Tech-invite3GPPspaceIETFspace
21222324252627282931323334353637384‑5x

Content for  TR 38.903  Word version:  18.3.0

Top   Top   Up   Prev   Next
1…   4…   A…   B…   C…

 

B  Acceptable uncertainty of test system for test cases defined in TS 38.521-2 for radiative testingp. 64

B.1  Uncertainty budget calculation principlep. 64

B.2  Measurement error contribution descriptionsp. 65

B.2.1  Measurement error contribution descriptions for DFFp. 65

B.2.1.1  Positioning misalignmentp. 65

B.2.1.2  Measure distance uncertaintyp. 65

B.2.1.3  Quality of quiet zonep. 65

B.2.1.4  Mismatchp. 65

B.2.1.5  Standing Wave Between the DUT and measurement antennap. 67

B.2.1.6  Uncertainty of the RF power measurement equipmentp. 67

B.2.1.7  Phase curvaturep. 68

B.2.1.8  Amplifier uncertaintiesp. 68

B.2.1.9  Random uncertaintyp. 68

B.2.1.10  Influence of the XPDp. 69

B.2.1.11  Insertion loss Variationp. 73

B.2.1.12  RF leakage (from measurement antenna to receiver/transmitter)p. 73

B.2.1.13  Misalignment of positioning Systemp. 73

B.2.1.14  Uncertainty of the Network Analyzerp. 73

B.2.1.15  Uncertainty of the absolute gain of the calibration antennap. 73

B.2.1.16  Positioning and pointing misalignment between the reference antenna and the measurement antennap. 73

B.2.1.17  gNB emulator uncertaintyp. 73

B.2.1.18  Phase centre offset of calibrationp. 74

B.2.1.19  Quality of quiet zone for calibration processp. 74

B.2.1.20  Standing wave between reference calibration antenna and measurement antennap. 74

B.2.1.21  Influence of the calibration antenna feed cable (Flexing cables, adapters, attenuators, connector repeatability)p. 75

B.2.1.22  Influence of TRP measurement gridp. 75

B.2.1.23  Influence of beam peak search gridp. 75

B.2.1.24  Systematic error due to TRP calculation/quadraturep. 75

B.2.1.25  Multiple measurement antenna uncertaintyp. 75

B.2.1.26  DUT repositioningp. 75

B.2.1.27  Influence of noisep. 75

B.2.1.28  Systematic error related to beam peak searchp. 76

B.2.1.29  Influence of spherical coverage gridp. 76

B.2.1.30  Systematic error related to EIS spherical coveragep. 76

B.2.1.31  Misalignment of DUT due to change of DUT orientationp. 76

B.2.1.32  Additional Impact of Interferer ACLRp. 76

B.2.1.33  Modulated Interferer uncertaintyp. 76

B.2.1.34Void

B.2.1.35  Influence of offset antenna for blocker signalp. 76

B.2.1.36  Uncertainty of the RF relative power measurement equipmentp. 77

B.2.2  Measurement error contribution descriptions for IFFp. 77

B.2.2.1  Positioning misalignmentp. 77

B.2.2.2  Measure distance uncertaintyp. 77

B.2.2.3  Quality of Quiet Zonep. 78

B.2.2.4  Mismatchp. 79

B.2.2.5  Standing wave between DUT and measurement antennap. 81

B.2.2.6  Uncertainty of the RF power measurement equipmentp. 81

B.2.2.7  Phase Curvaturep. 81

B.2.2.8  Amplifier Uncertaintiesp. 82

B.2.2.9  Random uncertaintyp. 82

B.2.2.10  Influence of XPDp. 82

B.2.2.11  Insertion Loss Variationp. 83

B.2.2.12  RF leakage (from measurement antenna to receiver/transmitter)p. 83

B.2.2.13  Misalignment of positioning systemp. 84

B.2.2.14  Uncertainty of the Network Analyzerp. 84

B.2.2.15  Uncertainty of the absolute gain of the calibration antennap. 84

B.2.2.16  Positioning and pointing misalignment between the reference antenna and the measurement antennap. 85

B.2.2.17  gNB emulator uncertaintyp. 85

B.2.2.18  Phase centre offset of calibrationp. 85

B.2.2.19  Quality of the Quiet Zone for Calibration Processp. 85

B.2.2.20  Standing wave between reference calibration antenna and measurement antennap. 86

B.2.2.21  Influence of the calibration antenna feed cable (Flexing cables, adapters, attenuators, connector repeatability)p. 87

B.2.2.22  Influence of TRP measurement gridp. 87

B.2.2.23  Influence of beam peak search gridp. 87

B.2.2.24  Systematic error due to TRP calculation/quadraturep. 88

B.2.2.25  Multiple measurement antenna uncertaintyp. 88

B.2.2.26  DUT repositioningp. 88

B.2.2.27  Influence of noisep. 89

B.2.2.28  Systematic error related to beam peak searchp. 101

B.2.2.29  Influence of spherical coverage gridp. 101

B.2.2.30  Systematic error related to EIS spherical coveragep. 101

B.2.2.31  Misalignment of DUT due to change of DUT orientationp. 102

B.2.2.32  Additional Impact of Interferer ACLRp. 102

B.2.2.33  Modulated Interferer uncertaintyp. 102

B.2.2.34Void

B.2.2.35  Influence of offset antenna for blocker signalp. 103

B.2.2.36  Uncertainty of the RF relative power measurement equipmentp. 103

B.2.3  Measurement error contribution descriptions for NFTFp. 103

B.2.3.1  Axes Alignmentp. 103

B.2.3.2  Measurement Distance uncertaintyp. 103

B.2.3.3  Quality of the Quiet Zonep. 103

B.2.3.4  Mismatchp. 103

B.2.3.5  Multiple Reflections: Coupling Measurement Antenna and DUTp. 103

B.2.3.6  Uncertainty of the RF power measurement equipmentp. 104

B.2.3.7  Phase curvaturep. 104

B.2.3.8  Amplifier uncertaintiesp. 104

B.2.3.9  Random uncertaintyp. 104

B.2.3.10  Influence of the XPDp. 104

B.2.3.11  NF to FF truncationp. 104

B.2.3.12  Probe Polarization Amplitude and Phasep. 104

B.2.3.13  Probe Array Uniformity (for multi-probe systems only)p. 104

B.2.3.14  Uncertainty of the Network Analyzerp. 104

B.2.3.15  Uncertainty of the absolute gain of the calibration antennap. 104

B.2.3.16  Phase Recovery Non-Linearity over signal bandwidthp. 104

B.2.3.17  Probe Pattern Effectp. 105

B.2.3.18  Phase centre offset of calibrationp. 105

B.2.3.19  Quality of the Quiet Zone for Calibration Processp. 105

B.2.3.20  Phase Drift and Noisep. 105

B.2.3.21  Mismatch in the connection of the calibration antennap. 105

B.2.3.22  Influence of TRP measurement gridp. 105

B.2.3.23  -p. 105

B.2.3.24  -p. 105

B.2.3.25  Leakage and Crosstalkp. 105

B.2.3.26  Systematic error due to TRP calculation/quadraturep. 105

B.2.3.27  Multiple measurement antenna uncertaintyp. 105

B.2.3.28  DUT repositioningp. 105

B.2.3.29  Influence of noisep. 105

B.2.3.30  Uncertainty of the RF relative power measurement equipmentp. 106

B.3  UE maximum output powerp. 106

B.4  UE maximum output power for modulation / channel bandwidthp. 130

B.5  UE maximum output power with additional requirementsp. 135

B.6  Configured transmitted power with Power Boostp. 135

B.6a  UE Maximum Output Power - EIRP with UL Gapsp. 147

B.7  Minimum Output powerp. 152

B.8  Transmit OFF powerp. 168

B.9  ON/OFF time maskp. 177

B.9a  Power controlp. 184

B.10  Frequency errorp. 190

B.11  Carrier leakagep. 191

B.12  Error Vector Magnitudep. 202

B.13  -p. 205

B.14  -p. 205

B.15  Occupied bandwidthp. 205

B.16  Spectrum emission maskp. 205

B.17  Adjacent Channel Leakage Ratiop. 215

B.18  Spurious emissionsp. 225

B.18a  Beam correspondence - EIRPp. 266

B.19  Reference Sensitivityp. 268

B.20  -p. 282

B.21  Adjacent Channel Selectivityp. 282

B.22  In-Band Blockingp. 292

B.23  -p. 293

B.24  -p. 293

B.25  Receiver spurious emissionsp. 293


Up   Top   ToC