Content for TR 37.941 Word version: 18.1.0
10 RX directional requirements
10.1 General
10.2 OTA sensitivity
10.3 OTA reference sensitivity
10.4 OTA dynamic range
10.5 OTA adjacent channel selectivity, general blocking and narrowband blocking
10.6 OTA receiver intermodulation
10.7 OTA in-channel selectivity
11 In-band TRP requirements
11.1 General
11.2 OTA BS output power
11.3 OTA ACLR
11.4 OTA SEM and OTA OBUE
10 RX directional requirements p. 162
10.1 General p. 162
10.2 OTA sensitivity p. 163
10.2.1 General p. 163
10.2.2 Indoor Anechoic Chamber p. 163
10.2.2.1 Measurement system description p. 163
10.2.2.2 Test procedure p. 163
10.2.2.3 MU value derivation, FR1 p. 164
10.2.2.4 MU value derivation, FR2 p. 167
10.2.3 Compact Antenna Test Range p. 170
10.2.3.1 Measurement system description p. 170
10.2.3.2 Test procedure p. 170
10.2.3.3 MU value derivation, FR1 p. 170
10.2.3.4 MU value derivation, FR2 p. 171
10.2.4 One Dimensional Compact Range p. 172
10.2.4.1 Measurement system description p. 172
10.2.4.2 Test procedure p. 173
10.2.4.3 MU value derivation, FR1 p. 173
10.2.5 Near Field Test range p. 175
10.2.5.1 Measurement system description p. 175
10.2.5.2 Test procedure p. 175
10.2.5.3 MU value derivation, FR1 p. 176
10.2.6 Plane Wave Synthesizer p. 179
10.2.6.1 Measurement system description p. 179
10.2.6.2 Test procedure p. 179
10.2.6.3 MU value derivation, FR1 p. 179
10.2.7 Maximum accepted test system uncertainty p. 181
10.2.8 Test Tolerance for OTA sensitivity p. 181
10.3 OTA reference sensitivity p. 182
10.4 OTA dynamic range p. 182
10.4.1 General p. 182
10.4.2 Indoor Anechoic Chamber p. 182
10.4.2.1 Measurement system description p. 182
10.4.2.2 Test procedure p. 182
10.4.2.3 MU value derivation, FR1 p. 183
10.4.3 Compact Antenna Test Range p. 183
10.4.3.1 Measurement system description p. 183
10.4.3.2 Test procedure p. 183
10.4.3.3 MU value derivation, FR1 p. 183
10.4.3A Plane Wave Synthesizer p. 183
10.4.3A.2 Test procedure p. 184
10.4.3A.3 MU value derivation, FR1 p. 184
10.4.4 Maximum accepted test system uncertainty p. 184
10.4.5 Test Tolerance for OTA dynamic range p. 184
10.5 OTA adjacent channel selectivity, general blocking and narrowband blocking p. 185
10.5.1 General p. 185
10.5.2 Indoor Anechoic Chamber p. 185
10.5.2.1 Measurement system description p. 185
10.5.2.2 Test procedure p. 185
10.5.2.3 MU value derivation, FR1 p. 185
10.5.3 Compact Antenna Test Range p. 186
10.5.3.1 Measurement system description p. 186
10.5.3.2 Test procedure p. 187
10.5.3.3 MU value derivation, FR1 p. 187
10.5.3A Plane Wave Synthesizer p. 188
10.5.3A.1 Measurement system description p. 188
10.5.3A.2 Test procedure p. 188
10.5.3A.3 MU value derivation, FR1 p. 189
10.5.4 Maximum accepted test system uncertainty p. 189
10.5.5 Test Tolerance for OTA ACS, general blocking and narrowband blocking p. 191
10.6 OTA receiver intermodulation p. 191
10.6.1 General p. 191
10.6.2 Indoor Anechoic Chamber p. 191
10.6.2.1 Measurement system description p. 191
10.6.2.2 Test procedure p. 192
10.6.2.3 MU value derivation, FR1 p. 192
10.6.3 Compact Antenna Test Range p. 193
10.6.3.1 Measurement system description p. 193
10.6.3.2 Test procedure p. 193
10.6.3.3 MU value derivation, FR1 p. 194
10.6.3A Plan Wave Synthesizer p. 195
10.6.3A.1 Measurement system description p. 195
10.6.3A.2 Test procedure p. 195
10.6.3A.3 MU value derivation, FR1 p. 196
10.6.4 Maximum accepted test system uncertainty p. 197
10.6.5 Test Tolerance for OTA RX IMD p. 198
10.7 OTA in-channel selectivity p. 199
10.7.1 General p. 199
10.7.2 Indoor Anechoic Chamber p. 199
10.7.2.1 Measurement system description p. 199
10.7.2.2 Test procedure p. 199
10.7.2.3 MU value derivation, FR1 p. 199
10.7.3 Compact Antenna Test Range p. 199
10.7.3.1 Measurement system description p. 199
10.7.3.2 Test procedure p. 199
10.7.3.3 MU value derivation, FR1 p. 200
10.7.3A Plane Wave Synthesizer p. 200
10.7.3A.1 Measurement system description p. 200
10.7.3A.2 Test procedure p. 200
10.7.3A.3 MU value derivation, FR1 p. 200
10.7.4 Maximum accepted test system uncertainty p. 201
10.7.5 Test Tolerance for OTA ICS p. 201
11 In-band TRP requirements p. 201
11.1 General p. 201
11.2 OTA BS output power p. 201
11.2.1 General p. 201
11.2.2 Indoor Anechoic Chamber p. 201
11.2.2.1 Measurement system description p. 201
11.2.2.2 Test procedure p. 201
11.2.2.3 MU value derivation, FR1 p. 202
11.2.3 Compact Antenna Test Range p. 203
11.2.3.1 Measurement system description p. 203
11.2.3.2 Test procedure p. 204
11.2.3.3 MU value derivation, FR1 p. 204
11.2.3.4 MU value derivation, FR2 p. 206
11.2.4 Near Field Test Range p. 209
11.2.4.1 Measurement system description p. 209
11.2.4.2 Test procedure p. 209
11.2.4.3 MU value derivation, FR1 p. 209
11.2.5 Reverberation Chamber p. 212
11.2.5.1 Measurement system description p. 212
11.2.5.2 Test procedure p. 212
11.2.5.3 MU value derivation, FR1 p. 213
11.2.5.4 MU value derivation, FR2 p. 213
11.2.6 Plane Wave Synthesizer p. 214
11.2.6.1 Measurement system description p. 214
11.2.6.2 Test procedure p. 214
11.2.6.3 MU value derivation, FR1 p. 215
11.2.7 Maximum accepted test system uncertainty p. 217
11.2.8 Test Tolerance for OTA BS output power p. 217
11.3 OTA ACLR p. 218
11.3.1 General p. 218
11.3.2 Indoor Anechoic Chamber p. 218
11.3.2.1 Measurement system description p. 218
11.3.2.2 Test procedure p. 218
11.3.2.3 MU value derivation, FR1 p. 219
11.3.3 Compact Antenna Test Range p. 222
11.3.3.1 Measurement system description p. 222
11.3.3.2 Test procedure p. 222
11.3.3.3 MU value derivation, FR1 p. 222
11.3.3.4 MU value derivation, FR2 p. 224
11.3.4 Near Field Test Range p. 226
11.3.4.1 Measurement system description p. 226
11.3.4.2 Test procedure p. 226
11.3.4.3 MU value derivation, FR1 p. 227
11.3.5 Reverberation Chamber p. 229
11.3.5.1 Measurement system description p. 229
11.3.5.2 Test procedure p. 229
11.3.5.3 MU value derivation, FR1 p. 229
11.3.5.4 MU value derivation, FR2 p. 230
11.3.6 Plane Wave Synthesizer p. 232
11.3.6.1 Measurement system description p. 232
11.3.6.2 Test procedure p. 232
11.3.6.3 MU value derivation, FR1 p. 233
11.3.7 Maximum accepted test system uncertainty p. 236
11.3.8 Test Tolerance for OTA ACLR p. 237
11.4 OTA SEM and OTA OBUE p. 238
11.4.1 General p. 238
11.4.2 Indoor Anechoic Chamber p. 238
11.4.2.1 Measurement system description p. 238
11.4.2.2 Test procedure p. 238
11.4.2.3 MU value derivation, FR1 p. 239
11.4.3 Compact Antenna Test Range p. 242
11.4.3.1 Measurement system description p. 242
11.4.3.2 Test procedure p. 242
11.4.3.3 MU value derivation, FR1 p. 242
11.4.3.4 MU value derivation, FR2 p. 244
11.4.4 Near Field Test Range p. 247
11.4.4.1 Measurement system description p. 247
11.4.4.2 Test procedure p. 247
11.4.4.3 MU value derivation, FR1 p. 247
11.4.5 Reverberation Chamber p. 247
11.4.5.1 Measurement system description p. 247
11.4.5.2 Test procedure p. 247
11.4.5.3 MU value derivation, FR1 p. 247
11.4.5.4 MU value derivation, FR2 p. 248
11.4.6 Plane Wave Synthesizer p. 249
11.4.6.1 Measurement system description p. 249
11.4.6.2 Test procedure p. 249
11.4.6.3 MU value derivation, FR1 p. 250
11.4.7 Maximum accepted test system uncertainty p. 250
11.4.8 Test Tolerance for OTA OBUE and OTA SEM p. 251
