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Content for
TR 37.941
Word version: 16.2.0
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10…
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10
RX directional requirements
10.1
General
10.2
OTA sensitivity
10.3
OTA reference sensitivity
10.4
OTA dynamic range
10.5
OTA adjacent channel selectivity, general blocking and narrowband blocking
10.6
OTA receiver intermodulation
10.7
OTA in-channel selectivity
11
In-band TRP requirements
11.1
General
11.2
OTA BS output power
11.3
OTA ACLR
11.4
OTA SEM and OTA OBUE
10
RX directional requirements
10.1
General
10.2
OTA sensitivity
Word‑p. 152
10.2.1
General
10.2.2
Indoor Anechoic Chamber
10.2.2.1
Measurement system description
10.2.2.2
Test procedure
10.2.2.2.1
Stage 1: Calibration
10.2.2.2.2
Stage 2: BS measurement
10.2.2.3
MU value derivation, FR1
10.2.2.4
MU value derivation, FR2
Word‑p. 155
10.2.3
Compact Antenna Test Range
Word‑p. 158
10.2.3.1
Measurement system description
10.2.3.2
Test procedure
10.2.3.2.1
Stage 1: Calibration
10.2.3.2.2
Stage 2: BS measurement
10.2.3.3
MU value derivation, FR1
10.2.3.4
MU value derivation, FR2
Word‑p. 159
10.2.4
One Dimensional Compact Range
Word‑p. 160
10.2.4.1
Measurement system description
10.2.4.2
Test procedure
10.2.4.2.1
Stage 1: Calibration
10.2.4.2.2
Stage 2: BS measurement
10.2.4.3
MU value derivation, FR1
Word‑p. 161
10.2.5
Near Field Test range
Word‑p. 163
10.2.5.1
Measurement system description
10.2.5.2
Test procedure
10.2.5.2.1
Stage 1: Calibration
10.2.5.2.2
Stage 2: BS measurement
10.2.5.3
MU value derivation, FR1
Word‑p. 164
10.2.6
Plane Wave Synthesizer
Word‑p. 167
10.2.6.1
Measurement system description
10.2.6.2
Test procedure
10.2.6.2.1
Stage 1: Calibration
10.2.6.2.2
Stage 2: BS measurement
10.2.6.3
MU value derivation, FR1
10.2.7
Maximum accepted test system uncertainty
Word‑p. 169
10.2.8
Test Tolerance for OTA sensitivity
10.3
OTA reference sensitivity
Word‑p. 170
10.4
OTA dynamic range
10.4.1
General
10.4.2
Indoor Anechoic Chamber
10.4.2.1
Measurement system description
10.4.2.2
Test procedure
10.4.2.2.1
Stage 1: Calibration
10.4.2.2.2
Stage 2: BS measurement
10.4.2.3
MU value derivation, FR1
Word‑p. 171
10.4.3
Compact Antenna Test Range
10.4.3.1
Measurement system description
10.4.3.2
Test procedure
10.4.3.2.1
Stage 1: Calibration
10.4.3.2.2
Stage 2: BS measurement
10.4.3.3
MU value derivation, FR1
10.4.3A
Plane Wave Synthesizer
10.4.3A.2
Test procedure
10.4.3A.2.1
Stage 1: Calibration
10.4.3A.2.2
Stage 2: BS measurement
Word‑p. 172
10.4.3A.3
MU value derivation, FR1
10.4.4
Maximum accepted test system uncertainty
10.4.5
Test Tolerance for OTA dynamic range
10.5
OTA adjacent channel selectivity, general blocking and narrowband blocking
10.5.1
General
10.5.2
Indoor Anechoic Chamber
Word‑p. 173
10.5.2.1
Measurement system description
10.5.2.2
Test procedure
10.5.2.2.1
Stage 1: Calibration
10.5.2.2.2
Stage 2: BS measurement
10.5.2.3
MU value derivation, FR1
10.5.3
Compact Antenna Test Range
Word‑p. 174
10.5.3.1
Measurement system description
10.5.3.2
Test procedure
10.5.3.2.1
Stage 1: Calibration
10.5.3.2.2
Stage 2: BS measurement
Word‑p. 175
10.5.3.3
MU value derivation, FR1
10.5.3A
Plane Wave Synthesizer
Word‑p. 176
10.5.3A.1
Measurement system description
10.5.3A.2
Test procedure
10.5.3.2A.1
Stage 1: Calibration
10.5.3A.2.2
Stage 2: BS measurement
10.5.3A.3
MU value derivation, FR1
Word‑p. 177
10.5.4
Maximum accepted test system uncertainty
10.5.5
Test Tolerance for OTA ACS, general blocking and narrowband blocking
Word‑p. 179
10.6
OTA receiver intermodulation
10.6.1
General
10.6.2
Indoor Anechoic Chamber
10.6.2.1
Measurement system description
10.6.2.2
Test procedure
10.6.2.2.1
Stage 1: Calibration
10.6.2.2.2
Stage 2: BS measurement
10.6.2.3
MU value derivation, FR1
Word‑p. 180
10.6.3
Compact Antenna Test Range
Word‑p. 181
10.6.3.1
Measurement system description
10.6.3.2
Test procedure
10.6.3.2.1
Stage 1: Calibration
10.6.3.2.2
Stage 2: BS measurement
10.6.3.3
MU value derivation, FR1
Word‑p. 182
10.6.3A
Plan Wave Synthesizer
Word‑p. 183
10.6.3A.1
Measurement system description
10.6.3A.2
Test procedure
10.6.3A.2.1
Stage 1: Calibration
10.6.3A.2.2
Stage 2: BS measurement
10.6.3A.3
MU value derivation, FR1
Word‑p. 184
10.6.4
Maximum accepted test system uncertainty
Word‑p. 185
10.6.5
Test Tolerance for OTA RX IMD
Word‑p. 186
10.7
OTA in-channel selectivity
10.7.1
General
10.7.2
Indoor Anechoic Chamber
Word‑p. 187
10.7.2.1
Measurement system description
10.7.2.2
Test procedure
10.7.2.2.1
Stage 1: Calibration
10.7.2.2.2
Stage 2: BS measurement
10.7.2.3
MU value derivation, FR1
10.7.3
Compact Antenna Test Range
10.7.3.1
Measurement system description
10.7.3.2
Test procedure
10.7.3.2.1
Stage 1: Calibration
10.7.3.2.2
Stage 2: BS measurement
10.7.3.3
MU value derivation, FR1
Word‑p. 188
10.7.3A
Plane Wave Synthesizer
10.7.3A.1
Measurement system description
10.7.3A.2
Test procedure
10.7.3A.2.1
Stage 1: Calibration
10.7.3A.2.2
Stage 2: BS measurement
10.7.3A.3
MU value derivation, FR1
10.7.4
Maximum accepted test system uncertainty
10.7.5
Test Tolerance for OTA ICS
11
In-band TRP requirements
Word‑p. 189
11.1
General
11.2
OTA BS output power
11.2.1
General
11.2.2
Indoor Anechoic Chamber
11.2.2.1
Measurement system description
11.2.2.2
Test procedure
11.2.2.2.1
Stage 1: Calibration
11.2.2.2.2
Stage 2: BS measurement
11.2.2.3
MU value derivation, FR1
Word‑p. 190
11.2.3
Compact Antenna Test Range
Word‑p. 191
11.2.3.1
Measurement system description
11.2.3.2
Test procedure
11.2.3.2.1
Stage 1: Calibration
11.2.3.2.2
Stage 2: BS measurement
11.2.3.3
MU value derivation, FR1
11.2.3.4
MU value derivation, FR2
Word‑p. 193
11.2.4
Near Field Test Range
Word‑p. 194
11.2.4.1
Measurement system description
11.2.4.2
Test procedure
11.2.4.2.1
Stage 1: Calibration
11.2.4.2.2
Stage 2: BS measurement
11.2.4.3
MU value derivation, FR1
11.2.5
Reverberation Chamber
Word‑p. 197
11.2.5.1
Measurement system description
11.2.5.2
Test procedure
11.2.5.2.1
Stage 1: Calibration
11.2.5.2.2
Stage 2: BS measurement
11.2.5.3
MU value derivation, FR1
Word‑p. 198
11.2.5.4
MU value derivation, FR2
11.2.6
Plane Wave Synthesizer
Word‑p. 199
11.2.6.1
Measurement system description
11.2.6.2
Test procedure
11.2.6.2.1
Stage 1: Calibration
11.2.6.2.2
Stage 2: BS measurement
11.2.6.3
MU value derivation, FR1
Word‑p. 200
11.2.7
Maximum accepted test system uncertainty
Word‑p. 202
11.2.8
Test Tolerance for OTA BS output power
11.3
OTA ACLR
Word‑p. 203
11.3.1
General
11.3.2
Indoor Anechoic Chamber
11.3.2.1
Measurement system description
11.3.2.2
Test procedure
11.3.2.2.1
Stage 1: Calibration
11.3.2.2.2
Stage 2: BS measurement
11.3.2.3
MU value derivation, FR1
Word‑p. 204
11.3.3
Compact Antenna Test Range
Word‑p. 207
11.3.3.1
Measurement system description
11.3.3.2
Test procedure
11.3.3.2.1
Stage 1: Calibration
11.3.3.2.2
Stage 2: BS measurement
11.3.3.3
MU value derivation, FR1
11.3.3.4
MU value derivation, FR2
Word‑p. 209
11.3.4
Near Field Test Range
Word‑p. 211
11.3.4.1
Measurement system description
11.3.4.2
Test procedure
11.3.4.2.1
Stage 1: Calibration
11.3.4.2.2
Stage 2: BS measurement
11.3.4.3
MU value derivation, FR1
Word‑p. 212
11.3.5
Reverberation Chamber
Word‑p. 214
11.3.5.1
Measurement system description
11.3.5.2
Test procedure
11.3.5.2.1
Stage 1: Calibration
11.3.5.2.2
Stage 2: BS measurement
11.3.5.3
MU value derivation, FR1
11.3.5.4
MU value derivation, FR2
Word‑p. 215
11.3.6
Plane Wave Synthesizer
Word‑p. 217
11.3.6.1
Measurement system description
11.3.6.2
Test procedure
11.3.6.2.1
Stage 1: Calibration
11.3.6.2.2
Stage 2: BS measurement
11.3.6.3
MU value derivation, FR1
Word‑p. 218
11.3.7
Maximum accepted test system uncertainty
Word‑p. 221
11.3.8
Test Tolerance for OTA ACLR
Word‑p. 222
11.4
OTA SEM and OTA OBUE
Word‑p. 223
11.4.1
General
11.4.2
Indoor Anechoic Chamber
11.4.2.1
Measurement system description
11.4.2.2
Test procedure
11.4.2.2.1
Stage 1: Calibration
11.4.2.2.2
Stage 2: BS measurement
11.4.2.3
MU value derivation, FR1
11.4.3
Compact Antenna Test Range
Word‑p. 226
11.4.3.1
Measurement system description
11.4.3.2
Test procedure
11.4.3.2.1
Stage 1: Calibration
11.4.3.2.2
Stage 2: BS measurement
11.4.3.3
MU value derivation, FR1
11.4.3.4
MU value derivation, FR2
Word‑p. 227
11.4.4
Near Field Test Range
Word‑p. 229
11.4.4.1
Measurement system description
11.4.4.2
Test procedure
11.4.4.2.1
Stage 1: Calibration
11.4.4.2.2
Stage 2: BS measurement
11.4.4.3
MU value derivation, FR1
11.4.5
Reverberation Chamber
11.4.5.1
Measurement system description
11.4.5.2
Test procedure
11.4.5.2.1
Stage 1: Calibration
11.4.5.2.2
Stage 2: BS measurement
11.4.5.3
MU value derivation, FR1
11.4.5.4
MU value derivation, FR2
Word‑p. 230
11.4.6
Plane Wave Synthesizer
Word‑p. 231
11.4.6.1
Measurement system description
11.4.6.2
Test procedure
11.4.6.2.1
Stage 1: Calibration
11.4.6.2.2
Stage 2: BS measurement
11.4.6.3
MU value derivation, FR1
Word‑p. 232
11.4.7
Maximum accepted test system uncertainty
11.4.8
Test Tolerance for OTA OBUE and OTA SEM