirements
p. 2164
A.8.1.34
E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeB
p. 2165
A.8.1.34.1
Test Purpose and Environment
p. 2165
A.8.1.34.2
Test Requirements
p. 2166
A.8.1.35
E-UTRAN TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for Cat-M1 UE in CEModeB
p. 2167
A.8.1.35.1
Test Purpose and Environment
p. 2167
A.8.1.35.2
Test Requirements
p. 2168
A.8.1.36
E-UTRAN FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for Cat-M1 UE in CEModeB
p. 2169
A.8.1.36.1
Test Purpose and Environment
p. 2169
A.8.1.36.2
Test Requirements
p. 2170
A.8.1.37
E-UTRAN FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for Cat-M1 UE in CEModeB
p. 2171
A.8.1.37.1
Test Purpose and Environment
p. 2171
A.8.1.37.2
Test Requirements
p. 2173
A.8.1.38
E-UTRAN HD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for Cat-M1 UE in CEModeB
p. 2173
A.8.1.38.1
Test Purpose and Environment
p. 2173
A.8.1.38.2
Test Requirements
p. 2174
A.8.1.39
E-UTRAN HD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for Cat-M1 UE in CEModeB
p. 2175
A.8.1.39.1
Test Purpose and Environment
p. 2175
A.8.1.39.2
Test Requirements
p. 2177
A.8.1.40
E-UTRAN FDD-FDD intra-frequency event triggered reporting with DRX for UE configured with highSpeedEnhancedMeasFlag
p. 2177
A.8.1.40.1
Test Purpose and Environment
p. 2177
A.8.1.40.2
Test Requirements
p. 2179
A.8.1.41
E-UTRAN FDD intra-frequency event triggered reporting for serving cell under fading propagation conditions for UE category M1 in CEModeA without gap
p. 2179
A.8.1.41.1
Test Purpose and Environment
p. 2179
A.8.1.41.2
Test Requirement
p. 2181
A.8.1.42
E-UTRAN HD-FDD intra-frequency event triggered reporting for serving cell under fading propagation conditions for UE category M1 in CEModeA without gap
p. 2181
A.8.1.42.1
Test Purpose and Environment
p. 2181
A.8.1.42.2
Test Requirement
p. 2182
A.8.1.43
E-UTRAN FDD-FDD intra-frequency event triggered reporting with DRX for UE configured with highSpeedEnhMeasFlag2-r16
p. 2182
A.8.1.43.1
Test Purpose and Environment
p. 2182
A.8.1.43.2
Test Requirements
p. 2185
A.8.1.44
HD-FDD Intra-frequency neighbour cell measurement for UE category NB1 in In-Band mode under normal coverage
p. 2185
A.8.1.44.1
Test Purpose and Environment
p. 2185
A.8.1.44.2
Test Requirements
p. 2188
A.8.1.45
HD-FDD Intra-frequency neighbour cell measurement for UE category NB1 in guard-band mode under normal coverage
p. 2189
A.8.1.45.1
Test Purpose and Environment
p. 2189
A.8.1.45.2
Test Requirements
p. 2191
A.8.1.46
HD-FDD Intra-frequency neighbour cell measurement for UE category NB1 in standalone mode under normal coverage
p. 2192
A.8.1.46.1
Test Purpose and Environment
p. 2192
A.8.1.46.2
Test Requirements
p. 2193
A.8.1.47
TDD Intra-frequency neighbour cell measurement for UE category NB1 in In-Band mode under normal coverage
p. 2194
A.8.1.47.1
Test Purpose and Environment
p. 2194
A.8.1.47.2
Test Requirements
p. 2196
A.8.1.48
TDD Intra-frequency neighbour cell measurement for UE category NB1 in guard-band mode under normal coverage
p. 2197
A.8.1.48.1
Test Purpose and Environment
p. 2197
A.8.1.48.2
Test Requirements
p. 2199
A.8.1.49
TDD Intra-frequency neighbour cell measurement for UE category NB1 in standalone mode under normal coverage
p. 2200
A.8.1.49.1
Test Purpose and Environment
p. 2200
A.8.1.49.2
Test Requirements
p. 2201
A.8.1.50
HD-FDD Inter-frequency neighbour cell measurement for UE category NB1 in In-Band mode under normal coverage
p. 2202
A.8.1.50.1
Test Purpose and Environment
p. 2202
A.8.1.50.2
Test Requirements
p. 2204
A.8.1.51
HD-FDD Inter-frequency neighbour cell measurement for UE category NB1 in guard-band mode under normal coverage
p. 2205
A.8.1.51.1
Test Purpose and Environment
p. 2205
A.8.1.51.2
Test Requirements
p. 2207
A.8.1.52
HD-FDD Inter-frequency neighbour cell measurement for UE category NB1 in standalone mode under normal coverage
p. 2208
A.8.1.52.1
Test Purpose and Environment
p. 2208
A.8.1.52.2
Test Requirements
p. 2209
A.8.1.53
TDD Inter-frequency neighbour cell measurement for UE category NB1 in In-Band mode under normal coverage
p. 2210
A.8.1.53.1
Test Purpose and Environment
p. 2210
A.8.1.53.2
Test Requirements
p. 2212
A.8.1.54
TDD Inter-frequency neighbour cell measurement for UE category NB1 in guard-band mode under normal coverage
p. 2213
A.8.1.54.1
Test Purpose and Environment
p. 2213
A.8.1.54.2
Test Requirements
p. 2215
A.8.1.55
TDD Inter-frequency neighbour cell measurement for UE category NB1 in standalone mode under normal coverage
p. 2216
A.8.1.55.1
Test Purpose and Environment
p. 2216
A.8.1.55.2
Test Requirements
p. 2217
A.8.2
E-UTRAN TDD Intra-frequency Measurements
p. 2218
A.8.2.1
E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells
p. 2218
A.8.2.1.1
Test Purpose and Environment
p. 2218
A.8.2.1.2
Test Requirements
p. 2219
A.8.2.2
E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells with DRX
p. 2219
A.8.2.2.1
Test Purpose and Environment
p. 2219
A.8.2.2.2
Test Requirements
p. 2222
A.8.2.3
E-UTRAN TDD - TDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2222
A.8.2.3.1
Test Purpose and Environment
p. 2222
A.8.2.3.2
Test Requirements
p. 2224
A.8.2.4
E-UTRAN TDD - TDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX
p. 2225
A.8.2.4.1
Test Purpose and Environment
p. 2225
A.8.2.4.2
Test Requirements
p. 2227
A.8.2.5
E-UTRAN TDD-TDD Intra-Frequency Event-Triggered Reporting under Time Domain Measurement Resource Restriction with Non-MBSFN ABS
p. 2227
A.8.2.5.1
Test Purpose and Environment
p. 2227
A.8.2.5.2
Test Requirements
p. 2229
A.8.2.6
E-UTRAN TDD-TDD Intra-Frequency Event-Triggered Reporting under Time Domain Measurement Resource Restriction with CRS Assistance Information and Non-MBSFN ABS
p. 2230
A.8.2.6.1
Test Purpose and Environment
p. 2230
A.8.2.6.2
Test Requirements
p. 2233
A.8.2.7
E-UTRAN TDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2234
A.8.2.7.1
Test Purpose and Environment
p. 2234
A.8.2.7.2
Test Requirements
p. 2235
A.8.2.8
E-UTRAN TDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX
p. 2236
A.8.2.8.1
Test Purpose and Environment
p. 2236
A.8.2.8.2
Test Requirements
p. 2238
A.8.2.9
E-UTRAN TDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for Cat-M1 UE in CEModeB
p. 2238
A.8.2.9.1
Test Purpose and Environment
p. 2238
A.8.2.9.2
Test Requirements
p. 2240
A.8.2.10
E-UTRAN TDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for Cat-M1 UE in CEModeB
p. 2241
A.8.2.10.1
Test Purpose and Environment
p. 2241
A.8.2.10.2
Test Requirements
p. 2243
A.8.2.11
E-UTRAN TDD-TDD intra-frequency event triggered reporting with DRX for UE configured with highSpeedEnhancedMeasFlag
p. 2243
A.8.2.11.1
Test Purpose and Environment
p. 2243
A.8.2.11.2
Test Requirements
p. 2245
A.8.2.12
E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells for UE category 0
p. 2245
A.8.2.12.1
Test Purpose and Environment
p. 2245
A.8.2.12.2
Test Requirements
p. 2247
A.8.2.13
E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells with DRX for UE category 0
p. 2248
A.8.2.13.1
Test Purpose and Environment
p. 2248
A.8.2.13.2
Test Requirements
p. 2250
A.8.2.14
E-UTRAN TDD intra-frequency event triggered reporting for serving cell under fading propagation conditions for UE category M1 in CEModeA without gap
p. 2250
A.8.2.14.1
Test Purpose and Environment
p. 2250
A.8.2.14.2
Test Requirement
p. 2252
A.8.2.15
E-UTRAN TDD-TDD intra-frequency event triggered reporting with DRX for UE configured with highSpeedEnhMeasFlag2-r16
p. 2252
A.8.2.15.1
Test Purpose and Environment
p. 2252
A.8.2.15.2
Test Requirements
p. 2254
A.8.3
E-UTRAN FDD - FDD Inter-frequency Measurements
p. 2254
A.8.3.1
E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells
p. 2254
A.8.3.1.1
Test Purpose and Environment
p. 2254
A.8.3.1.2
Test Requirements
p. 2256
A.8.3.2
E-UTRAN FDD-FDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells
p. 2256
A.8.3.2.1
Test Purpose and Environment
p. 2256
A.8.3.2.2
Test Requirements
p. 2259
A.8.3.3
E-UTRAN FDD-FDD inter-frequency event triggered reporting under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used
p. 2259
A.8.3.3.1
Test Purpose and Environment
p. 2259
A.8.3.3.2
Test Requirements
p. 2262
A.8.3.4
E-UTRAN FDD - FDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2262
A.8.3.4.1
Test Purpose and Environment
p. 2262
A.8.3.4.2
Test Requirements
p. 2264
A.8.3.5
E-UTRAN FDD - FDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX
p. 2264
A.8.3.5.2
Test Requirements
p. 2266
A.8.3.6
E-UTRAN FDD-FDD Inter-frequency event triggered reporting without measurement gaps under AWGN propagation conditions in asynchronous cells
p. 2266
A.8.3.6.1
Test Purpose and Environment
p. 2266
A.8.3.6.2
Test Requirements
p. 2268
A.8.3.7
E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for Increased Carrier Monitoring without Reduced Performance Group
p. 2269
A.8.3.7.1
Test Purpose and Environment
p. 2269
A.8.3.7.2
Test Requirements
p. 2271
A.8.3.8
FDD-FDD Interfrequency correct reporting of measurement events with reduced performance group configured, non DRX
p. 2272
A.8.3.8.1
Test Purpose and Environment
p. 2272
A.8.3.8.2
Test Requirements
p. 2275
A.8.3.9
FDD-FDD Inter-frequency correct reporting of measurement events with reduced performance group configured, DRX
p. 2275
A.8.3.9.1
Test Purpose and Environment
p. 2275
A.8.3.9.2
Test Requirements
p. 2279
A.8.3.10
E-UTRAN FDD-FDD Inter-frequency event triggered reporting with MGL=3ms under fading propagation conditions in synchronous cells
p. 2280
A.8.3.10.1
Test Purpose and Environment
p. 2280
A.8.3.10.2
Test Requirements
p. 2281
A.8.3.11
E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells with burst gap
p. 2281
A.8.3.11.1
Test Purpose and Environment
p. 2281
A.8.3.11.2
Test Requirement
p. 2283
A.8.3.12
E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 with discontinuous MPDCCH monitoring in CEModeA
p. 2284
A.8.3.12.1
Test Purpose and Environment
p. 2284
A.8.3.12.2
Test Requirement
p. 2285
A.8.3.13
E-UTRAN HD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 with discontinuous MPDCCH monitoring in CEModeA
p. 2286
A.8.3.13.1
Test Purpose and Environment
p. 2286
A.8.3.13.2
Test Requirement
p. 2287
A.8.3.14
E-UTRAN FDD-FDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 with discontinuous MPDCCH monitoring in CEModeB
p. 2288
A.8.3.14.1
Test Purpose and Environment
p. 2288
A.8.3.14.2
Test Requirement
p. 2289
A.8.3.15
E-UTRAN HD-FDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 with discontinuous MPDCCH monitoring in CEModeB
p. 2290
A.8.3.15.1
Test Purpose and Environment
p. 2290
A.8.3.15.2
Test Requirement
p. 2291
A.8.3.16
E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 in CEModeA when DRX is used
p. 2292
A.8.3.16.1
Test Purpose and Environment
p. 2292
A.8.3.16.2
Test Requirement
p. 2294
A.8.3.17
E-UTRAN HD-FDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 in CEModeA in DRX
p. 2294
A.8.3.17.1
Test Purpose and Environment
p. 2294
A.8.3.17.2
Test Requirement
p. 2297
A.8.3.18
E-UTRAN FDD-FDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 in CEModeB in DRX
p. 2297
A.8.3.18.1
Test Purpose and Environment
p. 2297
A.8.3.18.2
Test Requirement
p. 2300
A.8.3.19
E-UTRAN HD-FDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 in CEModeB in DRX
p. 2300
A.8.3.19.1
Test Purpose and Environment
p. 2300
A.8.3.19.2
Test Requirement
p. 2303
A.8.4
E-UTRAN TDD - TDD Inter-frequency Measurements
p. 2303
A.8.4.1
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells
p. 2303
A.8.4.1.1
Test Purpose and Environment
p. 2303
A.8.4.1.2
Test Requirements
p. 2305
A.8.4.2
E-UTRAN TDD-TDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in synchronous cells
p. 2305
A.8.4.2.1
Test Purpose and Environment
p. 2305
A.8.4.2.2
Test Requirements
p. 2308
A.8.4.3
E-UTRAN TDD-TDD inter-frequency event triggered reporting under AWGN propagation conditions in synchronous cells with DRX when L3 filtering is used
p. 2308
A.8.4.3.1
Test Purpose and Environment
p. 2308
A.8.4.3.2
Test Requirements
p. 2310
A.8.4.4
E-UTRAN TDD - TDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2311
A.8.4.4.1
Test Purpose and Environment
p. 2311
A.8.4.4.2
Test Requirements
p. 2313
A.8.4.5
E-UTRAN TDD - TDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX
p. 2314
A.8.4.5.1
Test Purpose and Environment
p. 2314
A.8.4.5.2
Test Requirements
p. 2316
A.8.4.6
E-UTRAN TDD-TDD Inter-frequency event triggered reporting for TDD UL/DL configuration 0
p. 2316
A.8.4.6.1
Test Purpose and Environment
p. 2316
A.8.4.6.2
Test Requirements
p. 2317
A.8.4.7
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells for Increased Carrier Monitoring without Reduced Performance Group
p. 2317
A.8.4.7.1
Test Purpose and Environment
p. 2317
A.8.4.7.2
Test Requirements
p. 2321
A.8.4.8
TDD-TDD Interfrequency correct reporting of measurement events with reduced performance group configured, non DRX
p. 2321
A.8.4.8.1
Test Purpose and Environment
p. 2321
A.8.4.8.2
Test Requirements
p. 2324
A.8.4.9
TDD-TDD Inter-frequency correct reporting of measurement events with reduced performance group configured, DRX
p. 2324
A.8.4.9.1
Test Purpose and Environment
p. 2324
A.8.4.9.2
Test Requirements
p. 2329
A.8.4.10
E-UTRAN TDD-TDD Inter-frequency event triggered reporting with MGL=3ms under fading propagation conditions in synchronous cells
p. 2329
A.8.4.10.1
Test Purpose and Environment
p. 2329
A.8.4.10.2
Test Requirements
p. 2331
A.8.4.11
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells with burst gap
p. 2331
A.8.4.11.1
Test Purpose and Environment
p. 2331
A.8.4.11.2
Test Requirement
p. 2333
A.8.4.12
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 with discontinuous MPDCCH monitoring in CEModeA
p. 2333
A.8.4.12.1
Test Purpose and Environment
p. 2333
A.8.4.12.2
Test Requirement
p. 2335
A.8.4.13
E-UTRAN TDD-TDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 with discontinuous MPDCCH monitoring in CEModeB
p. 2336
A.8.4.13.1
Test Purpose and Environment
p. 2336
A.8.4.13.2
Test Requirement
p. 2337
A.8.4.14
E-UTRAN TDD-TDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 in CEModeA in DRX
p. 2338
A.8.4.14.1
Test Purpose and Environment
p. 2338
A.8.4.14.2
Test Requirement
p. 2340
A.8.4.15
E-UTRAN TDD-TDD inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category M1 in CEModeB in DRX
p. 2340
A.8.4.15.1
Test Purpose and Environment
p. 2340
A.8.4.15.2
Test Requirement
p. 2343
A.8.5
E-UTRAN FDD - UTRAN FDD Measurements
p. 2343
A.8.5.1
E-UTRAN FDD - UTRAN FDD event triggered reporting under fading propagation conditions
p. 2343
A.8.5.1.1
Test Purpose and Environment
p. 2343
A.8.5.1.2
Test Requirements
p. 2345
A.8.5.2
E-UTRAN FDD - UTRAN FDD SON ANR cell search reporting under AWGN propagation conditions
p. 2345
A.8.5.2.1
Test Purpose and Environment
p. 2345
A.8.5.2.2
Test Requirements
p. 2347
A.8.5.3
E-UTRAN FDD-UTRAN FDD event triggered reporting when DRX is used under fading propagation conditions
p. 2347
A.8.5.3.1
Test Purpose and Environment
p. 2347
A.8.5.3.2
Test Requirements
p. 2350
A.8.5.4
E-UTRAN FDD - UTRAN FDD enhanced cell identification under AWGN propagation conditions
p. 2350
A.8.5.4.1
Test Purpose and Environment
p. 2350
A.8.5.4.2
Test Requirements
p. 2352
A.8.5.5
E- UTRAN FDD - UTRAN FDD identification of a new CGI of UTRAN cell using autonomous gaps
p. 2352
A.8.5.5.1
Test Purpose and Environment
p. 2352
A.8.5.5.2
Test Requirements
p. 2355
A.8.5.6
E-UTRAN FDD - UTRAN FDD event triggered reporting without measurement gaps under AWGN propagation conditions
p. 2355
A.8.5.6.1
Test Purpose and Environment
p. 2355
A.8.5.6.2
Test Requirements
p. 2356
A.8.5.7
E-UTRAN FDD - UTRAN FDD Event Triggered Reporting under Fading Propagation Conditions for 5 MHz Bandwidth
p. 2357
A.8.5.7.1
Test Purpose and Environment
p. 2357
A.8.5.7.2
Test Requirements
p. 2357
A.8.5.8
E-UTRA FDD InterRAT UTRA FDD correct reporting of measurement events with reduced performance group configured, non DRX
p. 2357
A.8.5.8.1
Test Purpose and Environment
p. 2357
A.8.5.8.2
Test Requirements
p. 2360
A.8.6
E-UTRAN TDD - UTRAN FDD Measurements
p. 2360
A.8.6.1
E-UTRAN TDD - UTRAN FDD event triggered reporting under fading propagation conditions
p. 2360
A.8.6.1.1
Test Purpose and Environment
p. 2360
A.8.6.1.2
Test Requirements
p. 2362
A.8.6.2
E- UTRAN TDD - UTRAN FDD identification of a new CGI of UTRAN cell using autonomous gaps
p. 2362
A.8.6.2.1
Test Purpose and Environment
p. 2362
A.8.6.2.2
Test Requirements
p. 2365
A.8.6.3
E-UTRA TDD InterRAT UTRA FDD correct reporting of measurement events with reduced performance group configured, non DRX
p. 2365
A.8.6.3.1
Test Purpose and Environment
p. 2365
A.8.6.3.2
Test Requirements
p. 2368
A.8.7
E-UTRAN TDD - UTRAN TDD Measurements
p. 2368
A.8.7.1
E-UTRAN TDD to UTRAN TDD cell search under fading propagation conditions
p. 2368
A.8.7.1.1
Test Purpose and Environment
p. 2368
A.8.7.1.1.1
Void
A.8.7.1.1.2
1.28 Mcps TDD option
p. 2368
A.8.7.1.1.3
Void
A.8.7.1.2
Test Requirements
p. 2370
A.8.7.1.2.1
Void
A.8.7.1.2.2
1.28 Mcps TDD option
p. 2370
A.8.7.1.2.3
Void
A.8.7.2
E-UTRAN TDD-UTRAN TDD cell search when DRX is used under fading propagation conditions
p. 2370
A.8.7.2.1
Test Purpose and Environment
p. 2370
A.8.7.2.2
Test Requirements
p. 2373
A.8.7.3
E-UTRAN TDD - UTRAN TDD SON ANR cell search reporting in AWGN propagation conditions
p. 2374
A.8.7.3.1
Test Purpose and Environment
p. 2374
A.8.7.3.2
Test Parameters
p. 2374
A.8.7.3.3
Test Requirements
p. 2375
A.8.7.4
E-UTRAN TDD - UTRAN TDD enhanced cell identification under AWGN propagation conditions
p. 2376
A.8.7.4.1
Test Purpose and Environment
p. 2376
A.8.7.4.2
Test Requirements
p. 2378
A.8.7.5
E-UTRA TDD InterRAT UTRA TDD correct reporting of measurement events with reduced performance group configured, non DRX
p. 2378
A.8.7.5.1
Test Purpose and Environment
p. 2378
A.8.7.5.2
Test Requirements
p. 2380
A.8.7A
E-UTRAN FDD - UTRAN TDD Measurements
p. 2380
A.8.7A.1
E-UTRA FDD InterRAT UTRA TDD correct reporting of measurement events with reduced performance group configured, non DRX
p. 2380
A.8.7A.1.1
Test Purpose and Environment
p. 2380
A.8.7A.1.2
Test Requirements
p. 2383
A.8.8
E-UTRAN FDD - GSM Measurements
p. 2383
A.8.8.1
E-UTRAN FDD - GSM event triggered reporting in AWGN
p. 2383
A.8.8.1.1
Test Purpose and Environment
p. 2383
A.8.8.1.2
Test Requirements
p. 2385
A.8.8.2
E-UTRAN FDD-GSM event triggered reporting when DRX is used in AWGN
p. 2385
A.8.8.2.1
Test Purpose and Environment
p. 2385
A.8.8.2.2
Test Requirements
p. 2387
A.8.8.3
E-UTRAN FDD - GSM event triggered reporting in AWGN with enhanced BSIC identification
p. 2388
A.8.8.3.1
Test Purpose and Environment
p. 2388
A.8.8.3.2
Test Requirements
p. 2389
A.8.9
E-UTRAN FDD - UTRAN TDD measurements
p. 2390
A.8.9.1
E-UTRAN FDD - UTRAN TDD event triggered reporting in fading propagation conditions
p. 2390
A.8.9.1.1
Test Purpose and Environment
p. 2390
A.8.9.1.2
Test Requirements
p. 2391
A.8.9.2
E-UTRAN FDD - UTRAN TDD enhanced cell identification under AWGN propagation conditions
p. 2392
A.8.9.2.1
Test Purpose and Environment
p. 2392
A.8.9.2.2
Test Requirements
p. 2394
A.8.10
E-UTRAN TDD - GSM Measurements
p. 2394
A.8.10.1
E-UTRAN TDD - GSM event triggered reporting in AWGN
p. 2394
A.8.10.1.1
Test Purpose and Environment
p. 2394
A.8.10.1.2
Test Requirements
p. 2395
A.8.10.2
E-UTRAN TDD-GSM event triggered reporting when DRX is used in AWGN
p. 2396
A.8.10.2.1
Test Purpose and Environment
p. 2396
A.8.10.2.2
Test Requirements
p. 2398
A.8.11
Monitoring of Multiple Layers
p. 2398
A.8.11.1
Multiple E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions
p. 2398
A.8.11.1.1
Test Purpose and Environment
p. 2398
A.8.11.1.2
Test Requirements
p. 2400
A.8.11.2
E-UTRAN TDD - E-UTRAN TDD and E-UTRAN TDD Inter-frequency event triggered reporting under fading propagation conditions
p. 2401
A.8.11.2.1
Test Purpose and Environment
p. 2401
A.8.11.2.2
Test Requirements
p. 2402
A.8.11.3
E-UTRAN FDD-FDD Inter-frequency and UTRAN FDD event triggered reporting under fading propagation conditions
p. 2403
A.8.11.3.1
Test Purpose and Environment
p. 2403
A.8.11.3.2
Test Requirements
p. 2405
A.8.11.4
InterRAT E-UTRA TDD to E-UTRA TDD and UTRA TDD cell search test case
p. 2405
A.8.11.4.1
Test Purpose and Environment
p. 2405
A.8.11.4.2
Test Requirements
p. 2408
A.8.11.5
Combined E-UTRAN FDD - E-UTRA FDD and GSM cell search. E-UTRA cells in fading; GSM cell in static propagation conditions
p. 2408
A.8.11.5.1
Test Purpose and Environment
p. 2408
A.8.11.5.2
Test Requirements
p. 2410
A.8.11.6
Combined E-UTRAN TDD - E-UTRA TDD and GSM cell search. E-UTRA cells in fading; GSM cell in static propagation conditions
p. 2411
A.8.11.6.1
Test Purpose and Environment
p. 2411
A.8.11.6.2
Test Requirements
p. 2413
A.8.12
RSTD Intra-frequency Measurements
p. 2414
A.8.12.1
E-UTRAN FDD intra-frequency RSTD measurement reporting delay test case
p. 2414
A.8.12.1.1
Test Purpose and Environment
p. 2414
A.8.12.1.2
Test Requirements
p. 2418
A.8.12.1.2A
Test Requirements for UE Category 1bis
p. 2418
A.8.12.2
E-UTRAN TDD intra-frequency RSTD measurement reporting delay test case
p. 2418
A.8.12.2.1
Test Purpose and Environment
p. 2418
A.8.12.2.2
Test Requirements
p. 2423
A.8.12.2.2A
Test Requirements for UE Category 1bis
p. 2423
A.8.12.3
E-UTRAN FDD intra-frequency RSTD measurement period test case in CE Mode A
p. 2423
A.8.12.3.1
Test Purpose and Environment
p. 2423
A.8.12.3.2
Test Requirements
p. 2429
A.8.12.4
E-UTRAN HD-FDD intra-frequency RSTD measurement period test case in CE Mode A
p. 2429
A.8.12.4.1
Test Purpose and Environment
p. 2429
A.8.12.4.2
Test Requirements
p. 2434
A.8.12.5
E-UTRAN TDD intra-frequency RSTD measurement period test case in CE Mode A
p. 2434
A.8.12.5.1
Test Purpose and Environment
p. 2434
A.8.12.5.2
Test Requirements
p. 2439
A.8.12.6
E-UTRAN FDD intra-frequency RSTD measurement period test case in CE Mode B
p. 2439
A.8.12.6.1
Test Purpose and Environment
p. 2439
A.8.12.6.2
Test Requirements
p. 2444
A.8.12.7
E-UTRAN HD-FDD intra-frequency RSTD measurement period test case in CE Mode B
p. 2444
A.8.12.7.1
Test Purpose and Environment
p. 2444
A.8.12.7.2
Test Requirements
p. 2449
A.8.12.8
E-UTRAN TDD intra-frequency RSTD measurement period test case in CE Mode B
p. 2449
A.8.12.8.1
Test Purpose and Environment
p. 2449
A.8.12.8.2
Test Requirements
p. 2454
A.8.12.9
E-UTRAN FDD intra-frequency RSTD measurement period test case in CE Mode A with longer PRS occasions
p. 2454
A.8.12.9.1
Test Purpose and Environment
p. 2454
A.8.12.9.2
Test Requirements
p. 2459
A.8.12.10
E-UTRAN HD-FDD intra-frequency RSTD measurement period test case in CE Mode A with longer PRS occasions
p. 2459
A.8.12.10.1
Test Purpose and Environment
p. 2459
A.8.12.10.2
Test Requirements
p. 2464
A.8.12.11
E-UTRAN TDD intra-frequency RSTD measurement period test case in CE Mode A with longer PRS occasions
p. 2464
A.8.12.11.1
Test Purpose and Environment
p. 2464
A.8.12.11.2
Test Requirements
p. 2469
A.8.12.12
E-UTRAN FDD intra-frequency RSTD measurement period test case in CE Mode B with longer PRS occasions
p. 2469
A.8.12.12.1
Test Purpose and Environment
p. 2469
A.8.12.12.2
Test Requirements
p. 2474
A.8.12.13
E-UTRAN HD-FDD intra-frequency RSTD measurement period test case in CE Mode B with longer PRS occasions
p. 2474
A.8.12.13.1
Test Purpose and Environment
p. 2474
A.8.12.13.2
Test Requirements
p. 2479
A.8.12.14
E-UTRAN TDD intra-frequency RSTD measurement period test case in CE Mode B with longer PRS occasions
p. 2479
A.8.12.14.1
Test Purpose and Environment
p. 2479
A.8.12.14.2
Test Requirements
p. 2484
A.8.13
RSTD Inter-frequency Measurements
p. 2484
A.8.13.1
E-UTRAN FDD-FDD inter-frequency RSTD measurement reporting delay test case with the reference cell on the serving carrier frequency
p. 2484
A.8.13.1.1
Test Purpose and Environment
p. 2484
A.8.13.1.2
Test Requirements
p. 2489
A.8.13.1.2A
Test Requirements for UE Category 1bis
p. 2489
A.8.13.2
E-UTRAN TDD-TDD inter-frequency RSTD measurement reporting delay test case with the reference cell on the serving carrier frequency
p. 2489
A.8.13.2.1
Test Purpose and Environment
p. 2489
A.8.13.2.2
Test Requirements
p. 2495
A.8.13.2.2A
Test Requirements for UE Category 1bis
p. 2495
A.8.13.3
E-UTRAN FDD inter-frequency RSTD measurement period test case in CE Mode A
p. 2495
A.8.13.3.1
Test Purpose and Environment
p. 2495
A.8.13.3.2
Test Requirements
p. 2502
A.8.13.4
E-UTRAN HD-FDD inter-frequency RSTD measurement period test case in CE Mode A
p. 2502
A.8.13.4.1
Test Purpose and Environment
p. 2502
A.8.13.4.2
Test Requirements
p. 2508
A.8.13.5
E-UTRAN TDD inter-frequency RSTD measurement period test case in CE Mode A
p. 2508
A.8.13.5.1
Test Purpose and Environment
p. 2508
A.8.13.5.2
Test Requirements
p. 2514
A.8.13.6
E-UTRAN FDD inter-frequency RSTD measurement period test case in CE Mode B
p. 2514
A.8.13.6.1
Test Purpose and Environment
p. 2514
A.8.13.6.2
Test Requirements
p. 2520
A.8.13.7
E-UTRAN HD-FDD inter-frequency RSTD measurement period test case in CE Mode B
p. 2520
A.8.13.7.1
Test Purpose and Environment
p. 2520
A.8.13.7.2
Test Requirements
p. 2526
A.8.13.8
E-UTRAN TDD inter-frequency RSTD measurement period test case in CE Mode B
p. 2526
A.8.13.8.1
Test Purpose and Environment
p. 2526
A.8.13.8.2
Test Requirements
p. 2532
A.8.13.9
E-UTRAN FDD inter-frequency RSTD measurement period test case in CE Mode A with longer PRS occasions
p. 2532
A.8.13.9.1
Test Purpose and Environment
p. 2532
A.8.13.9.2
Test Requirements
p. 2538
A.8.13.10
E-UTRAN HD-FDD inter-frequency RSTD measurement period test case in CE Mode A with longer PRS occasions
p. 2538
A.8.13.10.1
Test Purpose and Environment
p. 2538
A.8.13.10.2
Test Requirements
p. 2544
A.8.13.11
E-UTRAN TDD inter-frequency RSTD measurement period test case in CE Mode A with longer PRS occasions
p. 2544
A.8.13.11.1
Test Purpose and Environment
p. 2544
A.8.13.11.2
Test Requirements
p. 2550
A.8.13.12
E-UTRAN FDD inter-frequency RSTD measurement period test case in CE Mode B with longer PRS occasions
p. 2550
A.8.13.12.1
Test Purpose and Environment
p. 2550
A.8.13.12.2
Test Requirements
p. 2556
A.8.13.13
E-UTRAN HD-FDD inter-frequency RSTD measurement period test case in CE Mode B with longer PRS occasions
p. 2556
A.8.13.13.1
Test Purpose and Environment
p. 2556
A.8.13.13.2
Test Requirements
p. 2562
A.8.13.14
E-UTRAN TDD inter-frequency RSTD measurement period test case in CE Mode B with longer PRS occasions
p. 2562
A.8.13.14.1
Test Purpose and Environment
p. 2562
A.8.13.14.2
Test Requirements
p. 2568
A.8.14
E-UTRAN TDD - FDD Inter-frequency Measurements
p. 2568
A.8.14.1
E-UTRAN TDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells
p. 2568
A.8.14.1.1
Test Purpose and Environment
p. 2568
A.8.14.1.2
Test Requirements
p. 2570
A.8.14.2
E-UTRAN TDD-FDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells
p. 2570
A.8.14.2.1
Test Purpose and Environment
p. 2570
A.8.14.2.2
Test Requirements
p. 2573
A.8.14.3
E-UTRAN TDD - FDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2573
A.8.14.3.1
Test Purpose and Environment
p. 2573
A.8.14.3.2
Test Requirements
p. 2575
A.8.15
E-UTRAN FDD - TDD Inter-frequency Measurements
p. 2576
A.8.15.1
E-UTRAN FDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells
p. 2576
A.8.15.1.1
Test Purpose and Environment
p. 2576
A.8.15.1.2
Test Requirements
p. 2577
A.8.15.2
E-UTRAN FDD-TDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells
p. 2577
A.8.15.2.1
Test Purpose and Environment
p. 2577
A.8.15.2.2
Test Requirements
p. 2580
A.8.15.3
E-UTRAN FDD - TDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps
p. 2580
A.8.15.3.1
Test Purpose and Environment
p. 2580
A.8.15.3.2
Test Requirements
p. 2582
A.8.16
E-UTRAN Carrier Aggregation Measurements
p. 2583
A.8.16.1
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX
p. 2583
A.8.16.1.1
Test Purpose and Environment
p. 2583
A.8.16.1.2
Test Requirements
p. 2585
A.8.16.2
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX
p. 2585
A.8.16.2.1
Test Purpose and Environment
p. 2585
A.8.16.2.2
Test Requirements
p. 2587
A.8.16.3
E-UTRAN FDD-FDD Event triggered reporting on deactivated SCell with PCell interruption in non-DRX
p. 2587
A.8.16.3.1
Test Purpose and Environment
p. 2587
A.8.16.3.2
Test Requirements
p. 2589
A.8.16.3A
E-UTRAN FDD-FDD Event triggered reporting on deactivated SCell with network controlled PCell interruption in non-DRX
p. 2590
A.8.16.3A.1
Test Purpose and Environment
p. 2590
A.8.16.3A.2
Test Requirements
p. 2591
A.8.16.4
E-UTRAN TDD-TDD Event triggered reporting on deactivated SCell with PCell interruption in non-DRX
p. 2592
A.8.16.4.1
Test Purpose and Environment
p. 2592
A.8.16.4.2
Test Requirements
p. 2593
A.8.16.4A
E-UTRAN TDD-TDD Event triggered reporting on deactivated SCell with PCell interruption in non-DRX
p. 2594
A.8.16.4A.1
Test Purpose and Environment
p. 2594
A.8.16.4A.2
Test Requirements
p. 2596
A.8.16.5
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 20 MHz bandwidth
p. 2597
A.8.16.5.1
Test Purpose and Environment
p. 2597
A.8.16.5.2
Test Requirements
p. 2597
A.8.16.6
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 20 MHz bandwidth
p. 2597
A.8.16.6.1
Test Purpose and Environment
p. 2597
A.8.16.6.2
Test Requirements
p. 2598
A.8.16.7
E-UTRA FDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 20 MHz bandwidth
p. 2598
A.8.16.7.1
Test Purpose and Environment
p. 2598
A.8.16.7.2
Test Requirements
p. 2599
A.8.16.8
E-UTRA TDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 20 MHz bandwidth
p. 2599
A.8.16.8.1
Test Purpose and Environment
p. 2599
A.8.16.8.2
Test Requirements
p. 2600
A.8.16.9
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 10MHz+5MHz
p. 2600
A.8.16.9.1
Test Purpose and Environment
p. 2600
A.8.16.9.2
Test Requirements
p. 2601
A.8.16.10
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 10MHz+5MHz
p. 2601
A.8.16.10.1
Test Purpose and Environment
p. 2601
A.8.16.10.2
Test Requirements
p. 2602
A.8.16.11
E-UTRAN FDD event triggered reporting on deactivating SCell with PCell interruption in non-DRX for 10MHz+5MHz
p. 2602
A.8.16.11.1
Test Purpose and Environment
p. 2602
A.8.16.11.2
Test Requirements
p. 2603
A.8.16.12
E-UTRAN TDD event triggered reporting on deactivating SCell with PCell interruption in non-DRX for 10MHz+5MHz
p. 2603
A.8.16.12.1
Test Purpose and Environment
p. 2603
A.8.16.12.2
Test Requirements
p. 2603
A.8.16.13
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX for 5MHz +5 MHz bandwidth
p. 2603
A.8.16.13.1
Test Purpose and Environment
p. 2603
A.8.16.13.2
Test Requirements
p. 2604
A.8.16.14
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 5 MHz +5 MHz bandwidth
p. 2604
A.8.16.14.1
Test Purpose and Environment
p. 2604
A.8.16.14.2
Test Requirements
p. 2605
A.8.16.15
E-UTRA FDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 5 +5 MHz bandwidth
p. 2605
A.8.16.15.1
Test Purpose and Environment
p. 2605
A.8.16.15.2
Test Requirements
p. 2605
A.8.16.16
E-UTRA TDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 5+5 MHz bandwidth
p. 2605
A.8.16.16.1
Test Purpose and Environment
p. 2605
A.8.16.16.2
Test Requirements
p. 2606
A.8.16.17
E-UTRAN FDD activation and deactivation of known SCell in non-DRX
p. 2606
A.8.16.17.1
Test Purpose and Environment
p. 2606
A.8.16.17.2
Test Requirements
p. 2608
A.8.16.17A
E-UTRAN FDD activation and deactivation of known SCell in non-DRX for 20MHz
p. 2609
A.8.16.17A.1
Test Purpose and Environment
p. 2609
A.8.16.17A.2
Test Requirements
p. 2609
A.8.16.17B
E-UTRAN FDD activation and deactivation of known SCell in non-DRX for 10MHz + 5MHz
p. 2609
A.8.16.17B.1
Test Purpose and Environment
p. 2609
A.8.16.17B.2
Test Requirements
p. 2610
A.8.16.17C
E-UTRAN FDD activation and deactivation of known SCell in non-DRX for 5MHz + 5MHz
p. 2610
A.8.16.17C.1
Test Purpose and Environment
p. 2610
A.8.16.17C.2
Test Requirements
p. 2610
A.8.16.18
E-UTRAN TDD activation and deactivation of known SCell in non-DRX
p. 2610
A.8.16.18.1
Test Purpose and Environment
p. 2610
A.8.16.18.2
Test Requirements
p. 2612
A.8.16.18A
E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 20MHz
p. 2613
A.8.16.18A.1
Test Purpose and Environment
p. 2613
A.8.16.18A.2
Test Requirements
p. 2613
A.8.16.18B
E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 10MHz + 5MHz
p. 2613
A.8.16.18B.1
Test Purpose and Environment
p. 2613
A.8.16.18B.2
Test Requirements
p. 2614
A.8.16.18C
E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 5MHz + 5MHz
p. 2614
A.8.16.18C.1
Test Purpose and Environment
p. 2614
A.8.16.18C.2
Test Requirements
p. 2614
A.8.16.18D
E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 20MHz + 10MHz
p. 2614
A.8.16.18D.1
Test Purpose and Environment
p. 2614
A.8.16.18D.2
Test Requirements
p. 2615
A.8.16.19
E-UTRAN FDD activation and deactivation of unknown SCell in non-DRX
p. 2615
A.8.16.19.1
Test Purpose and Environment
p. 2615
A.8.16.19.2
Test Requirements
p. 2617
A.8.16.19A
E-UTRAN FDD activation and deactivation of unknown SCell in non-DRX for 20MHz
p. 2617
A.8.16.19A.1
Test Purpose and Environment
p. 2617
A.8.16.19A.2
Test Requirements
p. 2618
A.8.16.19B
E-UTRAN FDD activation and deactivation of unknown SCell in non-DRX for 10MHz + 5MHz
p. 2618
A.8.16.19B.1
Test Purpose and Environment
p. 2618
A.8.16.19B.2
Test Requirements
p. 2618
A.8.16.19C
E-UTRAN FDD activation and deactivation of unknown SCell in non-DRX for 5MHz + 5MHz
p. 2618
A.8.16.19C.1
Test Purpose and Environment
p. 2618
A.8.16.19C.2
Test Requirements
p. 2619
A.8.16.20
E-UTRAN TDD activation and deactivation of unknown SCell in non-DRX
p. 2619
A.8.16.20.1
Test Purpose and Environment
p. 2619
A.8.16.20.2
Test Requirements
p. 2621
A.8.16.20A
E-UTRAN TDD activation and deactivation of unknown SCell in non-DRX for 20MHz
p. 2622
A.8.16.20A.1
Test Purpose and Environment
p. 2622
A.8.16.20A.2
Test Requirements
p. 2622
A.8.16.20B
E-UTRAN TDD activation and deactivation of unknown SCell in non-DRX for 10MHz + 5MHz
p. 2622
A.8.16.20B.1
Test Purpose and Environment
p. 2622
A.8.16.20B.2
Test Requirements
p. 2623
A.8.16.20C
E-UTRAN TDD activation and deactivation of unknown SCell in non-DRX for 5MHz + 5MHz
p. 2623
A.8.16.20C.1
Test Purpose and Environment
p. 2623
A.8.16.20C.2
Test Requirements
p. 2623
A.8.16.20D
E-UTRAN TDD activation and deactivation of unknown SCell in non-DRX for 20MHz + 10MHz
p. 2623
A.8.16.20D.1
Test Purpose and Environment
p. 2623
A.8.16.20D.2
Test Requirements
p. 2624
A.8.16.21
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 20MHz+10MHz
p. 2624
A.8.16.21.1
Test Purpose and Environment
p. 2624
A.8.16.21.2
Test Requirements
p. 2626
A.8.16.22
E-UTRAN TDD event triggered reporting on deactivating SCell with PCell interruption in non-DRX for 20MHz+10MHz
p. 2626
A.8.16.22.1
Test Purpose and Environment
p. 2626
A.8.16.22.2
Test Requirements
p. 2628
A.8.16.23
E-UTRAN TDD-FDD CA Event Triggered Reporting Under Deactivated SCell in Non-DRX with PCell in FDD
p. 2628
A.8.16.23.1
Test Purpose and Environment
p. 2628
A.8.16.23.2
Test Requirements
p. 2631
A.8.16.24
E-UTRAN TDD-FDD CA Event Triggered Reporting Under Deactivated SCell in Non-DRX with PCell in TDD
p. 2631
A.8.16.24.1
Test Purpose and Environment
p. 2631
A.8.16.24.2
Test Requirements
p. 2634
A.8.16.25
E-UTRAN TDD-FDD CA Event triggered reporting on deactivated SCell with PCell interruption in non-DRX with PCell in FDD
p. 2634
A.8.16.25.1
Test Purpose and Environment
p. 2634
A.8.16.25.2
Test Requirements
p. 2637
A.8.16.26
E-UTRAN TDD-FDD CA Event triggered reporting on deactivated SCell with PCell interruption in non-DRX with PCell in TDD
p. 2637
A.8.16.26.1
Test Purpose and Environment
p. 2637
A.8.16.26.2
Test Requirements
p. 2640
A.8.16.27
3 DL PCell in FDD CA Event Triggered Reporting with 2 Deactivated SCells in Non-DRX
p. 2640
A.8.16.27.1
Test Purpose and Environment
p. 2640
A.8.16.27.2
Test Requirements
p. 2645
A.8.16.28
3 DL PCell in TDD CA Event Triggered Reporting with 2 Deactivated SCells in Non-DRX
p. 2645
A.8.16.28.1
Test Purpose and Environment
p. 2645
A.8.16.28.2
Test Requirements
p. 2650
A.8.16.29
3 DL FDD CA Event Triggered Reporting under Deactivated SCells in Non-DRX
p. 2650
A.8.16.29.1
Test Purpose and Environment
p. 2650
A.8.16.29.2
Test Requirements
p. 2655
A.8.16.30
3 DL TDD CA Event Triggered Reporting under Deactivated SCells in Non-DRX
p. 2655
A.8.16.30.1
Test Purpose and Environment
p. 2655
A.8.16.30.2
Test Requirements
p. 2660
A.8.16.31
E-UTRAN TDD-FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX and with PCell in FDD
p. 2660
A.8.16.31.1
Test Purpose and Environment
p. 2660
A.8.16.31.2
Test Requirements
p. 2665
A.8.16.32
E-UTRAN TDD-FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX and with PCell in TDD
p. 2665
A.8.16.32.1
Test Purpose and Environment
p. 2665
A.8.16.32.2
Test Requirements
p. 2670
A.8.16.33
E-UTRAN FDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2670
A.8.16.33.1
Test Purpose and Environment
p. 2670
A.8.16.33.2
Test Requirements
p. 2675
A.8.16.34
E-UTRAN TDD 3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2675
A.8.16.34.1
Test Purpose and Environment
p. 2675
A.8.16.34.2
Test Requirements
p. 2680
A.8.16.35
3 DL PCell in FDD CA Activation and Deactivation of Known SCell in Non-DRX
p. 2680
A.8.16.35.1
Test Purpose and Environment
p. 2680
A.8.16.35.2
Test Requirements
p. 2682
A.8.16.36
3 DL PCell in TDD CA Activation and Deactivation of Known SCell in Non-DRX
p. 2683
A.8.16.36.1
Test Purpose and Environment
p. 2683
A.8.16.36.2
Test Requirements
p. 2685
A.8.16.37
3 DL FDD CA activation and deactivation of known SCell in non-DRX
p. 2686
A.8.16.37.1
Test Purpose and Environment
p. 2686
A.8.16.37.2
Test Requirements
p. 2688
A.8.16.38
3 DL TDD CA activation and deactivation of known SCell in non-DRX
p. 2689
A.8.16.38.1
Test Purpose and Environment
p. 2689
A.8.16.38.2
Test Requirements
p. 2691
A.8.16.39
E-UTRA TDD-FDD 3DL CA Activation and Deactivation of Unknown SCell in Non-DRX with PCell in FDD
p. 2692
A.8.16.39.1
Test Purpose and Environment
p. 2692
A.8.16.39.2
Test Requirements
p. 2695
A.8.16.40
E-UTRA TDD-FDD 3DL CA Activation and Deactivation of Unknown SCell in Non-DRX with PCell in TDD
p. 2695
A.8.16.40.1
Test Purpose and Environment
p. 2695
A.8.16.40.2
Test Requirements
p. 2698
A.8.16.41
3 DL FDD CA activation and deactivation of unknown SCell in non-DRX
p. 2698
A.8.16.41.1
Test Purpose and Environment
p. 2698
A.8.16.41.2
Test Requirements
p. 2700
A.8.16.42
3 DL TDD CA activation and deactivation of unknown SCell in non-DRX
p. 2701
A.8.16.42.1
Test Purpose and Environment
p. 2701
A.8.16.42.2
Test Requirements
p. 2703
A.8.16.43
E-UTRAN TDD-FDD CA activation and deactivation of known SCell in non-DRX with PCell in FDD
p. 2704
A.8.16.43.1
Test Purpose and Environment
p. 2704
A.8.16.43.2
Test Requirements
p. 2707
A.8.16.44
E-UTRAN TDD-FDD CA activation and deactivation of unknown SCell in non-DRX with PCell in FDD
p. 2707
A.8.16.44.1
Test Purpose and Environment
p. 2707
A.8.16.44.2
Test Requirements
p. 2710
A.8.16.45
E-UTRAN TDD-FDD CA activation and deactivation of known SCell in non-DRX with PCell in TDD
p. 2710
A.8.16.45.1
Test Purpose and Environment
p. 2710
A.8.16.45.2
Test Requirements
p. 2713
A.8.16.46
E-UTRAN TDD-FDD CA activation and deactivation of unknown SCell in non-DRX with PCell in TDD
p. 2713
A.8.16.46.1
Test Purpose and Environment
p. 2713
A.8.16.46.2
Test Requirements
p. 2715
A.8.16.47
2DL/2UL FDD CA activation and deactivation of known PUCCH SCell without valid TA in non-DRX
p. 2716
A.8.16.47.1
Test Purpose and Environment
p. 2716
A.8.16.47.2
Test Requirements
p. 2718
A.8.16.48
2DL/2UL TDD CA activation and deactivation of known PUCCH SCell without valid TA in non-DRX
p. 2719
A.8.16.48.1
Test Purpose and Environment
p. 2719
A.8.16.48.2
Test Requirements
p. 2721
A.8.16.49
2DL/2UL TDD-FDD CA (FDD PCell) activation and deactivation of known PUCCH SCell without valid TA in non-DRX
p. 2722
A.8.16.49.1
Test Purpose and Environment
p. 2722
A.8.16.49.2
Test Requirements
p. 2725
A.8.16.50
2DL/2UL TDD-FDD CA (TDD PCell) activation and deactivation of known PUCCH SCell without valid TA in non-DRX
p. 2725
A.8.16.50.1
Test Purpose and Environment
p. 2725
A.8.16.50.2
Test Requirements
p. 2727
A.8.16.51
E-UTRAN 4 DL FDD CA Event Triggered Reporting with 3 deactivated SCells in Non-DRX
p. 2728
A.8.16.51.1
Test Purpose and Environment
p. 2728
A.8.16.51.2
Test Requirements
p. 2733
A.8.16.52
E-UTRAN 4 DL TDD CA Event Triggered Reporting with 3 deactivated SCells in Non-DRX
p. 2733
A.8.16.52.1
Test Purpose and Environment
p. 2733
A.8.16.52.2
Test Requirements
p. 2738
A.8.16.53
4 DL PCell in FDD CA Event Triggered Reporting with 3 Deactivated SCells in Non-DRX
p. 2738
A.8.16.53.1
Test Purpose and Environment
p. 2738
A.8.16.53.2
Test Requirements
p. 2742
A.8.16.54
4 DL PCell in TDD CA Event Triggered Reporting with 3 Deactivated SCells in Non-DRX
p. 2742
A.8.16.54.1
Test Purpose and Environment
p. 2742
A.8.16.54.2
Test Requirements
p. 2746
A.8.16.55
E-UTRAN FDD 4 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2746
A.8.16.55.1
Test Purpose and Environment
p. 2746
A.8.16.55.2
Test Requirements
p. 2752
A.8.16.56
E-UTRAN TDD 4 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2752
A.8.16.56.1
Test Purpose and Environment
p. 2752
A.8.16.56.2
Test Requirements
p. 2758
A.8.16.57
E-UTRAN FDD 4DL CA activation and deactivation of know SCell in non-DRX
p. 2758
A.8.16.57.1
Test Purpose and Environment
p. 2758
A.8.16.57.2
Test Requirements
p. 2760
A.8.16.58
E-UTRAN TDD 4DL CA activation and deactivation of know SCell in non-DRX
p. 2761
A.8.16.58.1
Test Purpose and Environment
p. 2761
A.8.16.58.2
Test Requirements
p. 2763
A.8.16.59
E-UTRAN PCell in FDD FDD-TDD 4 DL CA activation and deactivation of known SCell in non-DRX
p. 2764
A.8.16.59.1
Test Purpose and Environment
p. 2764
A.8.16.59.2
Test Requirements
p. 2768
A.8.16.60
E-UTRAN PCell in TDD FDD-TDD 4 DL CA activation and deactivation of known SCell in non-DRX
p. 2769
A.8.16.60.1
Test Purpose and Environment
p. 2769
A.8.16.60.2
Test Requirements
p. 2772
A.8.16.61
E-UTRAN FDD 4DL CA activation and deactivation of unknown SCell in non-DRX
p. 2773
A.8.16.61.1
Test Purpose and Environment
p. 2773
A.8.16.61.2
Test Requirements
p. 2776
A.8.16.62
E-UTRAN TDD 4DL CA activation and deactivation of unknown SCell in non-DRX
p. 2776
A.8.16.62.1
Test Purpose and Environment
p. 2776
A.8.16.62.2
Test Requirements
p. 2778
A.8.16.63
E-UTRAN PCell in FDD FDD-TDD 4 DL CA activation and deactivation of unknown SCell in non-DRX
p. 2779
A.8.16.63.1
Test Purpose and Environment
p. 2779
A.8.16.63.2
Test Requirements
p. 2782
A.8.16.64
E-UTRAN PCell in TDD FDD-TDD 4 DL CA activation and deactivation of unknown SCell in non-DRX
p. 2783
A.8.16.64.1
Test Purpose and Environment
p. 2783
A.8.16.64.2
Test Requirements
p. 2787
A.8.16.65
5 DL FDD-TDD with PCell in FDD CA Event Triggered Reporting with 4 Deactivated SCells in Non-DRX
p. 2787
A.8.16.65.1
Test Purpose and Environment
p. 2787
A.8.16.65.2
Test Requirements
p. 2792
A.8.16.66
5 DL FDD-TDD with PCell in TDD CA Event Triggered Reporting with 4 Deactivated SCells in Non-DRX
p. 2792
A.8.16.66.1
Test Purpose and Environment
p. 2792
A.8.16.66.2
Test Requirements
p. 2797
A.8.16.67
5 DL FDD-TDD with PCell in FDD CA activation and deactivation of Unknown SCell in non-DRX
p. 2797
A.8.16.67.1
Test Purpose and Environment
p. 2797
A.8.16.67.2
Test Requirements
p. 2802
A.8.16.68
5 DL FDD-TDD with PCell in TDD CA activation and deactivation of Unknown SCell in non-DRX
p. 2802
A.8.16.68.1
Test Purpose and Environment
p. 2802
A.8.16.68.2
Test Requirements
p. 2807
A.8.16.69
5 DL FDD CA activation and deactivation of unknown SCell in non-DRX
p. 2807
A.8.16.69.1
Test Purpose and Environment
p. 2807
A.8.16.69.2
Test Requirements
p. 2811
A.8.16.70
5 DL TDD CA activation and deactivation of unknown SCell in non-DRX
p. 2811
A.8.16.70.1
Test Purpose and Environment
p. 2811
A.8.16.70.2
Test Requirements
p. 2815
A.8.16.71
5 DL FDD CA Event Triggered Reporting with Deactivated SCells in Non-DRX
p. 2815
A.8.16.71.1
Test Purpose and Environment
p. 2815
A.8.16.71.2
Test Requirements
p. 2820
A.8.16.72
5 DL TDD CA Event Triggered Reporting with Deactivated SCells in Non-DRX
p. 2820
A.8.16.72.1
Test Purpose and Environment
p. 2820
A.8.16.72.2
Test Requirements
p. 2825
A.8.16.73
5 DL FDD CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2825
A.8.16.73.1
Test Purpose and Environment
p. 2825
A.8.16.73.2
Test Requirements
p. 2832
A.8.16.74
5 DL TDD CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2832
A.8.16.74.1
Test Purpose and Environment
p. 2832
A.8.16.74.2
Test Requirements
p. 2838
A.8.16.75
5 DL FDD-TDD with PCell in FDD CA activation and deactivation of known SCell in non-DRX
p. 2838
A.8.16.75.1
Test Purpose and Environment
p. 2838
A.8.16.75.2
Test Requirements
p. 2844
A.8.16.76
5 DL FDD-TDD with PCell in TDD CA activation and deactivation of known SCell in non-DRX
p. 2844
A.8.16.76.1
Test Purpose and Environment
p. 2844
A.8.16.76.2
Test Requirements
p. 2850
A.8.16.77
5 DL FDD CA activation and deactivation of know SCell in non-DRX
p. 2850
A.8.16.77.1
Test Purpose and Environment
p. 2850
A.8.16.77.2
Test Requirements
p. 2854
A.8.16.78
5 DL TDD CA activation and deactivation of know SCell in non-DRX
p. 2854
A.8.16.78.1
Test Purpose and Environment
p. 2854
A.8.16.78.2
Test Requirements
p. 2856
A.8.16.79
E-UTRAN PCell in FDD FDD-TDD 4 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2857
A.8.16.79.1
Test Purpose and Environment
p. 2857
A.8.16.79.2
Test Requirements
p. 2864
A.8.16.80
E-UTRAN PCell in TDD TDD-FDD 4 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2864
A.8.16.80.1
Test Purpose and Environment
p. 2864
A.8.16.80.2
Test Requirements
p. 2871
A.8.16.81
E-UTRAN PCell in FDD FDD-TDD 5 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2871
A.8.16.81.1
Test Purpose and Environment
p. 2871
A.8.16.81.2
Test Requirements
p. 2877
A.8.16.82
E-UTRAN PCell in TDD TDD-FDD 5 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX
p. 2877
A.8.16.82.1
Test Purpose and Environment
p. 2877
A.8.16.82.2
Test Requirements
p. 2883
A.8.16.83
3 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes
p. 2883
A.8.16.83.1
Test Purpose and Environment
p. 2883
A.8.16.83.2
Test Requirements
p. 2888
A.8.16.84
3 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes
p. 2888
A.8.16.84.1
Test Purpose and Environment
p. 2888
A.8.16.84.2
Test Requirements
p. 2894
A.8.16.85
3 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes
p. 2894
A.8.16.85.1
Test Purpose and Environment
p. 2894
A.8.16.85.2
Test Requirements
p. 2898
A.8.16.86
3 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes
p. 2898
A.8.16.86.1
Test Purpose and Environment
p. 2898
A.8.16.86.2
Test Requirements
p. 2901
A.8.16.87
4 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes
p. 2901
A.8.16.87.1
Test Purpose and Environment
p. 2901
A.8.16.87.2
Test Requirements
p. 2907
A.8.16.88
4 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes
p. 2907
A.8.16.88.1
Test Purpose and Environment
p. 2907
A.8.16.88.2
Test Requirements
p. 2915
A.8.16.89
4 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes
p. 2915
A.8.16.89.1
Test Purpose and Environment
p. 2915
A.8.16.89.2
Test Requirements
p. 2922
A.8.16.90
4 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes
p. 2922
A.8.16.90.1
Test Purpose and Environment
p. 2922
A.8.16.90.2
Test Requirements
p. 2929
A.8.16.91
5 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes
p. 2929
A.8.16.91.1
Test Purpose and Environment
p. 2929
A.8.16.91.2
Test Requirements
p. 2935
A.8.16.92
5 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes
p. 2935
A.8.16.92.1
Test Purpose and Environment
p. 2935
A.8.16.92.2
Test Requirements
p. 2943
A.8.16.93
5 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes
p. 2943
A.8.16.93.1
Test Purpose and Environment
p. 2943
A.8.16.93.2
Test Requirements
p. 2950
A.8.16.94
5 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes
p. 2950
A.8.16.94.1
Test Purpose and Environment
p. 2950
A.8.16.94.2
Test Requirements
p. 2957
A.8.16.95
6 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes
p. 2957
A.8.16.95.1
Test Purpose and Environment
p. 2957
A.8.16.95.2
Test Requirements
p. 2965
A.8.16.96
6 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes
p. 2965
A.8.16.96.1
Test Purpose and Environment
p. 2965
A.8.16.96.2
Test Requirements
p. 2975
A.8.16.97
6 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes
p. 2975
A.8.16.97.1
Test Purpose and Environment
p. 2975
A.8.16.97.2
Test Requirements
p. 2982
A.8.16.98
6 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes
p. 2982
A.8.16.98.1
Test Purpose and Environment
p. 2982
A.8.16.98.2
Test Requirements
p. 2990
A.8.16.99
7 DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX with generic duplex modes
p. 2990
A.8.16.99.1
Test Purpose and Environment
p. 2990
A.8.16.99.2
Test Requirements
p. 3000
A.8.16.100
7 DL CA Event Triggered Reporting on Deactivated SCell with PCell and SCell Interruptions in Non-DRX with generic duplex modes
p. 3000
A.8.16.100.1
Test Purpose and Environment
p. 3000
A.8.16.100.2
Test Requirements
p. 3010
A.8.16.101
7 DL CA Activation and Deactivation of Known SCell in Non-DRX with generic duplex modes
p. 3010
A.8.16.101.1
Test Purpose and Environment
p. 3010
A.8.16.101.2
Test Requirements
p. 3020
A.8.16.102
7 DL CA Activation and Deactivation of Unknown SCell in Non-DRX with generic duplex modes
p. 3020
A.8.16.102.1
Test Purpose and Environment
p. 3020
A.8.16.102.2
Test Requirements
p. 3031
A.8.16.103
Hibernation and Activation of Known SCell in Non-DRX with generic duplex modes
p. 3031
A.8.16.103.1
Test Purpose and Environment
p. 3031
A.8.16.103.2
Test Requirements
p. 3036
A.8.16.104
Hibernation and Activation of Unknown SCell in Non-DRX with generic duplex modes
p. 3037
A.8.16.104.1
Test Purpose and Environment
p. 3037
A.8.16.104.2
Test Requirements
p. 3041
A.8.16.105
Idle Mode measurements of inter-frequency CA candidate cells for early reporting
p. 3042
A.8.16.105.1
Test Purpose and Environment
p. 3042
A.8.16.105.2
Test Requirements
p. 3046
A.8.16.106
Direct Activation of Known SCell in Non-DRX with generic duplex modes
p. 3047
A.8.16.106.1
Test Purpose and Environment
p. 3047
A.8.16.106.2
Test Requirements
p. 3051
A.8.16.107
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX with highSpeedEnhMeasFlag2-r16
p. 3051
A.8.16.107.1
Test Purpose and Environment
p. 3051
A.8.16.107.2
Test Requirements
p. 3053
A.8.16.108
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX with highSpeedEnhMeasFlag2-r16
p. 3054
A.8.16.108.1
Test Purpose and Environment
p. 3054
A.8.16.108.2
Test Requirements
p. 3056
A.8.17
RSTD Measurements for E-UTRAN Carrier Aggregation
p. 3057
A.8.17.1
E-UTRAN FDD RSTD measurement reporting delay test case
p. 3057
A.8.17.1.1
Test Purpose and Environment
p. 3057
A.8.17.1.2
Test Requirements
p. 3063
A.8.17.2
E-UTRAN TDD RSTD measurement reporting delay test case
p. 3063
A.8.17.2.1
Test Purpose and Environment
p. 3063
A.8.17.2.2
Test Requirements
p. 3070
A.8.17.3
E-UTRAN FDD RSTD Measurement Reporting Test Case for 20 MHz
p. 3070
A.8.17.3.1
Test Purpose and Environment
p. 3070
A.8.17.3.2
Test Requirements
p. 3071
A.8.17.4
E-UTRAN TDD RSTD Measurement Reporting Test Case for 20 MHz
p. 3071
A.8.17.4.1
Test Purpose and Environment
p. 3071
A.8.17.4.2
Test Requirements
p. 3072
A.8.17.5
E-UTRAN FDD RSTD Measurement Reporting Test Case for 10MHz+5MHz
p. 3072
A.8.17.5.1
Test Purpose and Environment
p. 3072
A.8.17.5.2
Test Requirements
p. 3073
A.8.17.6
E-UTRAN TDD RSTD Measurement Reporting Test Case for 10MHz+5MHz
p. 3073
A.8.17.6.1
Test Purpose and Environment
p. 3073
A.8.17.6.2
Test Requirements
p. 3074
A.8.17.7
E-UTRAN FDD RSTD Measurement Reporting Test Case for 5 + 5 MHz Bandwidth
p. 3075
A.8.17.7.1
Test Purpose and Environment
p. 3075
A.8.17.7.2
Test Requirements
p. 3075
A.8.17.8
E-UTRAN TDD RSTD Measurement Reporting Test Case for 5+5 MHz bandwidth
p. 3076
A.8.17.8.1
Test Purpose and Environment
p. 3076
A.8.17.8.2
Test Requirements
p. 3076
A.8.17.9
E-UTRAN TDD RSTD Measurement Reporting Test Case for 20MHz+10MHz
p. 3077
A.8.17.9.1
Test Purpose and Environment
p. 3077
A.8.17.9.2
Test Requirements
p. 3078
A.8.17.10
E-UTRAN 3 DL FDD CA RSTD Measurement Reporting Delay Test Case
p. 3078
A.8.17.10.1
Test Purpose and Environment
p. 3078
A.8.17.10.2
Test Requirements
p. 3085
A.8.17.11
E-UTRAN 3 DL TDD CA RSTD Measurement Reporting Delay Test Case
p. 3086
A.8.17.11.1
Test Purpose and Environment
p. 3086
A.8.17.11.2
Test Requirements
p. 3092
A.8.18
E-UTRAN TDD - HRPD Measurements
p. 3093
A.8.18.1
E-UTRAN TDD-HRPD event triggered reporting under fading propagation conditions
p. 3093
A.8.18.1.1
Test Purpose and Environment
p. 3093
A.8.18.1.2
Test Requirements
p. 3095
A.8.19
E-UTRAN TDD - CDMA2000 1X Measurements
p. 3095
A.8.19.1
E-UTRAN TDD - CDMA2000 1X event triggered reporting under fading propagation conditions
p. 3095
A.8.19.1.1
Test Purpose and Environment
p. 3095
A.8.19.1.2
Test Requirements
p. 3096
A.8.20
Inter-frequency/RAT Measurements in CA mode
p. 3097
A.8.20.1
E-UTRAN FDD-FDD Inter-frequency event triggered reporting under fading propagation conditions in asynchronous cells
p. 3097
A.8.20.1.1
Test Purpose and Environment
p. 3097
A.8.20.1.2
Test Requirements
p. 3098
A.8.20.2
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells
p. 3098
A.8.20.2.1
Test Purpose and Environment
p. 3099
A.8.20.2.2
Test Requirements
p. 3100
A.8.20.2A
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells for 20 MHz +20 MHz bandwidth.
p. 3101
A.8.20.2A.1
Test Purpose and Environment
p. 3101
A.8.20.2A.2
Test Requirements
p. 3101
A.8.20.2B
E-UTRAN TDD-TDD Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells for 20 MHz +10 MHz bandwidth.
p. 3101
A.8.20.2B.1
Test Purpose and Environment
p. 3101
A.8.20.2B.2
Test Requirements
p. 3104
A.8.20.3
E-UTRAN FDD - UTRAN FDD event triggered reporting under fading propagation conditions
p. 3104
A.8.20.3.1
Test Purpose and Environment
p. 3104
A.8.20.3.2
Test Requirements
p. 3106
A.8.20.4
E-UTRAN TDD to UTRAN TDD cell search under fading propagation conditions
p. 3106
A.8.20.4.1
Test Purpose and Environment
p. 3106
A.8.20.4.1.1
1.28 Mcps TDD option
p. 3106
A.8.20.4.2
Test Requirements
p. 3108
A.8.20.4.2.1
1.28 Mcps TDD option
p. 3108
A.8.20.4A
E-UTRAN TDD with 20 MHz +20 MHz bandwidth to UTRAN TDD cell search under fading propagation conditions
p. 3108
A.8.20.4A.1
Test Purpose and Environment
p. 3108
A.8.20.4A.1.1
1.28 Mcps TDD option
p. 3108
A.8.20.4A.2
Test Requirements
p. 3108
A.8.20.4A.2.1
1.28 Mcps TDD option
p. 3108
A.8.20.4B
E-UTRAN TDD with 20 MHz +10 MHz bandwidth to UTRAN TDD cell search under fading propagation conditions
p. 3109
A.8.20.4B.1
Test Purpose and Environment
p. 3109
A.8.20.4B.1.1
1.28 Mcps TDD option
p. 3109
A.8.20.4B.2
Test Requirements
p. 3111
A.8.20.4B.2.1
1.28 Mcps TDD option
p. 3111
A.8.21
CSG Proximity Indication Testing Case for E-UTRAN FDD - FDD Inter frequency
p. 3111
A.8.21.1
Test Purpose and Environment
p. 3111
A.8.21.2
Test Requirements
p. 3115
A.8.22
E-UTRAN Discovery Signal Measurements
p. 3115
A.8.22.1
E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in DRX based on CRS based discovery signal
p. 3115
A.8.22.1.1
Test Purpose and Environment
p. 3115
A.8.22.1.2
Test Requirements
p. 3118
A.8.22.2
E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in DRX based on CRS based discovery signal
p. 3118
A.8.22.2.1
Test Purpose and Environment
p. 3118
A.8.22.2.2
Test Requirements
p. 3121
A.8.22.3
E-UTRAN FDD-FDD inter-frequency event triggered reporting under fading propagation conditions in DRX based on CRS based discovery signal
p. 3121
A.8.22.3.1
Test Purpose and Environment
p. 3121
A.8.22.3.2
Test Requirements
p. 3124
A.8.22.4
E-UTRAN TDD-TDD inter-frequency event triggered reporting under fading propagation conditions in DRX based on CRS based discovery signal
p. 3124
A.8.22.4.1
Test Purpose and Environment
p. 3124
A.8.22.4.2
Test Requirements
p. 3127
A.8.22.5
E-UTRAN FDD-FDD intra-frequency event triggered reporting in DRX based on CSI-RS based discovery signal
p. 3127
A.8.22.5.1
Test Purpose and Environment
p. 3127
A.8.22.5.2
Test Requirements
p. 3131
A.8.22.6
E-UTRAN TDD-TDD intra-frequency event triggered reporting in DRX based on CSI-RS based discovery signal
p. 3131
A.8.22.6.1
Test Purpose and Environment
p. 3131
A.8.22.6.2
Test Requirements
p. 3135
A.8.22.7
E-UTRAN FDD-FDD Inter-frequency event triggered reporting in DRX based on CSI-RS based discovery signal
p. 3135
A.8.22.7.1
Test Purpose and Environment
p. 3135
A.8.22.7.2
Test Requirements
p. 3139
A.8.22.8
E-UTRAN TDD-TDD inter-frequency event triggered reporting under fading propagation condition in DRX based on CSI-RS based discovery signal
p. 3139
A.8.22.8.1
Test Purpose and Environment
p. 3139
A.8.22.8.2
Test Requirements
p. 3143
A.8.22.9
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX based on CRS based discovery signal
p. 3143
A.8.22.9.1
Test Purpose and Environment
p. 3143
A.8.22.9.2
Test Requirements
p. 3145
A.8.22.10
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX based on CRS based discovery signal
p. 3146
A.8.22.10.1
Test Purpose and Environment
p. 3146
A.8.22.10.2
Test Requirements
p. 3148
A.8.22.11
E-UTRAN FDD event triggered reporting under deactivated SCell in non-DRX based on CSI-RS based discovery signal
p. 3149
A.8.22.11.1
Test Purpose and Environment
p. 3149
A.8.22.11.2
Test Requirements
p. 3152
A.8.22.12
E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX based on CSI-RS based discovery signal
p. 3152
A.8.22.12.1
Test Purpose and Environment
p. 3152
A.8.22.12.2
Test Requirements
p. 3156
A.8.23
E-UTRAN Dual Connectivity Measurements
p. 3156
A.8.23.1
E-UTRAN FDD-FDD DC intra-frequency event triggered reporting with DRX in synchronous DC
p. 3156
A.8.23.1.1
Test Purpose and Environment
p. 3156
A.8.23.1.2
Test Requirements
p. 3159
A.8.23.2
E-UTRAN FDD-FDD DC intra-frequency event triggered reporting with DRX in asynchronous DC
p. 3159
A.8.23.2.1
Test Purpose and Environment
p. 3159
A.8.23.2.2
Test Requirements
p. 3162
A.8.23.3
E-UTRAN TDD-TDD DC intra-frequency event triggered reporting with DRX in synchronous DC
p. 3162
A.8.23.3.1
Test Purpose and Environment
p. 3162
A.8.23.3.2
Test Requirements
p. 3165
A.8.23.4
E-UTRAN FDD-FDD DC inter-frequency event triggered reporting with DRX in synchronous DC
p. 3165
A.8.23.4.1
Test Purpose and Environment
p. 3165
A.8.23.4.2
Test Requirements
p. 3168
A.8.23.5
E-UTRAN FDD-FDD DC inter-frequency event triggered reporting with DRX in asynchronous DC
p. 3168
A.8.23.5.1
Test Purpose and Environment
p. 3168
A.8.23.5.2
Test Requirements
p. 3171
A.8.23.6
E-UTRAN TDD-TDD DC inter-frequency event triggered reporting with DRX in synchronous DC
p. 3171
A.8.23.6.1
Test Purpose and Environment
p. 3171
A.8.23.6.2
Test Requirements
p. 3174
A.8.23.7
E-UTRAN FDD-FDD Addition and Release Delay of known PSCell in Synchronous DC
p. 3174
A.8.23.7.1
Test Purpose and Environment
p. 3174
A.8.23.7.2
Test Requirements
p. 3176
A.8.23.8
E-UTRAN FDD-FDD Addition and Release Delay of known PSCell in Asynchronous DC
p. 3177
A.8.23.8.1
Test Purpose and Environment
p. 3177
A.8.23.8.2
Test Requirements
p. 3179
A.8.23.9
E-UTRAN TDD Addition and Release Delay of known PSCell in Synchronous DC
p. 3180
A.8.23.9.1
Test Purpose and Environment
p. 3180
A.8.23.9.2
Test Requirements
p. 3183
A.8.23.10
E-UTRAN TDD-FDD DC intra-frequency event triggered reporting with DRX in synchronous DC with PCell in FDD
p. 3183
A.8.23.10.1
Test Purpose and Environment
p. 3183
A.8.23.10.2
Test Requirements
p. 3186
A.8.23.11
E-UTRAN TDD-FDD DC intra-frequency event triggered reporting with DRX in synchronous DC with PCell in TDD
p. 3186
A.8.23.11.1
Test Purpose and Environment
p. 3186
A.8.23.11.2
Test Requirements
p. 3189
A.8.23.12
E-UTRAN TDD-FDD DC inter-frequency event triggered reporting with DRX in synchronous DC with PCell in FDD
p. 3189
A.8.23.12.1
Test Purpose and Environment
p. 3189
A.8.23.12.2
Test Requirements
p. 3192
A.8.23.13
E-UTRAN TDD-FDD DC inter-frequency event triggered reporting with DRX in synchronous DC with PCell in TDD
p. 3192
A.8.23.13.1
Test Purpose and Environment
p. 3192
A.8.23.13.2
Test Requirements
p. 3195
A.8.23.14
E-UTRAN TDD-FDD Addition and Release Delay of known PSCell in Synchronous DC with PCell in FDD
p. 3195
A.8.23.14.1
Test Purpose and Environment
p. 3195
A.8.23.14.2
Test Requirements
p. 3198
A.8.23.15
E-UTRAN TDD-FDD Addition and Release Delay of known PSCell in Synchronous DC with PCell in TDD
p. 3198
A.8.23.15.1
Test Purpose and Environment
p. 3198
A.8.23.15.2
Test Requirements
p. 3201
A.8.23.16
E-UTRAN FDD-FDD DC SSTD measurement reporting delay with no DRX in asynchronous DC
p. 3201
A.8.23.16.1
Test Purpose and Environment
p. 3201
A.8.23.16.2
Test Requirements
p. 3202
A.8.23.17
E-UTRAN FDD-FDD DC SSTD measurement reporting delay with DRX in asynchronous DC
p. 3203
A.8.23.17.1
Test Purpose and Environment
p. 3203
A.8.23.17.2
Test Requirements
p. 3205
A.8.23.18
E-UTRAN FDD - FDD DC Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in synchronous DC
p. 3205
A.8.23.18.1
Test Purpose and Environment
p. 3205
A.8.23.18.2
Test Requirements
p. 3206
A.8.23.19
E-UTRAN FDD - FDD DC Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in asynchronous DC
p. 3207
A.8.23.19.1
Test Purpose and Environment
p. 3207
A.8.23.19.2
Test Requirements
p. 3208
A.8.23.20
E-UTRAN TDD - TDD DC Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in synchronous DC
p. 3209
A.8.23.20.1
Test Purpose and Environment
p. 3209
A.8.23.20.2
Test Requirements
p. 3210
A.8.23.21
E-UTRAN FDD - FDD DC Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in synchronous DC
p. 3211
A.8.23.21.1
Test Purpose and Environment
p. 3211
A.8.23.21.2
Test Requirements
p. 3212
A.8.23.22
E-UTRAN FDD - FDD DC Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in asynchronous DC
p. 3213
A.8.23.22.1
Test Purpose and Environment
p. 3213
A.8.23.22.2
Test Requirements
p. 3214
A.8.23.23
E-UTRAN TDD - TDD DC Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps in synchronous DC
p. 3215
A.8.23.23.1
Test Purpose and Environment
p. 3215
A.8.23.23.2
Test Requirements
p. 3216
A.8.23.24
E-UTRAN FDD-FDD DC activation and deactivation of known SCell in Non-DRX in synchronous DC
p. 3217
A.8.23.24.1
Test Purpose and Environment
p. 3217
A.8.23.24.2
Test Requirements
p. 3219
A.8.23.25
E-UTRAN FDD-FDD DC activation and deactivation of known SCell in Non-DRX in asynchronous DC
p. 3220
A.8.23.25.1
Test Purpose and Environment
p. 3220
A.8.23.25.2
Test Requirements
p. 3222
A.8.23.26
E-UTRAN TDD-TDD DC activation and deactivation of known SCell in Non-DRX in synchronous DC
p. 3223
A.8.23.26.1
Test Purpose and Environment
p. 3223
A.8.23.26.2
Test Requirements
p. 3225
A.8.23.27
E-UTRAN FDD-FDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in synchronous DC
p. 3226
A.8.23.27.1
Test Purpose and Environment
p. 3226
A.8.23.27.2
Test Requirements
p. 3229
A.8.23.28
E-UTRAN FDD-FDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in asynchronous DC
p. 3229
A.8.23.28.1
Test Purpose and Environment
p. 3229
A.8.23.28.2
Test Requirements
p. 3233
A.8.23.29
E-UTRAN TDD-TDD DC event triggered reporting under deactivated SCell with PCell and PSCell interruption in non-DRX in synchronous DC
p. 3233
A.8.23.29.1
Test Purpose and Environment
p. 3233
A.8.23.29.2
Test Requirements
p. 3237
A.8.24
Proximity-based Services
p. 3237
A.8.24.1
E-UTRAN FDD - Initiation/Cease of SLSS Transmission with ProSe Direct Discovery
p. 3237
A.8.24.1.1
Test Purpose and Environment
p. 3237
A.8.24.1.2
Test Requirements
p. 3238
A.8.24.2
E-UTRAN TDD - Initiation/Cease of SLSS Transmission with ProSe Direct Discovery
p. 3239
A.8.24.2.1
Test Purpose and Environment
p. 3239
A.8.24.2.2
Test Requirements
p. 3240
A.8.24.3
E-UTRAN FDD - Initiation/Cease of SLSS Transmission with ProSe Direct Communication
p. 3240
A.8.24.3.1
Test Purpose and Environment
p. 3241
A.8.24.3.2
Test Requirements
p. 3242
A.8.25
E-UTRAN-WLAN Measurements
p. 3243
A.8.25.1
E-UTRAN FDD-WLAN Event Triggered Reporting in non-DRX under AWGN
p. 3243
A.8.25.1.1
Test Purpose and Environment
p. 3243
A.8.25.1.2
Test Requirements
p. 3245
A.8.25.2
E-UTRAN TDD-WLAN Event Triggered Reporting in non-DRX under AWGN
p. 3245
A.8.25.2.1
Test Purpose and Environment
p. 3245
A.8.25.2.2
Test Requirements
p. 3247
A.8.26
Frame Structure 3 (FS3)
p. 3247
A.8.26.1
E-UTRAN FDD-FS3 Activation and deactivation of known FS3 SCell with FDD PCell in non-DRX
p. 3247
A.8.26.1.1
Test Purpose and Environment
p. 3247
A.8.26.1.2
Test Requirements
p. 3249
A.8.26.2
E-UTRAN TDD-FS3 Activation and deactivation of known FS3 SCell with TDD PCell in non-DRX
p. 3250
A.8.26.2.1
Test Purpose and Environment
p. 3250
A.8.26.2.2
Test Requirements
p. 3252
A.8.26.3
E-UTRAN FDD-FS3 Event triggered reporting on deactivated FS3 SCell and FDD PCell interruption in non-DRX
p. 3253
A.8.26.3.1
Test Purpose and Environment
p. 3253
A.8.26.3.2
Test Requirements
p. 3256
A.8.26.3A
E-UTRAN FDD-TDD 3DL Event triggered reporting on deactivated FS3 SCell and FDD PCell interruption in non-DRX
p. 3256
A.8.26.3A.1
Test Purpose and Environment
p. 3256
A.8.26.3A.2
Test Requirements
p. 3259
A.8.26.4
E-UTRAN TDD-FS3 Event triggered reporting on deactivated FS3 SCell and TDD PCell interruption in non-DRX
p. 3259
A.8.26.4.1
Test Purpose and Environment
p. 3259
A.8.26.4.2
Test Requirements
p. 3263
A.8.26.4A
E-UTRAN TDD-TDD 3DL Event triggered reporting on deactivated FS3 SCell and FDD PCell interruption in non-DRX
p. 3263
A.8.26.4A.1
Test Purpose and Environment
p. 3263
A.8.26.4A.2
Test Requirements
p. 3267
A.8.26.5
E-UTRAN FDD-FS3 Intra-frequency event triggered reporting in non-DRX for CRS based discovery signal
p. 3267
A.8.26.5.1
Test Purpose and Environment
p. 3267
A.8.26.5.2
Test Requirements
p. 3270
A.8.26.5A
E-UTRAN FDD-FS3 Intra-frequency event triggered reporting in non-DRX for CRS based discovery signal with 2 SCells
p. 3270
A.8.26.5A.1
Test Purpose and Environment
p. 3270
A.8.26.5A.2
Test Requirements
p. 3274
A.8.26.6
E-UTRAN TDD-FS3 Intra-frequency event triggered reporting in non-DRX for CRS based discovery signal
p. 3274
A.8.26.6.1
Test Purpose and Environment
p. 3274
A.8.26.6.2
Test Requirements
p. 3278
A.8.26.6A
E-UTRAN TDD-FS3 Intra-frequency event triggered reporting in non-DRX for CRS based discovery signal with 2 SCells
p. 3278
A.8.26.6A.1
Test Purpose and Environment
p. 3278
A.8.26.6A.2
Test Requirements
p. 3282
A.8.26.7
E-UTRAN FDD-FS3 Intra-frequency event triggered reporting in DRX for CRS based discovery signal
p. 3282
A.8.26.7.1
Test Purpose and Environment
p. 3282
A.8.26.7.2
Test Requirements
p. 3285
A.8.26.8
E-UTRAN TDD-FS3 Intra-frequency event triggered reporting in DRX for CRS based discovery signal
p. 3285
A.8.26.8.1
Test Purpose and Environment
p. 3285
A.8.26.8.2
Test Requirements
p. 3289
A.8.26.9
E-UTRAN FDD-FS3 Inter-frequency event triggered reporting under fading propagation conditions in synchronous cells
p. 3289
A.8.26.9.1
Test Purpose and Environment
p. 3289
A.8.26.9.2
Test Requirements
p. 3292
A.8.26.10
E-UTRAN TDD-FS3 inter-frequency event triggered reporting under fading propagation conditions in synchronous cells
p. 3292
A.8.26.10.1
Test Purpose and Environment
p. 3292
A.8.26.10.2
Test Requirements
p. 3295