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Content for  TS 25.142  Word version:  18.0.0

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3  Definitions, symbols, and abbreviationsp. 19

4  Frequency bands and channel arrangementp. 22

5  General test conditions and declarationsp. 24

5.1  Base station classesp. 24

5.2  Output powerp. 25

5.3  Specified frequency range and supported channel bandwidthp. 25

5.4  Relationship between RF generation and chip clockp. 26

5.5  Spectrum emission maskp. 26

5.6  Adjacent Channel Leakage power Ratio (ACLR)p. 26

5.7  Tx spurious emissionsp. 27

5.8  Blocking characteristicsp. 28

5.9  Test environmentsp. 28

5.10  Acceptable uncertainty of Test Systemp. 30

5.11  Test Tolerances (informative)p. 36

5.12  Interpretation of measurement resultsp. 39

5.13  Selection of configurations for testingp. 39

5.14  BS Configurationsp. 40

5.15  Overview of the conformance test requirementsp. 42

5.16  Format and interpretation of testsp. 44

5.17  Regional requirementsp. 44

5.18  Definition of Additive White Gaussian Noise (AWGN) Interfererp. 45

5.19  Applicability of requirements |R9|p. 45

5.20  Test configurations for multi-carrier operation |R11|p. 46

5.21  Applicability of test configurations |R11|p. 47

5.22  Requirements for BS capable of multi-band operation |R11|p. 49


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