Content for TR 37.941 Word version: 18.1.0
12 Out-of-band TRP requirements
13 Co-location requirements
14 Out-of-band blocking requirements
15 Demodulation performance requirements
16 EMC requirements
17 Measurement Uncertainty values summary
18 Test Tolerance values summary
A Radiated TX measurement error contribution descriptions
B Radiated RX measurement error contribution descriptions
C Test equipment uncertainty values
D Beam sweeping
E Sparse sampling for spurious emissions
F Power density measurements close to BS
G Excel spreadsheets for MU derivation
$ Change history
12 Out-of-band TRP requirements p. 251
12.1 General p. 251
12.2 Transmitter mandatory spurious emissions p. 251
12.2.1 General p. 251
12.2.2 General Chamber p. 252
12.2.2.1 Measurement system description p. 252
12.2.2.2 Test procedure p. 253
12.2.2.3 MU value derivation, FR1 p. 253
12.2.2.4 MU value derivation, FR2 p. 257
12.2.3 Compact Antenna Test Range p. 259
12.2.3.1 Measurement system description p. 259
12.2.3.2 Test procedure p. 259
12.2.3.3 MU value derivation, FR2 p. 259
12.2.4 Reverberation chamber p. 260
12.2.4.1 Measurement system description p. 260
12.2.4.2 Test procedure p. 261
12.2.4.3 MU value derivation p. 261
12.2.5 Maximum accepted test system uncertainty p. 263
12.2.6 Test Tolerance for OTA TX spurious emissions p. 264
12.3 Receiver spurious emissions p. 264
12.3.1 General p. 264
12.3.2 General Chamber p. 265
12.3.2.1 Measurement system description p. 265
12.3.2.2 Test procedure p. 265
12.3.2.3 MU value derivation, FR1 p. 265
12.3.3 Maximum accepted test system uncertainty p. 268
12.3.4 Test Tolerance for OTA RX spurious emissions p. 269
12.4 Additional (co-existence) spurious emissions p. 269
12.4.1 General p. 269
12.4.2 Compact Antenna Test Range p. 270
12.4.2.1 Measurement system description p. 270
12.4.2.2 Test procedure p. 270
12.4.2.3 MU value derivation, FR1 p. 270
12.4.3 Maximum accepted test system uncertainty p. 271
12.4.4 Test Tolerance for additional spurious emissions requirements p. 272
13 Co-location requirements p. 272
13.1 General p. 272
13.2 OTA transmitter OFF power p. 272
13.2.1 General p. 272
13.2.2 General Chamber p. 273
13.2.2.1 Measurement system description p. 273
13.2.2.2 Test procedure p. 273
13.2.2.3 MU value derivation, FR1 p. 274
13.2.3 Maximum accepted test system uncertainty p. 275
13.2.4 Test Tolerance for OTA TX OFF power p. 275
13.3 OTA co-location spurious emissions p. 275
13.3.1 General p. 275
13.3.2 General Chamber p. 275
13.3.2.1 Measurement system description p. 275
13.3.2.2 Test procedure p. 276
13.3.2.3 MU value derivation, FR1 p. 276
13.3.3 Maximum accepted test system uncertainty p. 277
13.3.4 Test Tolerance co-location spurious emissions p. 278
13.4 OTA transmitter intermodulation p. 278
13.4.1 General p. 278
13.4.2 General Chamber p. 278
13.4.2.1 Measurement system description p. 278
13.4.2.2 Test procedure p. 278
13.4.2.3 MU value derivation, FR1 p. 279
13.4.3 Maximum accepted test system uncertainty p. 279
13.4.4 Test Tolerance co-location spurious emissions p. 280
13.5 OTA co-location blocking p. 280
14 Out-of-band blocking requirements p. 282
14.1 General p. 282
14.2 General Chamber p. 283
14.2.1 Measurement system description p. 283
14.2.2 Test procedure p. 283
14.2.3 MU value derivation, FR1 p. 284
14.2.4 MU value derivation, FR2 p. 285
14.3 Maximum accepted test system uncertainty p. 286
14.4 Test Tolerance for OOB blocking p. 286
15 Demodulation performance requirements p. 286
15.1 General p. 286
15.2 BS demodulation requirements feasible OTA p. 286
15.3 OTA test setup for BS demodulation requirements p. 288
15.4 Indoor Anechoic Chamber p. 289
15.4.1 Measurement system description p. 289
15.4.2 Test procedure p. 290
15.4.3 MU value derivation, FR1 p. 290
15.5 Compact Antenna Test Range p. 291
15.5.1 Measurement system description p. 291
15.5.2 Test procedure p. 291
15.5.3 MU value derivation, FR1 p. 291
15.6 Maximum accepted test system uncertainty p. 291
15.7 Test Tolerance for OTA demodulation requirements p. 291
16 EMC requirements p. 292
16.1 BS ports for the EMC purposes p. 292
16.2 Field strength in EMC chamber p. 292
16.2.1 General p. 292
16.2.2 Conversion between dBm to V/m p. 293
16.3 Protection of measurement equipment p. 293
16.4 Emission requirements p. 294
16.5 Radiated immunity requirements p. 295
17 Measurement Uncertainty values summary p. 298
18 Test Tolerance values summary p. 301
A Radiated TX measurement error contribution descriptions p. 305
A.1 Indoor Anechoic Chamber p. 305
A.2 Compact Antenna Test Range p. 307
A.3 Near Field Test Range p. 310
A.4 One Dimensional Compact Range p. 313
A.5 General Chamber p. 315
A.6 Reverberation Chamber p. 317
A.7 Plane Wave Synthesizer p. 318
B Radiated RX measurement error contribution descriptions p. 320
B.1 Indoor Anechoic Chamber p. 320
B.2 Compact Antenna Test Range p. 322
B.3 Near Field Test Range p. 323
B.4 One Dimensional Compact Range p. 326
B.5 Plane Wave Synthesizer p. 328
C Test equipment uncertainty values p. 330
C.1 Test equipment measurement error contribution descriptions p. 330
C.2 Measurement Equipment uncertainty values p. 332
C.3 MU of TE derived from conducted specification p. 334
D Beam sweeping p. 336
D.1 Introduction p. 336
D.2 Simulation results p. 336
D.3 Measurement results p. 337
D.4 Design of beam sweeping test signal p. 339
E Sparse sampling for spurious emissions p. 340
F Power density measurements close to BS p. 345
G Excel spreadsheets for MU derivation p. 347
$ Change history p. 348
