Tech-
invite
3GPP
space
IETF
space
21
22
23
24
25
26
27
28
29
31
32
33
34
35
36
37
38
4‑5x
Content for
TS 38.133
Word version: 18.3.0
1…
3…
4…
5…
6…
7…
8…
9…
10…
12…
A…
A.4…
A.5…
A.6…
A.7…
A.8…
A.9…
A.10…
A.11…
A.12…
A.13…
A.14…
A.15…
A.16…
A.17…
A.18…
B…
A.6
NR standalone tests with all NR cells in FR1
A.6.1
SA: RRC_IDLE state mobility
A.6.2
SA: RRC_INACTIVE state mobility
A.6.3
RRC_CONNECTED state mobility
A.6.4
Timing
A.6.5
Signalling characteristics
A.6.6
Measurement procedure
A.6.7
Measurement Performance requirements
A.6.8
Measurement procedure in RRC_INACTIVE
A.6.9
Measurement performance requirements in RRC_INACTIVE
...
A.6
NR standalone tests with all NR cells in FR1
p. 2187
A.6.1
SA: RRC_IDLE state mobility
p. 2187
A.6.1.1
Cell re-selection to NR
p. 2187
A.6.1.1.1
Cell reselection to FR1 intra-frequency NR case
p. 2187
A.6.1.1.1.1
Test Purpose and Environment
p. 2187
A.6.1.1.1.2
Test Parameters
p. 2187
A.6.1.1.1.3
Test Requirements
p. 2191
A.6.1.1.2
Cell reselection to FR1 inter-frequency NR case
p. 2191
A.6.1.1.2.1
Test Purpose and Environment
p. 2191
A.6.1.1.2.2
Test Parameters
p. 2191
A.6.1.1.2.3
Test Requirements
p. 2195
A.6.1.1.3
Cell reselection to FR1 intra-frequency NR case for UE fulfilling low mobility relaxed measurement criterion
p. 2195
A.6.1.1.3.1
Test Purpose and Environment
p. 2195
A.6.1.1.3.2
Test Parameters
p. 2195
A.6.1.1.3.3
Test Requirements
p. 2200
A.6.1.1.4
Cell reselection to FR1 intra-frequency NR case for UE fulfilling not-at-cell edge relaxed measurement criterion
p. 2200
A.6.1.1.4.1
Test Purpose and Environment
p. 2200
A.6.1.1.4.2
Test Parameters
p. 2200
A.6.1.1.4.3
Test Requirements
p. 2203
A.6.1.1.5
Cell reselection to FR1 inter-frequency NR case for UE fulfilling low mobility relaxed measurement criterion
p. 2203
A.6.1.1.5.1
Test Purpose and Environment
p. 2203
A.6.1.1.5.2
Test Parameters
p. 2203
A.6.1.1.5.3
Test Requirements
p. 2208
A.6.1.1.6
Cell reselection to FR1 inter-frequency NR case for UE fulfilling not-at-cell edge relaxed measurement criterion
p. 2208
A.6.1.1.6.1
Test Purpose and Environment
p. 2208
A.6.1.1.6.2
Test Parameters
p. 2209
A.6.1.1.6.3
Test Requirements
p. 2213
A.6.1.1.7
Cell reselection to FR1 intra-frequency NR case for UE configured with highSpeedMeasFlag-r16
p. 2214
A.6.1.1.7.1
Test Purpose and Environment
p. 2214
A.6.1.1.7.2
Test Parameters
p. 2214
A.6.1.1.7.3
Test Requirements
p. 2217
A.6.1.1.8
Cell reselection to FR1 inter-frequency NR case for UE configured with highSpeedMeasInterFreq-r17
p. 2217
A.6.1.1.8.1
Test Purpose and Environment
p. 2217
A.6.1.1.8.2
Test Parameters
p. 2217
A.6.1.1.8.3
Test Requirements
p. 2221
A.6.1.2
Inter-RAT E-UTRAN cell re-selection
p. 2221
A.6.1.2.1
Cell reselection to higher priority E-UTRAN
p. 2221
A.6.1.2.1.1
Test Purpose and Environment
p. 2221
A.6.1.2.1.2
Test Parameters
p. 2221
A.6.1.2.1.3
Test Requirements
p. 2224
A.6.1.2.2
Cell reselection to lower priority E-UTRAN
p. 2225
A.6.1.2.2.1
Test Purpose and Environment
p. 2225
A.6.1.2.2.2
Test Parameters
p. 2225
A.6.1.2.2.3
Test Requirements
p. 2228
A.6.1.2.3
Cell reselection to lower priority E-UTRAN for UE fulfilling low mobility relaxed measurement criterion
p. 2229
A.6.1.2.3.1
Test Purpose and Environment
p. 2229
A.6.1.2.3.2
Test Parameters
p. 2229
A.6.1.2.3.3
Test Requirements
p. 2232
A.6.1.2.4
Cell reselection to lower priority E-UTRAN for UE fulfilling not-at-cell edge relaxed measurement criterion
p. 2233
A.6.1.2.4.1
Test Purpose and Environment
p. 2233
A.6.1.2.4.2
Test Parameters
p. 2233
A.6.1.2.4.3
Test Requirements
p. 2236
A.6.1.2.5
Cell reselection to lower priority E-UTRAN cell for UE configured with highSpeedMeasFlag-r16
p. 2237
A.6.1.2.5.1
Test Purpose and Environment
p. 2237
A.6.1.2.5.2
Test Parameters
p. 2237
A.6.1.2.5.3
Test Requirements
p. 2241
A.6.1.2.7
Void
A.6.2
SA: RRC_INACTIVE state mobility
p. 2242
A.6.2.1
Configured Grant based Small Data Transmissions (CG-SDT)
p. 2242
A.6.2.1.1
Test purpose and Environment
p. 2242
A.6.2.1.2
Test Parameters
p. 2243
A.6.2.1.3
Test requirements
p. 2245
A.6.3
RRC_CONNECTED state mobility
p. 2245
A.6.3.1
Handover
p. 2245
A.6.3.1.1
Intra-frequency handover from FR1 to FR1; known target cell
p. 2245
A.6.3.1.1.1
Test Purpose and Environment
p. 2245
A.6.3.1.1.2
Test Parameters
p. 2245
A.6.3.1.1.3
Test Requirements
p. 2249
A.6.3.1.2
Intra-frequency handover from FR1 to FR1; unknown target cell
p. 2249
A.6.3.1.2.1
Test Purpose and Environment
p. 2249
A.6.3.1.2.2
Test Parameters
p. 2249
A.6.3.1.2.3
Test Requirements
p. 2253
A.6.3.1.3
Inter-frequency handover from FR1 to FR1; unknown target cell
p. 2253
A.6.3.1.3.1
Test Purpose and Environment
p. 2253
A.6.3.1.3.2
Test Parameters
p. 2253
A.6.3.1.3.3
Test Requirements
p. 2257
A.6.3.1.4
SA NR - E-UTRAN handover
p. 2257
A.6.3.1.4.1
Test Purpose and Environment
p. 2257
A.6.3.1.4.2
Test Requirements
p. 2263
A.6.3.1.5
SA NR - E-UTRAN handover with unknown target cell
p. 2263
A.6.3.1.5.1
Test Purpose and Environment
p. 2263
A.6.3.1.5.2
Test Requirements
p. 2269
A.6.3.1.6
SA NR - UTRAN FDD handover
p. 2269
A.6.3.1.6.1
Test Purpose and Environment
p. 2269
A.6.3.1.6.2
Test Requirements
p. 2273
A.6.3.1.7
Intra-frequency synchronous DAPS handover in FR1
p. 2273
A.6.3.1.7.1
Test Purpose and Environment
p. 2273
A.6.3.1.7.2
Test Parameters
p. 2273
A.6.3.1.7.3
Test Requirements
p. 2277
A.6.3.1.8
Intra-frequency asynchronous DAPS handover in FR1
p. 2278
A.6.3.1.8.1
Test Purpose and Environment
p. 2278
A.6.3.1.8.2
Test Parameters
p. 2278
A.6.3.1.8.3
Test Requirements
p. 2282
A.6.3.1.9
Intra-band inter-frequency synchronous DAPS handover test in SA for FR1
p. 2283
A.6.3.1.9.1
Test Purpose and Environment
p. 2283
A.6.3.1.9.2
Test Parameters
p. 2283
A.6.3.1.9.3
Test Requirements
p. 2287
A.6.3.1.10
Intra-band inter-frequency asynchronous DAPS handover test in SA for FR1
p. 2287
A.6.3.1.10.1
Test Purpose and Environment
p. 2287
A.6.3.1.10.2
Test Parameters
p. 2287
A.6.3.1.10.3
Test Requirements
p. 2290
A.6.3.1.11
Inter-band inter-frequency synchronous DAPS handover from FR1 to FR1
p. 2290
A.6.3.1.11.1
Test Purpose and Environment
p. 2290
A.6.3.1.11.2
Test Parameters
p. 2290
A.6.3.1.11.3
Test Requirements
p. 2297
A.6.3.1.12
Inter-band inter-frequency asynchronous DAPS handover from FR1 to FR1
p. 2297
A.6.3.1.12.1
Test Purpose and Environment
p. 2297
A.6.3.1.12.2
Test Parameters
p. 2297
A.6.3.1.12.3
Test Requirements
p. 2305
A.6.3.1.13
SA NR - E-UTRAN with NR PSCell addition in FR1
p. 2305
A.6.3.1.13.1
Test Purpose and Environment
p. 2305
A.6.3.1.13.2
Test Requirements
p. 2314
A.6.3.1.14
SA NR - E-UTRAN handover with NR FR1 PScell addition
p. 2314
A.6.3.1.14.1
Test Purpose and Environment
p. 2314
A.6.3.1.14.2
Test Requirements
p. 2323
A.6.3.2
RRC Connection Mobility Control
p. 2324
A.6.3.2.1
SA: RRC Re-establishment
p. 2324
A.6.3.2.1.1
Intra-frequency RRC Re-establishment in FR1
p. 2324
A.6.3.2.1.2
Inter-frequency RRC Re-establishment in FR1
p. 2328
A.6.3.2.1.3
Intra-frequency RRC Re-establishment in FR1 without serving cell timing
p. 2332
A.6.3.2.2
Random Access
p. 2335
A.6.3.2.2.1
4-step RA type contention based random access test in FR1 for NR standalone
p. 2335
A.6.3.2.2.2
4-step RA type non-contention based random access test in FR1 for NR standalone
p. 2339
A.6.3.2.2.3
2-step RA type contention based random access test in FR1 for NR standalone
p. 2344
A.6.3.2.2.4
2-step RA type non-contention based test in FR1 for NR standalone
p. 2349
A.6.3.2.3
SA: RRC Connection Release with Redirection
p. 2353
A.6.3.2.3.1
Redirection from NR in FR1 to NR in FR1
p. 2353
A.6.3.2.3.2
Redirection from NR in FR1 to E-UTRAN
p. 2357
A.6.3.3
Conditional handover
p. 2364
A.6.3.3.1
Intra-frequency conditional handover from FR1 to FR1
p. 2364
A.6.3.3.1.1
Test Purpose and Environment
p. 2364
A.6.3.3.1.2
Test Parameters
p. 2364
A.6.3.3.1.3
Test Requirements
p. 2368
A.6.3.3.2
Inter-frequency conditional handover from FR1 to FR1
p. 2368
A.6.3.3.2.1
Test Purpose and Environment
p. 2368
A.6.3.3.2.2
Test Parameters
p. 2368
A.6.3.3.2.3
Test Requirements
p. 2372
A.6.4
Timing
p. 2372
A.6.4.1
UE transmit timing
p. 2372
A.6.4.1.1
NR UE Transmit Timing Test for FR1
p. 2372
A.6.4.1.1.1
Test Purpose and environment
p. 2372
A.6.4.1.1.2
Test requirements
p. 2376
A.6.4.2
UE timer accuracy
p. 2376
A.6.4.3
Timing advance
p. 2376
A.6.4.3.1
SA FR1 timing advance adjustment accuracy
p. 2376
A.6.4.3.1.1
Test Purpose and Environment
p. 2376
A.6.4.3.1.2
Test Parameters
p. 2376
A.6.4.3.1.3
Test Requirements
p. 2380
A.6.5
Signalling characteristics
p. 2380
A.6.5.1
Radio link Monitoring
p. 2380
A.6.5.1.1
Radio Link Monitoring Out-of-sync Test for FR1 PCell configured with SSB-based RLM RS in non-DRX mode
p. 2381
A.6.5.1.1.1
Test Purpose and Environment
p. 2381
A.6.5.1.1.2
Test Requirements
p. 2386
A.6.5.1.2
Radio Link Monitoring In-sync Test for FR1 PCell configured with SSB-based RLM RS in non-DRX mode
p. 2386
A.6.5.1.2.1
Test Purpose and Environment
p. 2386
A.6.5.1.2.2
Test Requirements
p. 2392
A.6.5.1.3
Radio Link Monitoring Out-of-sync Test for FR1 PCell configured with SSB-based RLM RS in DRX mode
p. 2392
A.6.5.1.3.1
Test Purpose and Environment
p. 2392
A.6.5.1.3.2
Test Requirements
p. 2398
A.6.5.1.4
Radio Link Monitoring In-sync Test for FR1 PCell configured with SSB-based RLM RS in DRX mode
p. 2398
A.6.5.1.4.1
Test Purpose and Environment
p. 2398
A.6.5.1.4.2
Test Requirements
p. 2404
A.6.5.1.5
Radio Link Monitoring Out-of-sync Test for FR1 PCell configured with CSI-RS-based RLM in non-DRX mode
p. 2404
A.6.5.1.5.1
Test Purpose and Environment
p. 2404
A.6.5.1.5.2
Test Requirements
p. 2410
A.6.5.1.6
Radio Link Monitoring In-sync Test for FR1 PCell configured with CSI-RS-based RLM in non-DRX mode
p. 2410
A.6.5.1.6.1
Test Purpose and Environment
p. 2410
A.6.5.1.6.2
Test Requirements
p. 2415
A.6.5.1.7
Radio Link Monitoring Out-of-sync Test for FR1 PCell configured with CSI-RS-based RLM in DRX mode
p. 2415
A.6.5.1.7.1
Test Purpose and Environment
p. 2415
A.6.5.1.7.2
Test Requirements
p. 2420
A.6.5.1.8
Radio Link Monitoring In-sync Test for FR1 PCell configured with CSI-RS-based RLM in DRX mode
p. 2420
A.6.5.1.8.1
Test Purpose and Environment
p. 2420
A.6.5.1.8.2
Test Requirements
p. 2425
A.6.5.1.9
Radio Link Monitoring Out-of-sync Test for FR1 PCell configured with CSI-RS-based RLM for UE fulfilling relaxed measurement criterion
p. 2425
A.6.5.1.9.1
Test Purpose and Environment
p. 2425
A.6.5.1.9.2
Test Requirements
p. 2431
A.6.5.2
Interruption
p. 2431
A.6.5.2.1
Interruptions during measurements on deactivated NR SCC in FR1
p. 2431
A.6.5.2.1.2
Test Requirements
p. 2435
A.6.5.2.2
SA interruptions at NR SRS carrier based switching
p. 2436
A.6.5.2.2.1
Test Purpose and Environment
p. 2436
A.6.5.2.2.2
Test Parameters
p. 2436
A.6.5.2.2.3
Test Requirements
p. 2438
A.6.5.2.3
SA interruptions at NR SRS antenna port switching with 1 SRS symbol in a slot in NR-CA
p. 2439
A.6.5.2.3.1
Test Purpose and Environment
p. 2439
A.6.5.2.3.2
Test Parameters
p. 2439
A.6.5.2.3.3
Test Requirements
p. 2441
A.6.5.2.4
SA interruptions at NR SRS antenna port switching
p. 2442
A.6.5.2.4.1
Test Purpose and Environment
p. 2442
A.6.5.2.4.2
Test Parameters
p. 2442
A.6.5.2.4.3
Test Requirements
p. 2444
A.6.5.3
SCell Activation and Deactivation Delay
p. 2445
A.6.5.3.1
SCell Activation and deactivation of known SCell in FR1 in non-DRX for 160ms SCell measurement cycle
p. 2445
A.6.5.3.1.1
Test Purpose and Environment
p. 2445
A.6.5.3.1.2
Test Requirements
p. 2450
A.6.5.3.2
SCell Activation and deactivation of known SCell in FR1 in non-DRX for 640 ms SCell measurement cycle
p. 2451
A.6.5.3.2.1
Test Purpose and Environment
p. 2451
A.6.5.3.2.2
Test Requirements
p. 2451
A.6.5.3.3
SCell Activation and deactivation of unknown SCell in FR1 in non-DRX
p. 2451
A.6.5.3.3.1
Test Purpose and Environment
p. 2451
A.6.5.3.3.2
Test Requirements
p. 2452
A.6.5.3.4
Direct SCell activation at SCell addition of known SCell in FR1
p. 2452
A.6.5.3.4.1
Test Purpose and Environment
p. 2452
A.6.5.3.4.2
Test Requirements
p. 2460
A.6.5.3.5
Direct SCell activation at handover with known SCell in FR1
p. 2460
A.6.5.3.5.1
Test Purpose and Environment
p. 2460
A.6.5.3.5.2
Test Requirements
p. 2466
A.6.5.3.6
PUCCH SCell Activation and deactivation of known SCell in FR1
p. 2467
A.6.5.3.6.1
Test Purpose and Environment
p. 2467
A.6.5.3.6.2
Test Requirements
p. 2471
A.6.5.3.7
SCell Activation and deactivation of unknown SCell in FR1 in non-DRX
p. 2471
A.6.5.3.7.1
Test Purpose and Environment
p. 2471
A.6.5.3.7.2
Test Requirements
p. 2475
A.6.5.3.8
SCell Activation and Deactivation of one FR1 known PUCCH SCell and one FR1 unknown SCell with single activation/deactivation command
p. 2476
A.6.5.3.8.1
Test Purpose and Environment
p. 2476
A.6.5.3.8.2
Test Requirements
p. 2480
A.6.5.3.9
SCell Activation and deactivation of unknown PUCCH SCell and unknown DL SCell in FR1 in non-DRX
p. 2481
A.6.5.3.9.1
Test Purpose and Environment
p. 2481
A.6.5.3.9.2
Test Requirements
p. 2485
A.6.5.3.10
Fast SCell Activation of known SCell in FR1 in non-DRX for 160ms SCell measurement cycle
p. 2486
A.6.5.3.10.1
Test Purpose and Environment
p. 2486
A.6.5.3.10.2
Test Requirements
p. 2489
A.6.5.3.11
SCell Activation of known SCell in FR1 in non-DRX for 640 ms SCell measurement cycle
p. 2489
A.6.5.3.11.1
Test Purpose and Environment
p. 2489
A.6.5.3.11.2
Test Requirements
p. 2490
A.6.5.4
UE UL carrier RRC reconfiguration Delay
p. 2490
A.6.5.4.1
UE UL carrier RRC reconfiguration Delay
p. 2490
A.6.5.4.1.1
Test Purpose and Environment
p. 2490
A.6.5.4.1.2
Test Requirements
p. 2500
A.6.5.4.2
Void
A.6.5.5
Beam Failure Detection and Link recovery procedures
p. 2501
A.6.5.5.1
Beam Failure Detection and Link Recovery Test for FR1 PCell configured with SSB-based BFD and LR in non-DRX mode
p. 2501
A.6.5.5.1.1
Test Purpose and Environment
p. 2501
A.6.5.5.2
Beam Failure Detection and Link Recovery Test for FR1 PCell configured with SSB-based BFD and LR in DRX mode
p. 2507
A.6.5.5.2.1
Test Purpose and Environment
p. 2507
A.6.5.5.2.2
Test Requirements
p. 2513
A.6.5.5.3
Beam Failure Detection and Link Recovery Test for FR1 PCell configured with CSI-RS-based BFD and LR in non-DRX mode
p. 2514
A.6.5.5.3.1
Test Purpose and Environment
p. 2514
A.6.5.5.3.2
Test Requirements
p. 2519
A.6.5.5.4
Beam Failure Detection and Link Recovery Test for FR1 PCell configured with CSI-RS-based BFD and LR in DRX mode
p. 2520
A.6.5.5.4.1
Test Purpose and Environment
p. 2520
A.6.5.5.4.2
Test Requirements
p. 2525
A.6.5.5.5
Beam Failure Detection and Link Recovery Test for FR1 SCell configured with CSI-RS-based BFD and SSB-based LR in non-DRX mode
p. 2526
A.6.5.5.5.1
Test Purpose and Environment
p. 2526
A.6.5.5.5.2
Test Requirements
p. 2530
A.6.5.5.6
Beam Failure Detection and Link Recovery Test for FR1 SCell configured with CSI-RS-based BFD and SSB-based LR in DRX mode
p. 2530
A.6.5.5.6.1
Test Purpose and Environment
p. 2530
A.6.5.5.6.2
Test Requirements
p. 2535
A.6.5.5.7
TRP Specific Beam Failure Detection and Link Recovery Test for FR1 PCell configured with CSI-RS-based BFD and LR in DRX mode
p. 2535
A.6.5.5.7.1
Test Purpose and Environment
p. 2535
A.6.5.5.7.2
Test Requirements
p. 2541
A.6.5.6
Active BWP switch
p. 2542
A.6.5.6.1
DCI-based and Timer-based Active BWP Switch
p. 2542
A.6.5.6.1.1
NR FR1- NR FR1 DL active BWP switch of SCell with non-DRX in SA
p. 2542
A.6.5.6.1.2
NR FR1 DL active BWP switch with non-DRX in SA
p. 2548
A.6.5.6.2
RRC-based Active BWP Switch
p. 2553
A.6.5.6.2.1
NR FR1 DL active BWP switch of Cell with non-DRX in SA
p. 2553
A.6.5.6.3
Simultaneous DCI-based and Timer-based Active BWP Switch on multiple CCs
p. 2557
A.6.5.6.3.1
NR FR1- NR FR1 DL active BWP switch on multiple CCs with non-DRX in SA
p. 2557
A.6.5.6.4
SCell dormancy switch
p. 2564
A.6.5.6.4.1
NR FR1 PCell SCell dormancy switch of single FR1 SCell outside active time
p. 2564
A.6.5.6.4.1.1
Test Purpose and Environment
p. 2564
A.6.5.6.4.1.2
Test Requirements
p. 2570
A.6.5.6.4.2
NR FR1 PCell SCell dormancy switch of two FR1 SCells inside active time
p. 2570
A.6.5.6.4.2.1
Test Purpose and Environment
p. 2570
A.6.5.6.4.2.2
Test Requirements
p. 2577
A.6.5.6.5
Simultaneous RRC-based Active BWP Switch on multiple CCs
p. 2577
A.6.5.6.5.1
NR FR1- NR FR1 DL active BWP switch on multiple CCs with non-DRX in SA
p. 2577
A.6.5.7
DL interruptions at switching between two uplink carriers
p. 2582
A.6.5.7.1
DL interruptions at switching between two uplink carriers in FDD-TDD CA
p. 2582
A.6.5.7.1.1
Test Purpose and Environment
p. 2582
A.6.5.7.1.2
Test Requirements
p. 2586
A.6.5.7.2
DL interruptions at switching between two uplink carriers in TDD-TDD CA
p. 2586
A.6.5.7.2.1
Test Purpose and Environment
p. 2586
A.6.5.7.2.2
Test Requirements
p. 2590
A.6.5.7A
DL interruptions at switching between two uplink carriers with two transmit antenna connectors
p. 2590
A.6.5.7A.1
DL interruptions at switching between two uplink carriers in FDD-TDD CA
p. 2590
A.6.5.7A.1.1
Test Purpose and Environment
p. 2590
A.6.5.7A.1.2
Test Requirements
p. 2594
A.6.5.7A.2
DL interruptions at switching between two uplink carriers in TDD-TDD CA
p. 2594
A.6.5.7A.2.1
Test Purpose and Environment
p. 2594
A.6.5.7A.2.2
Test Requirements
p. 2598
A.6.5.7B
DL interruptions at switching between one uplink band with one transmit antenna connector and one uplink band with two transmit antenna connectors
p. 2598
A.6.5.7B.1
DL interruptions at switching between two uplink bands in FDD-TDD CA
p. 2598
A.6.5.7B.1.1
Test Purpose and Environment
p. 2598
A.6.5.7B.1.2
Test Requirements
p. 2602
A.6.5.7B.2
DL interruptions at switching between two uplink bands in TDD-TDD CA
p. 2602
A.6.5.7B.2.1
Test Purpose and Environment
p. 2602
A.6.5.7B.2.2
Test Requirements
p. 2606
A.6.5.7C
DL interruptions at switching between two uplink bands with two transmit antenna connectors
p. 2606
A.6.5.7C.1
DL interruptions at switching between two uplink bands with two transmit antenna connectors in FDD-TDD CA
p. 2606
A.6.5.7C.1.1
Test Purpose and Environment
p. 2606
A.6.5.7C.1.2
Test Requirements
p. 2610
A.6.5.7C.2
DL interruptions at switching between two uplink bands with two transmit antenna connectors in TDD-TDD CA
p. 2611
A.6.5.7C.2.1
Test Purpose and Environment
p. 2611
A.6.5.7C.2.2
Test Requirements
p. 2615
A.6.5.8
UE specific CBW change
p. 2616
A.6.5.8.1
UE specific CBW change on PCell in FR1 in non-DRX
p. 2616
A.6.5.8.1.1
Test Purpose and Environment
p. 2616
A.6.5.8.1.2
Test Requirements
p. 2620
A.6.5.9
Pathloss reference signal switching delay
p. 2620
A.6.5.9.1
MAC-CE based pathloss reference signal switch delay
p. 2620
A.6.5.9.1.1
Test Purpose and Environment
p. 2620
A.6.5.9.1.2
Test Requirements
p. 2623
A.6.6
Measurement procedure
p. 2624
A.6.6.1
Intra-frequency Measurements
p. 2624
A.6.6.1.1
SA event triggered reporting tests without gap under non-DRX
p. 2624
A.6.6.1.1.1
Test purpose and Environment
p. 2624
A.6.6.1.1.2
Test parameters
p. 2624
A.6.6.1.1.3
Test Requirements
p. 2628
A.6.6.1.2
SA event triggered reporting tests without gap under DRX
p. 2628
A.6.6.1.2.1
Test purpose and Environment
p. 2628
A.6.6.1.2.2
Test parameters
p. 2628
A.6.6.1.2.3
Test Requirements
p. 2632
A.6.6.1.3
SA event triggered reporting tests with per-UE gaps under non-DRX
p. 2632
A.6.6.1.3.1
Test purpose and Environment
p. 2632
A.6.6.1.3.2
Test parameters
p. 2632
A.6.6.1.3.3
Test Requirements
p. 2636
A.6.6.1.4
SA event triggered reporting tests with per-UE gaps under DRX
p. 2636
A.6.6.1.4.1
Test purpose and Environment
p. 2636
A.6.6.1.4.2
Test parameters
p. 2636
A.6.6.1.4.3
Test Requirements
p. 2640
A.6.6.1.5
SA event triggered reporting tests without gap under non-DRX with SSB index reading
p. 2640
A.6.6.1.5.1
Test purpose and Environment
p. 2640
A.6.6.1.5.2
Test parameters
p. 2640
A.6.6.1.5.3
Test Requirements
p. 2642
A.6.6.1.6
SA event triggered reporting tests with per-UE gaps under non-DRX with SSB index reading
p. 2643
A.6.6.1.6.1
Test purpose and Environment
p. 2643
A.6.6.1.6.2
Test parameters
p. 2643
A.6.6.1.6.3
Test Requirements
p. 2644
A.6.6.1.7
SA event triggered reporting tests under DRX for UE configured with highSpeedMeasFlag-r16
p. 2645
A.6.6.1.7.1
Test purpose and Environment
p. 2645
A.6.6.1.7.2
Test parameters
p. 2645
A.6.6.1.7.3
Test Requirements
p. 2649
A.6.6.1.8
SA event triggered reporting tests without gap under DRX for UE configured with highSpeedMeasCA-Scell-r17
p. 2649
A.6.6.1.8.1
Test purpose and Environment
p. 2649
A.6.6.1.8.2
Test parameters
p. 2649
A.6.6.1.8.3
Test Requirements
p. 2653
A.6.6.2
Inter-frequency Measurements
p. 2653
A.6.6.2.1
SA event triggered reporting tests for FR1 without SSB time index detection when DRX is not used
p. 2653
A.6.6.2.1.1
Test Purpose and Environment
p. 2653
A.6.6.2.1.2
Test Requirements
p. 2657
A.6.6.2.2
SA event triggered reporting tests for FR1 without SSB time index detection when DRX is used
p. 2657
A.6.6.2.2.1
Test Purpose and Environment
p. 2657
A.6.6.2.2.2
Test Requirements
p. 2661
A.6.6.2.3
Void
A.6.6.2.4
Void
A.6.6.2.5
SA event triggered reporting tests for FR1 with SSB time index detection when DRX is not used
p. 2662
A.6.6.2.5.1
Test Purpose and Environment
p. 2662
A.6.6.2.5.2
Test Requirements
p. 2666
A.6.6.2.6
SA event triggered reporting tests for FR1 with SSB time index detection when DRX is used
p. 2666
A.6.6.2.6.1
Test Purpose and Environment
p. 2666
A.6.6.2.6.2
Test Requirements
p. 2670
A.6.6.2.7
Void
A.6.6.2.8
Void
A.6.6.2.9
SA event triggered reporting tests with additional mandatory gap pattern
p. 2670
A.6.6.2.9.1
Test Purpose and Environment
p. 2670
A.6.6.2.9.2
Test Requirements
p. 2674
A.6.6.2.10
SA event triggered reporting tests for FR1 when DRX is used
p. 2674
A.6.6.2.10.1
Test Purpose and Environment
p. 2674
A.6.6.2.10.2
Test Requirements
p. 2678
A.6.6.2.12
SA event triggered reporting tests for FR1 without SSB time index detection when DRX is used for UE configured with highSpeedMeasInterFreq-r17
p. 2682
A.6.6.2.12.1
Test Purpose and Environment
p. 2682
A.6.6.2.12.2
Test Requirements
p. 2686
A.6.6.3
Inter-RAT Measurements
p. 2686
A.6.6.3.1
SA NR - E-UTRAN event-triggered reporting in non-DRX in FR1
p. 2686
A.6.6.3.1.1
Test Purpose and Environment
p. 2686
A.6.6.3.1.2
Test Requirements
p. 2692
A.6.6.3.2
SA NR - E-UTRAN event-triggered reporting in DRX in FR1
p. 2692
A.6.6.3.2.1
Test Purpose and Environment
p. 2692
A.6.6.3.2.2
Test Requirements
p. 2699
A.6.6.3.3
SA NR - E-UTRAN event-triggered reporting in DRX in FR1 for UE configured with highSpeedMeasFlag-r16
p. 2699
A.6.6.3.3.1
Test Purpose and Environment
p. 2699
A.6.6.3.3.2
Test Requirements
p. 2704
A.6.6.4
L1-RSRP measurement for beam reporting
p. 2704
A.6.6.4.1
SSB based L1-RSRP measurement when DRX is not used
p. 2704
A.6.6.4.1.1
Test Purpose and Environment
p. 2704
A.6.6.4.1.2
Test parameters
p. 2705
A.6.6.4.1.3
Test Requirements
p. 2708
A.6.6.4.2
SSB based L1-RSRP measurement when DRX is used
p. 2708
A.6.6.4.2.1
Test Purpose and Environment
p. 2708
A.6.6.4.2.2
Test parameters
p. 2709
A.6.6.4.2.3
Test Requirements
p. 2712
A.6.6.4.3
CSI-RS based L1-RSRP measurement when DRX is not used
p. 2712
A.6.6.4.3.1
Test Purpose and Environment
p. 2712
A.6.6.4.3.2
Test parameters
p. 2713
A.6.6.4.3.3
Test Requirements
p. 2716
A.6.6.4.4
CSI-RS based L1-RSRP measurement when DRX is used
p. 2716
A.6.6.4.4.1
Test Purpose and Environment
p. 2716
A.6.6.4.4.2
Test parameters
p. 2717
A.6.6.4.4.3
Test Requirements
p. 2720
A.6.6.4.5
SSB based L1-RSRP measurement when DRX is used for UE configured with highSpeedMeasFlag-r16
p. 2720
A.6.6.4.5.1
Test Purpose and Environment
p. 2720
A.6.6.4.5.2
Test parameters
p. 2721
A.6.6.4.5.3
Test Requirements
p. 2724
A.6.6.4.6
Inter-cell SSB based L1-RSRP measurements on FR1 PCell when DRX is used
p. 2724
A.6.6.4.6.1
Test Purpose and Environment
p. 2724
A.6.6.4.6.2
Test parameters
p. 2725
A.6.6.4.6.3
Test Requirements
p. 2728
A.6.6.5
Inter-RAT UTRAN FDD measurements
p. 2729
A.6.6.5.1
SA NR - UTRAN FDD event-triggered reporting in non-DRX in FR1
p. 2729
A.6.6.5.1.1
Test Purpose and Environment
p. 2729
A.6.6.5.1.2
Test Requirements
p. 2732
A.6.6.6
CLI measurements
p. 2732
A.6.6.6.1
SRS-RSRP measurement with DRX
p. 2732
A.6.6.6.1.1
Test Purpose and Environment
p. 2732
A.6.6.6.1.2
Test Parameters
p. 2733
A.6.6.6.1.3
Test Requirements
p. 2736
A.6.6.6.2
CLI-RSSI measurement with DRX
p. 2736
A.6.6.6.2.1
Test Purpose and Environment
p. 2736
A.6.6.6.2.2
Test Parameters
p. 2737
A.6.6.6.2.3
Test Requirements
p. 2739
A.6.6.7
NR measurements with autonomous gaps
p. 2739
A.6.6.7.1
SA intra-frequency CGI identification of NR neighbor cell in FR1
p. 2739
A.6.6.7.1.1
Test Purpose and Environment
p. 2739
A.6.6.7.1.2
Test Parameters
p. 2739
A.6.6.7.1.3
Test Requirements
p. 2742
A.6.6.7.2
Identification of a new CGI of inter-RAT E-UTRA cell using autonomous gaps in NR SA
p. 2742
A.6.6.7.2.1
Test Purpose and Environment
p. 2742
A.6.6.7.2.2
Test Requirements
p. 2745
A.6.6.8
L1-SINR measurement for beam reporting
p. 2746
A.6.6.8.2
L1-SINR measurement with SSB based CMR and dedicated IMR when DRX is not used
p. 2748
A.6.6.8.2.1
Test Purpose and Environment
p. 2748
A.6.6.8.2.2
Test parameters
p. 2748
A.6.6.8.2.3
Test Requirements
p. 2752
A.6.6.8.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR configured when DRX is not used
p. 2752
A.6.6.8.3.1
Test Purpose and Environment
p. 2752
A.6.6.8.3.2
Test parameters
p. 2753
A.6.6.8.3.3
Test Requirements
p. 2755
A.6.6.9
Idle Mode CA/DC Measurements
p. 2755
A.6.6.9.1
SA Idle mode CA/DC measurement for FR1
p. 2755
A.6.6.9.1.1
Test Purpose and Environment
p. 2755
A.6.6.9.1.2
Test Requirements
p. 2762
A.6.6.10
CSI-RS based intra-frequency Measurements
p. 2762
A.6.6.10.1
SA event triggered reporting tests without gap under non-DRX
p. 2762
A.6.6.10.1.1
Test purpose and Environment
p. 2762
A.6.6.10.1.2
Test Requirements
p. 2765
A.6.6.11
CSI-RS based inter-frequency Measurements
p. 2765
A.6.6.11.1
SA event triggered reporting tests with gap under DRX
p. 2765
A.6.6.11.1.1
Test Purpose and Environment
p. 2765
A.6.6.11.1.2
Test Requirements
p. 2769
A.6.6.12
RSTD measurements
p. 2769
A.6.6.12.1
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR1 SA
p. 2769
A.6.6.12.1.1
Test Purpose and Environment
p. 2769
A.6.6.12.1.2
Test Requirements
p. 2776
A.6.6.12.2
NR RSTD measurement reporting delay test case for dual positioning frequency layers in FR1 SA
p. 2777
A.6.6.12.2.1
Test Purpose and Environment
p. 2777
A.6.6.12.2.2
Test Requirements
p. 2783
A.6.6.12.3
NR RSTD measurement reporting delay test case for single positioning frequency layer with reduced number of samples in FR1 SA
p. 2783
A.6.6.12.3.1
Test Purpose and Environment
p. 2783
A.6.6.12.3.2
Test Requirements
p. 2789
A.6.6.12.4
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR1 SA without measurement gap
p. 2789
A.6.6.12.4.1
Test Purpose and Environment
p. 2789
A.6.6.12.4.2
Test Requirements
p. 2793
A.6.6.12.5
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR1 SA in RRC_CONNECTED state with Rx TEG
p. 2794
A.6.6.12.5.1
Test Purpose and Environment
p. 2794
A.6.6.12.5.2
Test Requirements
p. 2798
A.6.6.13
PRS-RSRP measurements
p. 2798
A.6.6.13.1
PRS-RSRP reporting delay test case for single positioning frequency layer
p. 2798
A.6.6.13.1.1
Test purpose and Environment
p. 2798
A.6.6.13.1.2
Test Requirements
p. 2802
A.6.6.13.2
PRS-RSRP reporting delay test case for dual positioning frequency layer
p. 2802
A.6.6.13.2.1
Test purpose and Environment
p. 2802
A.6.6.13.2.2
Test Requirements
p. 2806
A.6.6.13.3
PRS-RSRP reporting delay test case for reduced number of samples
p. 2806
A.6.6.13.3.1
Test purpose and Environment
p. 2806
A.6.6.13.3.2
Test Requirements
p. 2810
A.6.6.13.4
PRS-RSRP reporting delay test case for single positioning frequency layer outside MG
p. 2810
A.6.6.13.4.1
Test purpose and Environment
p. 2810
A.6.6.14
UE Rx-Tx time difference measurements
p. 2814
A.6.6.14.1
UE Rx-Tx time difference measurement for single positioning frequency layer in FR1 SA
p. 2814
A.6.6.14.1.1
Test purpose and environment
p. 2814
A.6.6.14.1.2
Test requirements
p. 2818
A.6.6.14.2
UE Rx-Tx time difference measurement for dual positioning frequency layers in FR1 SA
p. 2818
A.6.6.14.2.1
Test purpose and environment
p. 2818
A.6.6.14.2.2
Test requirements
p. 2822
A.6.6.14.3
UE Rx-Tx time difference measurement for single positioning frequency layer in FR1 SA with reduced sample number
p. 2822
A.6.6.14.3.1
Test purpose and environment
p. 2822
A.6.6.14.3.2
Test requirements
p. 2826
A.6.6.14.4
UE Rx-Tx time difference measurement without gaps in FR1 SA
p. 2826
A.6.6.14.4.1
Test purpose and environment
p. 2826
A.6.6.14.4.2
Test requirements
p. 2830
A.6.6.14.5
UE Rx-Tx time difference measurement for single positioning frequency layer in FR1 SA with multiple RxTx TEGs
p. 2830
A.6.6.14.5.1
Test purpose and environment
p. 2830
A.6.6.14.5.2
Test requirements
p. 2834
A.6.6.15
Idle Mode measurements of inter-RAT DC candidate cells for early reporting
p. 2834
A.6.6.15.1
Test Purpose and Environment
p. 2834
A.6.6.15.2
Test Requirements
p. 2841
A.6.6.16
PRS-RSRPP measurements
p. 2842
A.6.6.16.1
PRS-RSRPP reporting delay test case for single positioning frequency layer in FR1 in RRC_CONNECTED state
p. 2842
A.6.6.16.1.1
Test purpose and Environment
p. 2842
A.6.6.16.1.2
Test Requirements
p. 2844
A.6.6.16.2
PRS-RSRPP reporting delay test case with reduced number of samples for single positioning frequency layer in FR1 in RRC_CONNECTED state
p. 2844
A.6.6.16.2.1
Test purpose and Environment
p. 2844
A.6.6.16.2.2
Test Requirements
p. 2847
A.6.6.16.3
PRS-RSRPP reporting delay test case for single positioning frequency layer in FR1 in RRC_CONNECTED state without measurement gap
p. 2847
A.6.6.16.3.1
Test purpose and Environment
p. 2847
A.6.6.16.3.2
Test Requirements
p. 2851
A.6.6.17
SA event triggered reporting tests with Pre-MG
p. 2851
A.6.6.17.1
SA event triggered reporting tests with autonomous activation/deactivation Pre-MG
p. 2851
A.6.6.17.1.1
Test purpose and Environment
p. 2851
A.6.6.17.1.2
Test parameters
p. 2851
A.6.6.17.1.3
Test Requirements
p. 2855
A.6.6.17.2
SA event triggered reporting tests with pre-configured measurement gaps and network-controlled activation/deactivation
p. 2855
A.6.6.17.2.1
Test purpose and Environment
p. 2855
A.6.6.17.2.2
Test parameters
p. 2855
A.6.6.17.2.3
Test Requirements
p. 2860
A.6.6.17.3
Void
A.6.6.17.3.1
Void
A.6.6.17.3.2
Void
A.6.6.17.3.3
Void
A.6.6.18
SA event triggered reporting tests with concurrent gaps
p. 2860
A.6.6.18.1
SA event triggered reporting tests for FR1 concurrent gaps with non-overalpping scenario for SSB-based measurements in both inter-frequency layers
p. 2860
A.6.6.18.1.1
Test Purpose and Environment
p. 2860
A.6.6.18.1.2
Test Requirements
p. 2864
A.6.6.18.2
SA event triggered reporting tests for FR1 concurrent gap with partially partial overalpping scenario for SSB-based measurements in both inter-frequency layers
p. 2864
A.6.6.18.2.1
Test Purpose and Environment
p. 2864
A.6.6.18.2.2
Test Requirements
p. 2868
A.6.6.18.3
SA NR - E-UTRAN and NR FR1 concurrent event-triggered reporting in non-DRX in FR1
p. 2868
A.6.6.18.3.1
Test Purpose and Environment
p. 2868
A.6.6.18.3.2
Test Requirements
p. 2875
A.6.6.18.4
SA event triggered reporting tests for PRS and SSB measurement in FR1 without SSB time index detection when DRX is not used
p. 2875
A.6.6.18.4.1
Test Purpose and Environment
p. 2875
A.6.6.18.4.2
Test Requirements
p. 2879
A.6.6.19
SA event triggered reporting tests with NCSG
p. 2880
A.6.6.19.1
SA event triggered reporting tests with NCSG under non-DRX in FR1
p. 2880
A.6.6.19.1.1
Test purpose and Environment
p. 2880
A.6.6.19.1.2
Test parameters
p. 2880
A.6.6.19.1.3
Test Requirements
p. 2884
A.6.6.19.2
SA event triggered reporting tests for FR1 with NCSG for inter-frequency measurement
p. 2884
A.6.6.19.2.1
Test Purpose and Environment
p. 2884
A.6.6.19.2.2
Test parameters
p. 2884
A.6.6.19.2.3
Test Requirements
p. 2888
A.6.6.19.3
SA NR - E-UTRAN event-triggered reporting in non-DRX in FR1 with NCSG
p. 2888
A.6.6.19.3.1
Test Purpose and Environment
p. 2888
A.6.6.19.3.2
Test parameters
p. 2889
A.6.6.19.3.3
Test Requirements
p. 2894
A.6.6.19.4
Event triggered reporting on SCC with deactivated SCell test with per-UE NCSG under non-DRX
p. 2894
A.6.6.19.4.1
Test purpose and Environment
p. 2894
A.6.6.19.4.2
Test parameters
p. 2894
A.6.6.19.4.3
Test Requirements
p. 2897
A.6.6.20
UE Rx-Tx time difference measurement for propagation delay compensation
p. 2897
A.6.6.20.1
Test purpose and environment
p. 2897
A.6.6.20.2
Test requirements
p. 2901
A.6.6.21
UE Rx-Tx time difference measurement with TRS for RTT-based PDC in FR1 SA
p. 2901
A.6.6.21.1
Test purpose and environment
p. 2901
A.6.6.21.2
Test requirements
p. 2903
A.6.7
Measurement Performance requirements
p. 2904
A.6.7.1
SS-RSRP
p. 2904
A.6.7.1.1
SA: intra-frequency case measurement accuracy with FR1 serving cell and FR1 target cell
p. 2904
A.6.7.1.1.1
Test Purpose and Environment
p. 2904
A.6.7.1.1.2
Test parameters
p. 2904
A.6.7.1.1.3
Test Requirements
p. 2909
A.6.7.1.2
SA inter-frequency case measurement accuracy with FR1 serving cell and FR1 target cell
p. 2909
A.6.7.1.2.1
Test Purpose and Environment
p. 2909
A.6.7.1.2.2
Test parameters
p. 2909
A.6.7.1.2.3
Test Requirements
p. 2913
A.6.7.1.3
Void
A.6.7.2
SS-RSRQ
p. 2913
A.6.7.2.1
SA: Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 2913
A.6.7.2.1.1
Test Purpose and Environment
p. 2913
A.6.7.2.1.2
Test Parameters
p. 2914
A.6.7.2.1.3
Test Requirements
p. 2919
A.6.7.2.2
SA Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 2919
A.6.7.2.2.1
Test Purpose and Environment
p. 2919
A.6.7.2.2.2
Test Parameters
p. 2919
A.6.7.2.2.3
Test Requirements
p. 2924
A.6.7.3
SS-SINR
p. 2924
A.6.7.3.1
SA intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 2924
A.6.7.3.1.1
Test Purpose and Environment
p. 2924
A.6.7.3.1.2
Test Parameters
p. 2925
A.6.7.3.1.3
Test Requirements
p. 2929
A.6.7.3.2
SA Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 2930
A.6.7.3.2.1
Test Purpose and Environment
p. 2930
A.6.7.3.2.2
Test Parameters
p. 2930
A.6.7.3.2.3
Test Requirements
p. 2934
A.6.7.4
L1-RSRP measurement for beam reporting
p. 2935
A.6.7.4.1
SSB based L1-RSRP measurement
p. 2935
A.6.7.4.1.1
Test Purpose and Environment
p. 2935
A.6.7.4.1.2
Test parameters
p. 2935
A.6.7.4.1.3
Test Requirements
p. 2939
A.6.7.4.2
CSI-RS based L1-RSRP measurement on resource set with repetition off
p. 2939
A.6.7.4.2.1
Test Purpose and Environment
p. 2939
A.6.7.4.2.2
Test parameters
p. 2940
A.6.7.4.2.3
Test Requirements
p. 2944
A.6.7.5
E-UTRAN RSRP
p. 2944
A.6.7.5.1
SA: inter-RAT measurement accuracy with FR1 serving cell
p. 2944
A.6.7.5.1.1
Test Purpose and Environment
p. 2944
A.6.7.5.1.2
Test parameters
p. 2945
A.6.7.5.1.3
Test Requirements
p. 2951
A.6.7.6
E-UTRAN RSRQ
p. 2952
A.6.7.6.1
SA: inter-RAT measurement accuracy with FR1 serving cell
p. 2952
A.6.7.6.1.1
Test Purpose and Environment
p. 2952
A.6.7.6.1.2
Test parameters
p. 2952
A.6.7.6.1.3
Test Requirements
p. 2957
A.6.7.7
E-UTRAN RS-SINR
p. 2958
A.6.7.7.1
SA: inter-RAT measurement accuracy with FR1 serving cell
p. 2958
A.6.7.7.1.1
Test Purpose and Environment
p. 2958
A.6.7.7.1.2
Test parameters
p. 2958
A.6.7.7.1.3
Test Requirements
p. 2964
A.6.7.8
CLI measurements
p. 2965
A.6.7.8.1
SA SRS-RSRP measurement accuracy with FR1 serving cell
p. 2965
A.6.7.8.1.1
Test Purpose and Environment
p. 2965
A.6.7.8.1.2
Test parameters
p. 2965
A.6.7.8.1.3
Test Requirements
p. 2971
A.6.7.8.2
SA CLI-RSSI measurement accuracy with FR1 serving cell
p. 2971
A.6.7.8.2.1
Test Purpose and Environment
p. 2971
A.6.7.8.2.2
Test parameters
p. 2972
A.6.7.8.2.3
Test Requirements
p. 2975
A.6.7.9
L1-SINR measurement for beam reporting
p. 2976
A.6.7.9.2
L1-SINR measurement with SSB based CMR and dedicated IMR
p. 2980
A.6.7.9.2.1
Test Purpose and Environment
p. 2980
A.6.7.9.2.2
Test parameters
p. 2981
A.6.7.9.2.3
Test Requirements
p. 2986
A.6.7.9.3
L1-SINR measurement with CSI-RS based CMR and dedicated IMR
p. 2986
A.6.7.9.3.1
Test Purpose and Environment
p. 2986
A.6.7.9.3.2
Test parameters
p. 2986
A.6.7.9.3.3
Test Requirements
p. 2991
A.6.7.10
CSI-RSRP
p. 2991
A.6.7.10.1
SA: intra-frequency case measurement accuracy with FR1 serving cell and FR1 target cell
p. 2991
A.6.7.10.10.1
Test Purpose and Environment
p. 2991
A.6.7.10.10.2
Test parameters
p. 2992
A.6.7.10.1.3
Test Requirements
p. 2997
A.6.7.10.2
SA inter-frequency case measurement accuracy with FR1 serving cell and FR1 target cell
p. 2997
A.6.7.9.10.1
Test Purpose and Environment
p. 2997
A.6.7.10.2.2
Test parameters
p. 2997
A.6.7.10.2.3
Test Requirements
p. 3002
A.6.7.11
CSI-RSRQ
p. 3002
A.6.7.11.1
SA: Intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 3002
A.6.7.11.1.1
Test Purpose and Environment
p. 3002
A.6.7.11.1.2
Test Parameters
p. 3002
A.6.7.11.1.3
Test Requirements
p. 3007
A.6.7.11.2
SA Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 3007
A.6.7.11.2.1
Test Purpose and Environment
p. 3007
A.6.7.11.2.2
Test Parameters
p. 3007
A.6.7.11.2.3
Test Requirements
p. 3013
A.6.7.12
CSI-SINR
p. 3014
A.6.7.12.1
SA intra-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 3014
A.6.7.12.1.1
Test Purpose and Environment
p. 3014
A.6.7.12.1.2
Test Parameters
p. 3014
A.6.7.12.1.3
Test Requirements
p. 3018
A.6.7.12.2
SA Inter-frequency measurement accuracy with FR1 serving cell and FR1 target cell
p. 3019
A.6.7.12.2.1
Test Purpose and Environment
p. 3019
A.6.7.12.2.2
Test Parameters
p. 3019
A.6.7.12.2.3
Test Requirements
p. 3025
A.6.7.13
RSTD measurements
p. 3025
A.6.7.13.1
RSTD measurement accuracy test case for single positioning frequency layer
p. 3025
A.6.7.13.1.1
Test purpose and Environment
p. 3025
A.6.7.13.1.2
Test Requirements
p. 3028
A.6.7.13.2
RSTD measurement accuracy test case for dual positioning frequency layer
p. 3028
A.6.7.13.2.1
Test purpose and Environment
p. 3028
A.6.7.13.2.2
Test Requirements
p. 3032
A.6.7.13.3
RSTD measurement accuracy test case with reduced number of samples for single positioning frequency layer in FR1 in RRC_CONNECTED state
p. 3032
A.6.7.13.3.1
Test purpose and Environment
p. 3032
A.6.7.13.3.2
Test Requirements
p. 3034
A.6.7.13.4
RSTD measurement accuracy test case with Rx TEG
p. 3034
A.6.7.14
PRS-RSRP measurements
p. 3038
A.6.7.14.1
SA: measurement accuracy with PRS in FR1
p. 3038
A.6.7.14.1.1
Test Purpose and Environment
p. 3038
A.6.7.14.1.2
Test parameters
p. 3039
A.6.7.14.1.3
Test Requirements
p. 3043
A.6.7.14.2
SA: measurement accuracy with PRS in FR1 with reduced sample number
p. 3043
A.6.7.14.2.1
Test Purpose and Environment
p. 3043
A.6.7.14.2.2
Test parameters
p. 3043
A.6.7.14.2.3
Test Requirements
p. 3046
A.6.7.14.3
Void
A.6.7.14.3.1
Void
A.6.7.14.3.2
Void
A.6.7.14.3.3
Void
A.6.7.15
UE Rx-Tx time difference measurements
p. 3047
A.6.7.15.1
UE Rx-Tx time difference measurement accuracy for single positioning frequency layer in FR1 SA
p. 3047
A.6.7.15.1.1
Test purpose and environment
p. 3047
A.6.7.15.1.2
Test parameters
p. 3047
A.6.7.15.1.3
Test requirements
p. 3050
A.6.7.15.2
UE Rx-Tx time difference measurement accuracy with reduced number of samples in FR1 SA
p. 3051
A.6.7.15.2.1
Test purpose and environment
p. 3051
A.6.7.15.2.2
Test parameters
p. 3051
A.6.7.15.2.3
Test requirements
p. 3054
A.6.7.15.3
UE Rx-Tx time difference measurement accuracy with RxTx TEG
p. 3054
A.6.7.15.3.1
Test purpose and environment
p. 3054
A.6.7.15.3.2
Test parameters
p. 3055
A.6.7.15.3.3
Test requirements
p. 3058
A.6.7.16
PRS-RSRPP measurements
p. 3058
A.6.7.16.1
SA: measurement accuracy with PRS in FR1
p. 3058
A.6.7.16.1.1
Test Purpose and Environment
p. 3058
A.6.7.16.1.2
Test parameters
p. 3059
A.6.7.16.1.3
Test Requirements
p. 3064
A.6.7.16.2
SA: measurement accuracy with reduced PRS samples in FR1
p. 3064
A.6.7.16.2.1
Test Purpose and Environment
p. 3064
A.6.7.16.2.2
Test parameters
p. 3064
A.6.8
Measurement procedure in RRC_INACTIVE
p. 3068
A.6.8.1
RSTD measurements
p. 3068
A.6.8.1.1
NR RSTD measurement reporting delay test case for single positioning frequency layer in FR1 SA in RRC_INACTIVE state
p. 3068
A.6.8.1.1.1
Test Purpose and Environment
p. 3068
A.6.8.1.1.2
Test Requirements
p. 3071
A.6.8.1.2
NR RSTD measurement reporting delay test case with reduced number of samples in RRC_INACTIVE, FR1 SA
p. 3071
A.6.8.1.2.1
Test Purpose and Environment
p. 3071
A.6.8.1.2.2
Test Requirements
p. 3076
A.6.8.2
PRS-RSRP measurements
p. 3076
A.6.8.2.1
PRS-RSRP reporting delay test case for single positioning frequency layer in RRC_INACTIVE
p. 3076
A.6.8.2.1.1
Test purpose and Environment
p. 3076
A.6.8.2.1.2
Test Requirements
p. 3078
A.6.8.2.2
PRS-RSRP reporting delay test case with reduced number of samples in RRC_INACTIVE
p. 3079
A.6.8.2.2.1
Test purpose and Environment
p. 3079
A.6.8.2.2.2
Test Requirements
p. 3082
A.6.8.3
UE Rx-Tx time difference measurements
p. 3082
A.6.8.3.1
UE Rx-Tx time difference measurement for single positioning frequency layer in FR1 SA
p. 3082
A.6.8.3.1.1
Test purpose and environment
p. 3082
A.6.8.3.1.2
Test requirements
p. 3086
A.6.8.3.2
UE Rx-Tx time difference measurement with reduced number of samples in RRC_INACTIVE, FR1 SA
p. 3086
A.6.8.3.2.1
Test purpose and environment
p. 3086
A.6.8.3.2.2
Test requirements
p. 3089
A.6.8.4
PRS-RSRPP measurements
p. 3089
A.6.8.4.1
PRS-RSRPP reporting delay test case for single positioning frequency layer in FR1 in RRC_INACTIVE state
p. 3089
A.6.8.4.1.1
Test purpose and Environment
p. 3089
A.6.8.4.1.2
Test Requirements
p. 3092
A.6.8.4.2
PRS-RSRPP reporting delay test case for single positioning frequency layer in FR1 in RRC_INACTIVE state for reduced number of samples
p. 3092
A.6.8.4.2.1
Test purpose and Environment
p. 3092
A.6.8.4.2.2
Test Requirements
p. 3094
A.6.9
Measurement performance requirements in RRC_INACTIVE
p. 3094
A.6.9.1
RSTD measurements
p. 3094
A.6.9.1.1
RSTD measurement accuracy test case for single positioning frequency layer in FR1 in RRC_INACTIVE state
p. 3094
A.6.9.1.1.1
Test purpose and Environment
p. 3094
A.6.9.1.1.2
Test Requirements
p. 3096
A.6.9.1.2
RSTD measurement accuracy test case with reduced number of samples for single positioning frequency layer in FR1 in RRC_INACTIVE state
p. 3096
A.6.9.1.2.1
Test purpose and Environment
p. 3096
A.6.9.1.2.2
Test Requirements
p. 3098
A.6.9.2
PRS-RSRP measurements
p. 3098
A.6.9.2.1
SA: measurement accuracy with PRS in FR1 in RRC_INACTIVE
p. 3098
A.6.9.2.1.1
Test Purpose and Environment
p. 3098
A.6.9.2.1.2
Test parameters
p. 3099
A.6.9.2.1.3
Test Requirements
p. 3104
A.6.9.2.2
SA: measurement accuracy with PRS in FR1 with reduced number of samples in RRC_INACTIVE state
p. 3104
A.6.9.2.2.1
Test Purpose and Environment
p. 3104
A.6.9.2.2.2
Test parameters
p. 3104
A.6.9.2.2.3
Test Requirements
p. 3107
A.6.9.3
UE Rx-Tx time difference measurements
p. 3108
A.6.9.3.1
-
p. 3108
A.6.9.3.1.1
UE Rx-Tx time difference measurement accuracy in FR1 SA
p. 3108
A.6.9.3.1.1.1
Test purpose and environment
p. 3108
A.6.9.3.1.1.2
Test parameters
p. 3108
A.6.9.3.1.1.3
Test requirements
p. 3111
A.6.9.3.2
UE Rx-Tx time difference measurement accuracy with reduced number of samples
p. 3111
A.6.9.3.2.1
Test purpose and environment
p. 3111
A.6.9.3.2.2
Test parameters
p. 3111
A.6.9.3.2.3
Test requirements
p. 3114
A.6.9.4
PRS-RSRPP measurements
p. 3114
A.6.9.4.1
SA: PRS-RSRPP measurement accuracy in FR1 in RRC INACTIVE
p. 3114
A.6.9.4.1.1
Test Purpose and Environment
p. 3114
A.6.9.4.1.2
Test parameters
p. 3114
A.6.9.4.1.3
Test Requirements
p. 3119
A.6.9.4.2
SA: measurement accuracy with reduced PRS samples in FR1 in RRC INACTIVE
p. 3119
A.6.9.4.2.1
Test Purpose and Environment
p. 3119
A.6.9.4.2.2
Test parameters
p. 3119
A.6.9.4.2.3
Test Requirements
p. 3122