Content for TS 31.127 Word version: 17.2.0
3 Definitions of terms, symbols and abbreviations
3.1 Terms
3.2 Symbols
3.3 Abbreviations
3.4 Coding Conventions
3.5 Generic procedures for 5G-NR, E-UTRAN and NB-IoT
3.6 Table of optional features
3.7 Applicability
3.8 Applicability table
4 Test environment
4.1 -
4.2 Requirements to the EUT and the test environment
4.3 Random value generation
4.4 Suitability assessment
4.5 Definition of default values
4.6 Definition of default values for EFs commonly used with random value generation
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3 Definitions of terms, symbols and abbreviations p. 26
3.1 Terms p. 26
3.2 Symbols p. 26
3.3 Abbreviations p. 27
3.4 Coding Conventions p. 27
3.5 Generic procedures for 5G-NR, E-UTRAN and NB-IoT p. 27
3.6 Table of optional features p. 27
3.7 Applicability p. 29
3.7.1 Applicability to user equipment p. 29
3.7.2 Supported additional explicit verification methods p. 29
3.7.3 Applicability of the individual tests p. 30
3.8 Applicability table p. 31
4 Test environment p. 37
4.1 - p. 37
4.1.1 General test environment p. 37
4.1.2 Example - test environment for implicit testing p. 38
4.1.3 Example - test environment for contents verification p. 38
4.1.4 Example - test environment for seamless testing p. 39
4.1.5 Example - test environment for test toolkit events based testing p. 39
4.1.6 Example - test environment for UEs with ETSI eSSP/iSSP p. 40
4.2 Requirements to the EUT and the test environment p. 40
4.2.1 General Requirements p. 40
4.2.2 Requirements to the UE (EUT) - supported interfaces p. 41
4.2.3 Supported RATs p. 41
4.2.4 Initial and final procedure steps p. 41
4.3 Random value generation p. 41
4.4 Suitability assessment p. 42
4.4.1 Suitability assessment in present test procedures p. 42
4.4.2 Suitability assessment in test descriptions p. 42
4.4.3 Suitability assessment in the test protocol p. 42
4.4.4 Justification of additional measures p. 42
4.5 Definition of default values p. 43
4.5.1 Introduction p. 43
4.5.1.1 Installation, provisioning or modification methods for EFs and DFs p. 43
4.5.1.2 TS.48 Version and usage p. 43
4.5.2 Definition of the Default UICC p. 43
4.5.3 Definition of FDN UICC p. 44
4.5.4 Definition of E-UTRAN/EPC UICC p. 45
4.5.5 Definition of E-UTRAN/EPC ISIM-UICC p. 46
4.5.6 Definition of ACSGL/OCSGL E-UTRAN/EPC UICC p. 46
4.5.7 Definition of Non-Access Stratum Configuration UICC p. 52
4.5.8 Definition of Non-Access Stratum Configuration of E-UTRAN/EPC UICC p. 53
4.5.9 Definition of 5G-NR UICC p. 53
4.5.10 Definition of 5G-NR UICC - non-IMSI SUPI Type p. 55
4.5.11 Definition of 5G-NR UICC - support of Rel-16 features p. 57
4.5.12 Definition of 5G-NR UICC - support of Rel-17 features p. 60
4.5.13 Definition 5G-NR UICC - CAG support p. 60
4.6 Definition of default values for EFs commonly used with random value generation p. 61
4.6.1 EFIMSI with 3-digit MNC and random value p. 61
4.6.2 EFIMSI "short", with 3-digit MNC and random value p. 61
4.6.3 EFIMSI "short", with 2-digit MNC and random value p. 61
4.6.4 EFIMSI "long", with 3-digit MNC and random value p. 61
4.6.5 EFIMSI for SUCI calculation tests p. 62
4.6.6 EFIMSI for "change IMSI" tests p. 62
4.6.7 EFRouting_Indicator with 2-digit MNC and random value p. 62
4.6.8 EFLOCI with "short" random TMSI value p. 62
4.6.9 EFLOCI with "long" random TMSI value p. 63
4.6.10 EFEPSLOCI p. 63
4.6.11 EFFDN p. 63
4.6.12 EFECC p. 64
