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Content for
TR 37.941
Word version: 16.2.0
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2…
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12…
12
Out-of-band TRP requirements
13
Co-location requirements
14
Out-of-band blocking requirements
15
Demodulation performance requirements
16
EMC requirements
17
Measurement Uncertainty values summary
18
Test Tolerance values summary
A
Radiated TX measurement error contribution descriptions
B
Radiated RX measurement error contribution descriptions
C
Test equipment uncertainty values
D
Beam sweeping
E
Sparse sampling for spurious emissions
F
Power density measurements close to BS
G
Excel spreadsheets for MU derivation
$
Change history
12
Out-of-band TRP requirements
Word‑p. 233
12.1
General
12.2
Transmitter mandatory spurious emissions
12.2.1
General
12.2.2
General chamber
Word‑p. 234
12.2.2.1
Measurement system description
12.2.2.2
Test procedure
12.2.2.2.1
Stage 1: Calibration
12.2.2.2.2
Stage 2: BS measurement
Word‑p. 235
12.2.2.3
MU value derivation, FR1
12.2.2.4
MU value derivation, FR2
Word‑p. 238
12.2.3
Compact Antenna Test Range
Word‑p. 240
12.2.3.1
Measurement system description
12.2.3.2
Test procedure
12.2.3.2.1
Stage 1: Calibration
12.2.3.2.2
Stage 2: BS measurement
12.2.3.3
MU value derivation, FR2
12.2.4
Reverberation chamber
Word‑p. 241
12.2.4.1
Measurement system description
12.2.4.2
Test procedure
Word‑p. 242
12.2.4.2.1
Stage 1: Calibration
12.2.4.2.2
Stage 2: BS measurement
12.2.4.3
MU value derivation
12.2.5
Maximum accepted test system uncertainty
Word‑p. 244
12.2.6
Test Tolerance for OTA TX spurious emissions
Word‑p. 245
12.3
Receiver spurious emissions
12.3.1
General
12.3.2
General Chamber
12.3.2.1
Measurement system description
12.3.2.2
Test procedure
12.3.2.2.1
Stage 1: Calibration
12.3.2.2.2
Stage 2: BS measurement
Word‑p. 246
12.3.2.3
MU value derivation, FR1
12.3.3
Maximum accepted test system uncertainty
Word‑p. 249
12.3.4
Test Tolerance for OTA RX spurious emissions
Word‑p. 250
12.4
Additional (co-existence) spurious emissions
12.4.1
General
12.4.2
Compact Antenna Test Range
12.4.2.1
Measurement system description
12.4.2.2
Test procedure
Word‑p. 251
12.4.2.2.1
Stage 1: Calibration
12.4.2.2.2
Stage 2: BS measurement
12.4.2.3
MU value derivation, FR1
12.4.3
Maximum accepted test system uncertainty
Word‑p. 252
12.4.4
Test Tolerance for additional spurious emissions requirements
Word‑p. 253
13
Co-location requirements
13.1
General
13.2
OTA transmitter OFF power
13.2.1
General
13.2.2
General Chamber
Word‑p. 254
13.2.2.1
Measurement system description
13.2.2.2
Test procedure
13.2.2.2.1
Stage 1: Calibration
13.2.2.2.2
Stage 2: measurement
13.2.2.3
MU value derivation, FR1
Word‑p. 255
13.2.3
Maximum accepted test system uncertainty
Word‑p. 256
13.2.4
Test Tolerance for OTA TX OFF power
13.3
OTA co-location spurious emissions
13.3.1
General
13.3.2
General Chamber
13.3.2.1
Measurement system description
13.3.2.2
Test procedure
Word‑p. 257
13.3.2.2.1
Stage 1: Calibration
13.3.2.2.2
Stage 2: BS measurement
13.3.2.3
MU value derivation, FR1
13.3.3
Maximum accepted test system uncertainty
Word‑p. 258
13.3.4
Test Tolerance co-location spurious emissions
Word‑p. 259
13.4
OTA transmitter intermodulation
13.4.1
General
13.4.2
General Chamber
13.4.2.1
Measurement system description
13.4.2.2
Test procedure
13.4.2.2.1
Stage 1: Calibration
13.4.2.2.2
Stage 2: BS measurement
13.4.2.3
MU value derivation, FR1
Word‑p. 260
13.4.3
Maximum accepted test system uncertainty
13.4.4
Test Tolerance co-location spurious emissions
Word‑p. 261
13.5
OTA co-location blocking
13.5.1
General
13.5.2
General Chamber
13.5.2.1
Measurement system description
13.5.2.2
Test procedure
13.5.2.2.1
Stage 1: Calibration
13.5.2.2.2
Stage 2: BS measurement
13.5.2.3
MU value derivation, FR1
Word‑p. 262
13.5.3
Maximum accepted test system uncertainty
13.5.4
Test Tolerance for OTA co-location blocking
Word‑p. 263
14
Out-of-band blocking requirements
14.1
General
14.2
General Chamber
Word‑p. 264
14.2.1
Measurement system description
14.2.2
Test procedure
14.2.2.1
Stage 1: Calibration
14.2.2.2
Stage 2: BS measurement
14.2.3
MU value derivation, FR1
Word‑p. 265
14.2.4
MU value derivation, FR2
Word‑p. 266
14.3
Maximum accepted test system uncertainty
Word‑p. 267
14.4
Test Tolerance for OOB blocking
15
Demodulation performance requirements
15.1
General
15.2
BS demodulation requirements feasible OTA
15.3
OTA test setup for BS demodulation requirements
Word‑p. 269
15.4
Indoor Anechoic Chamber
Word‑p. 270
15.4.1
Measurement system description
15.4.2
Test procedure
Word‑p. 271
15.4.2.1
Stage 1: Calibration
15.4.2.2
Stage 2: BS measurement
15.4.3
MU value derivation, FR1
15.5
Compact Antenna Test Range
Word‑p. 272
15.5.1
Measurement system description
15.5.2
Test procedure
15.5.2.1
Stage 1: Calibration
15.5.2.2
Stage 2: BS measurement
15.5.3
MU value derivation, FR1
15.6
Maximum accepted test system uncertainty
15.7
Test Tolerance for OTA demodulation requirements
16
EMC requirements
Word‑p. 273
16.1
BS ports for the EMC purposes
16.2
Field strength in EMC chamber
16.2.1
General
16.2.2
Conversion between dBm to V/m
Word‑p. 274
16.3
Protection of measurement equipment
16.4
Emission requirements
Word‑p. 275
16.5
Radiated immunity requirements
Word‑p. 276
16.5.1
General
16.5.2
Measurement set-up for testing radiated immunity
16.5.3
Alternatives to protect BS type 1-O during RI test
16.5.3.1
Exclusion bands
Word‑p. 277
16.5.3.2
Spatial exclusion
17
Measurement Uncertainty values summary
Word‑p. 279
18
Test Tolerance values summary
Word‑p. 282
A
Radiated TX measurement error contribution descriptions
Word‑p. 286
A.1
Indoor Anechoic Chamber
A.2
Compact Antenna Test Range
Word‑p. 288
A.3
Near Field Test Range
Word‑p. 291
A.4
One Dimensional Compact Range
Word‑p. 294
A.5
General Chamber
Word‑p. 296
A.6
Reverberation Chamber
Word‑p. 298
A.7
Plane Wave Synthesizer
Word‑p. 299
B
Radiated RX measurement error contribution descriptions
Word‑p. 301
B.1
Indoor Anechoic Chamber
B.2
Compact Antenna Test Range
Word‑p. 303
B.3
Near Field Test Range
Word‑p. 304
B.4
One Dimensional Compact Range
Word‑p. 307
B.5
Plane Wave Synthesizer
Word‑p. 309
C
Test equipment uncertainty values
Word‑p. 311
C.1
Test equipment measurement error contribution descriptions
C.2
Measurement Equipment uncertainty values
Word‑p. 312
C.3
MU of TE derived from conducted specification
Word‑p. 313
D
Beam sweeping
Word‑p. 315
D.1
Introduction
D.2
Simulation results
D.3
Measurement results
Word‑p. 316
D.4
Design of beam sweeping test signal
Word‑p. 318
E
Sparse sampling for spurious emissions
Word‑p. 319
F
Power density measurements close to BS
Word‑p. 324
G
Excel spreadsheets for MU derivation
Word‑p. 326
$
Change history
Word‑p. 327